RAN5#90_Electronic

1: Opening of the meeting

TDoc	Title	Source
R5-210000	Agenda - opening session	WG Chairman
R5-210001	RAN5#90-e E-Meeting Timelines, Scope, Process	WG Chairman
R5-211282	Agenda - opening session	WG Chairman

2.1: Live Reports

TDoc	Title	Source
R5-210002	RAN5 Leadership Team	WG Chairman
R5-210003	RAN5#89-e WG Minutes	ETSI Secretariat
R5-210004	RAN5#89-e WG Action Points	ETSI Secretariat
R5-210005	Latest RAN Plenary notes	WG Chairman
R5-210006	Latest RAN Plenary draft Report	WG Chairman
R5-210007	Post Plenary Active Work Item update	ETSI Secretariat
R5-210192	MCC TF160 Status Report	MCC TF160

2.2: General Reports for information

TDoc	Title	Source
R5-210008	RAN5 SR to RP#90-e	WG Chairman
R5-210009	TF160 SR to RP#90-e	WG Chairman
R5-210964	GCF 3GPP TCL after GCF CAG#65	Ericsson
R5-210966	3GPP RAN5 CA status list (pre-RAN5#90-e meeting)	Ericsson

3: Incoming Liaison Statements

TDoc	Title	Source
R5-210014	LS on nominal channel spacing calculation for two carriers at band n41 with 40MHz and 80MHz channel bandwidths	TSG WG RAN4
R5-210015	LS on OTA LTE UE TRP and TRS Requirements	MSG TFES
R5-210016	Test methods for over-the-air TRP field measurements of unwanted emissions from IMT radio equipment utilizing active antennas	ITU-R WP 1C
R5-210017	LS on Use of Inclusive Language in 3GPP	TSG SA
R5-210018	NGMN-GTI 5G Smart Devices Supporting Network Slicing	NGMN Next Generation Mobile Networks Alliance Project 5G Smart Devices Supporting Network Slicing
R5-210019	LS to 3GPP RAN5 on LTE frequency band grouping	GCF CAG
R5-211277	LS on inter-RAT cell reselection for mobility state estimation	TSG WG RAN2
R5-211278	Reply LS on Rel-16 mandatory RRM requirements	TSG WG RAN2
R5-211279	LS to RAN5 on RRC processing time with segmentation	TSG WG RAN2
R5-211280	Reply LS on reporting of SINR measurements for serving cell	TSG WG RAN2
R5-211284	LS on change of methodology for new LTE-CA REL-17 combinations	TSG WG RAN4
R5-211285	LS on Signalling scheme of Transparent TxD	TSG WG RAN4
R5-211286	LS on Test Methodology for UE URLLC Ultra Low BLER CQI requirements	TSG WG RAN4

4.1: New Work Item proposals - for intro only

TDoc	Title	Source
R5-210080	New WID on UE Conformance Test Aspects for NR RF Requirement Enhancements for FR2	Nokia, Nokia Shanghai Bell
R5-210104	New WID on UE Conformance Test Aspects for Enhancement of Network Slicing	China Mobile, China Telecom, China Unicom
R5-210514	New WID on UE Conformance Test Aspects for 2-step RACH for NR	ZTE Corporation, China Telecom
R5-210774	New WID on UE Conformance Test Aspects – High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band	China Unicom
R5-210827	New WID on UE Conformance Test Aspects – LTE-NR & NR-NR Dual Connectivity and NR CA enhancements	Nokia, Nokia Shanghai Bell
R5-211080	New WID on UE Conformance Test Aspects for NR-based Access to Unlicensed Spectrum	Qualcomm Wireless GmbH
R5-211087	New WID - UE Conformance Test Aspects - Support of eCall over IMS for NR	Qualcomm Incorporated

4.2.1: 5GS

TDoc	Title	Source
R5-210100	Checklist - NR_Rel-16_CA_DC for RAN5#89-e	CMCC, BV
R5-210107	5G Smart Devices Supporting Network Slicing	CMCC
R5-210984	Checklist - Adding new NR band or channel bandwidth to existing bands	Ericsson

4.2.2: All other topics

TDoc	Title	Source
R5-211106	Discussion on subclause drafting rules in RAN5 specs	ZTE Corporation

4.3: RAN5 PRDs/Templates

TDoc	Title	Source
R5-210010	RAN5#90-e LS Template	WG Chairman
R5-210021	Draft RAN5 Terms of Reference	WG Chairman
R5-210168	New RAN5 PRD-19 on RAN5 WP Template	Samsung, Ericsson
R5-210193	RAN5 PRD12 version 6.5	MCC TF160
R5-210555	New RAN5 PRD-19 on RAN5 WP Template	Samsung, Ericsson

4.5.3: Other open issues from joint sessions - original A.I. retained

TDoc	Title	Source
R5-210011	Meeting schedule for 2021-22	WG Chairman
R5-210105	New SID: Study on on 5G NR UE supporting Network Slicing Testing	China Mobile, China Unicom
R5-210106	Proposal for introduction of a New Study Item on 5G NR UE supporting Network Slicing Testing	CMCC
R5-211314	Draft RAN5 Terms of Reference	WG Chairman
R5-211317	Proposal for introduction of a New Study Item on 5G NR UE supporting Network Slicing Testing	CMCC

7.2.3: Other open issues from joint sessions - original A.I. retained

TDoc	Title	Source
R5-211361	Draft RAN5 Terms of Reference	WG Chairman

7.3: iWD/PRD Updates

TDoc	Title	Source
R5-210139	PRD-17 on Guidance to Work Item Codes (post RAN#91-e version)	Samsung (Rapporteur)

7.4.1: Final version of Work Item Proposals

TDoc	Title	Source
R5-211302	New WID on UE Conformance Test Aspects for NR RF Requirement Enhancements for FR2	Nokia, Nokia Shanghai Bell
R5-211303	New WID on UE Conformance Test Aspects for Enhancement of Network Slicing	China Mobile, China Telecom, China Unicom
R5-211304	New WID on UE Conformance Test Aspects for 2-step RACH for NR	ZTE Corporation, China Telecom
R5-211305	New WID on UE Conformance Test Aspects – LTE-NR & NR-NR Dual Connectivity and NR CA enhancements	Nokia, Nokia Shanghai Bell
R5-211306	New WID on UE Conformance Test Aspects for NR-based Access to Unlicensed Spectrum	Qualcomm Wireless GmbH
R5-211307	New WID on UE Conformance Test Aspects – High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band	China Unicom
R5-211308	New WID - UE Conformance Test Aspects - Support of eCall over IMS for NR	Qualcomm Incorporated
R5-211309	New SID: Study on on 5G NR UE supporting Network Slicing Testing	China Mobile, China Unicom

7.4.2: Active Work Items/ Study Item: work plans (wp) / status reports (sr) / Work Item Descriptions (wid)

TDoc	Title	Source
R5-210012	WI Progress and Target Completion Date Review	WG Chairman
R5-210096	SR - Rel-16 IIOT after RAN5#90-e	CMCC
R5-210097	WP - Rel-16 IIOT after RAN5#90-e	CMCC
R5-210098	SR - NR_Rel-16_CA_DC after RAN5#90-e	CMCC
R5-210099	WP - NR_Rel-16_CA_DC after RAN5#90-e	CMCC
R5-210101	SR - Rel-16 HST after RAN5#90-e	CMCC
R5-210102	WP - Rel-16 HST after RAN5#90-e	CMCC
R5-210103	Revised WID on UE Conformance Test Aspects for NR HST	CMCC
R5-210126	SR - NR_SON_MDT-UEConTest after RAN5#90-e	CMCC, Ericsson
R5-210127	WP - NR_SON_MDT-UEConTest after RAN5#90-e	CMCC, Ericsson
R5-210273	WP UE Conformance Test Aspects - Rel-16 Private Network Support for NG-RAN	Qualcomm CDMA Technologies
R5-210274	SR UE Conformance Test Aspects - Rel-16 Private Network Support for NG-RAN	Qualcomm CDMA Technologies
R5-210275	WP UE Conformance Test Aspects - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA	Qualcomm CDMA Technologies
R5-210276	SR UE Conformance Test Aspects - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA	Qualcomm CDMA Technologies
R5-210278	Revised WID - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA	Qualcomm CDMA Technologies
R5-210287	Revised WID on UE Conformance Test Aspects for SON and MDT support for NR	CMCC, Ericsson
R5-210334	Work plan: UE Conformance Test Aspects for NR Positioning Support	CATT
R5-210335	SR UE Conformance Test Aspects - NR Positioning Support	CATT
R5-210336	Work plan: B1C Signal in BDS Positioning System Support for LTE and NR	CATT
R5-210337	SR UE Conformance Test Aspects - B1C Signal in BDS Positioning System Support for LTE and NR	CATT
R5-210338	Work plan: UE Conformance Test Aspects – UE power saving in NR	CATT
R5-210339	SR UE Conformance Test Aspects - UE power saving in NR	CATT
R5-210340	WP UE Conformance Test Aspects – Further NB-IoT enhancements	CATT
R5-210341	SR UE Conformance Test Aspects - Further NB-IoT enhancements	CATT
R5-210395	SR UE Conformance Test Aspects - Additional LTE bands for UE category M2 and/or NB2 in Rel-16	Ericsson
R5-210396	WP UE Conformance Test Aspects - Additional LTE bands for UE category M2 and/or NB2 in Rel-16	Ericsson
R5-210583	WI Update for UE Conformance Test Aspects - Rel -16 for CLI handling for NR	Qualcomm Technologies Netherlands B.V.
R5-210584	SR UE Conformance Test Aspects - Rel -16 for CLI handling for NR	Qualcomm Technologies Netherlands B.V.
R5-210585	SR on 5G NR User Equipment (UE) Application Layer Data Throughput Performance	Qualcomm Technologies Netherlands B.V.
R5-210586	SI update on 5G NR User Equipment (UE) Application Layer Data Throughput Performance	Qualcomm Technologies Netherlands B.V.
R5-210587	SR - UE Conformance Test Aspects - Enhancements for Mission Critical Services MCPTT, MCData and MCVideo (UID - 890042) MCenhUEConTest	NIST
R5-210588	WP - UE Conformance Test Aspects - Enhancements for Mission Critical Services MCPTT, MCData and MCVideo (UID - 890042) MCenhUEConTest	NIST
R5-210696	SR UE Conformance Test Aspects - Rel-16 NR Mobility Enhancement	Huawei, Hisilicon
R5-210697	WP UE Conformance Test Aspects - Rel-16 NR Mobility Enhancement	Huawei, Hisilicon
R5-210718	SR UE Conformance Test Aspects - Rel-16 NR V2X	Huawei, Hisilicon
R5-210719	WP UE Conformance Test Aspects - Rel-16 NR V2X	Huawei, Hisilicon
R5-210720	SR UE Conformance Test Aspects- SRVCC_NR_to_UMTS	China Unicom
R5-210721	WP UE Conformance Test Aspects- SRVCC_NR_to_UMTS	China Unicom
R5-210759	WP - Shortened TTI and processing time for LTE	Huawei, HiSilicon
R5-210760	SR - Shortened TTI and processing time for LTE	Huawei, HiSilicon
R5-210761	WP - RF requirements for NR frequency range 1 (FR1)	Huawei, HiSilicon
R5-210762	SR - RF requirements for NR frequency range 1 (FR1)	Huawei, HiSilicon
R5-210763	WP - Enhancements on MIMO for NR	Huawei, HiSilicon
R5-210764	SR - Enhancements on MIMO for NR	Huawei, HiSilicon
R5-210765	WP - NR URLLC	Huawei, HiSilicon
R5-210766	SR - NU URLLC	Huawei, HiSilicon
R5-210797	Revised WID on UE Conformance Test Aspects – Single Radio Voice Call Continuity from 5G to 3G	China Unicom
R5-210876	WP - R15 TDD HPUE – Status after RAN5#90-e	Huawei, HiSilicon
R5-210877	SR - R15 TDD HPUE – Status after RAN5#90-e	Huawei, HiSilicon
R5-210878	WP - R17 NR_CADC_NR_LTE_DC – Status after RAN5#90-e	Huawei, HiSilicon
R5-210879	SR - R17 NR_CADC_NR_LTE_DC – Status after RAN5#90-e	Huawei, HiSilicon
R5-210895	WP UE Conformance Test Aspects - New Rel-17 NR licensed bands and extension of existing NR bands after 90e	Huawei, Hisilicon
R5-210896	SR UE Conformance Test Aspects - New Rel-17 NR licensed bands and extension of existing NR bands after 90e	Huawei, Hisilicon
R5-210939	SR UE Conformance Test Aspects- Additional LTE bands for UE category M1 and/or NB1 in Rel-16	Ericsson
R5-210940	WP UE Conformance Test Aspects- Additional LTE bands for UE category M1 and/or NB1 in Rel-16	Ericsson
R5-210968	WP UE Conformance Test Aspects - Rel-14 LTE CA configurations	Ericsson
R5-210969	SR UE Conformance Test Aspects - Rel-14 LTE CA configurations	Ericsson
R5-210970	WP UE Conformance Test Aspects - Rel-15 LTE CA configurations	Ericsson
R5-210971	SR UE Conformance Test Aspects - Rel-15 LTE CA configurations	Ericsson
R5-210972	WP UE Conformance Test Aspects - Rel-16 LTE CA configurations	Ericsson
R5-210973	SR UE Conformance Test Aspects - Rel-16 LTE CA configurations	Ericsson
R5-210974	WP UE Conformance Test Aspects - 5G system with NR and LTE	Ericsson
R5-210975	SR UE Conformance Test Aspects - 5G system with NR and LTE	Ericsson
R5-210978	WP UE Conformance Test Aspects - New Rel-16 NR bands and extension of existing NR bands	Ericsson
R5-210979	SR UE Conformance Test Aspects - New Rel-16 NR bands and extension of existing NR bands	Ericsson
R5-210983	Revised WID: UE Conformance Test Aspects - 5G system with NR and LTE	Ericsson
R5-211131	WP UE Conformance Test Aspects – Rel14 Enhanced Full Dimension MIMO for LTE	Ericsson
R5-211132	SR UE Conformance Test Aspects – Rel14 Enhanced Full Dimension MIMO for LTE	Ericsson
R5-211153	WP UE Conformance Test Aspects- Even further mobility enhancement for E-UTRAN after RAN5#90-e	China Telecom
R5-211154	SR UE Conformance Test Aspects- Even further mobility enhancement for E-UTRAN after RAN5#90-e	China Telecom
R5-211155	WP UE Conformance Test Aspects for add support of NR DL 256QAM for FR2	China Telecom
R5-211156	SR UE Conformance Test Aspects for add support of NR DL 256QAM for FR2	China Telecom
R5-211157	SR UE Conformance Test Aspects for NR performance requirement enhancement after RAN5#90-e	China Telecom
R5-211163	WP UE Conformance Test Aspects - Even further enhanced MTC for LTE	Ericsson
R5-211164	SR UE Conformance Test Aspects - Even further enhanced MTC for LTE	Ericsson
R5-211197	SR UE Conformance Test Aspects- ENDC_UE_PC2_FDD_TDD after R5#90e	China Unicom
R5-211198	WP UE Conformance Test Aspects- ENDC_UE_PC2_FDD_TDD after R5#90e	China Unicom
R5-211287	WP UE Conformance Test Aspects - Enhancing LTE CA Utilization	Nokia, Nokia Shanghai Bell
R5-211288	SR UE Conformance Test Aspects - Enhancing LTE CA Utilization	Nokia, Nokia Shanghai Bell
R5-211289	WP UE Conformance Test Aspects - NR performance requirement enhancement	Qualcomm
R5-211290	SR UE Conformance Test Aspects - NR performance requirement enhancement	Qualcomm
R5-211363	Revised WID on UE Conformance Test Aspects for NR HST	CMCC
R5-211364	Revised WID - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA	Qualcomm CDMA Technologies
R5-211365	Revised WID on UE Conformance Test Aspects for SON and MDT support for NR	CMCC, Ericsson
R5-211366	WP UE Conformance Test Aspects - Rel -16 for CLI handling for NR	Qualcomm Technologies Netherlands B.V.
R5-211367	WP - 5G NR User Equipment (UE) Application Layer Data Throughput Performance	Qualcomm Technologies Netherlands B.V.

7.5: Docs still needing agreement/endorsement/approval (e.g. Outgoing LS / Reports / New Specs / Info for certification bodies etc.)

TDoc	Title	Source
R5-210141	TS 36.523-1 Tracker status after RAN5#90-e	Samsung (Rapporteur)
R5-210156	TS 38.523-1 Tracker status after RAN5#90-e	Samsung (Rapporteur)
R5-210400	FR2 Measurement Uncertainty (MU) and Test Tolerances (TT) Target Completion Update	AT&T
R5-210965	RAN5#90-e summary of changes to RAN5 test cases with potential impact on GCF and PTCRB	Ericsson, Samsung
R5-210967	3GPP RAN5 CA status list (post-RAN5#90-e meeting)	Ericsson
R5-210976	5GS progress report RAN5#90-e	Ericsson
R5-210977	Update of RAN5 5G NR phases and target update RAN5#90-e	Ericsson
R5-211300	MCC TF160 Status Report	MCC TF160
R5-211301	Reply LS on NGMN-GTI 5G Smart Devices Supporting Network Slicing	TSG WG RAN5
R5-211359	LS on confirming IMS 180 Ringing before or after dedicated bearer establishment	TSG WG RAN5
R5-211360	LS on ICE support for establishing an MCPTT pre-established session	TSG WG RAN5

7.6: Confirmation of Future RAN5 Matters

TDoc	Title	Source
R5-210013	Review deadlines for next quarter	WG Chairman

5.2: Review incoming LS (fm A.I. 3) & new subject discussion papers

TDoc	Title	Source
R5-210020	LS on SCell dropping	TSG WG RAN4

5.3.2.1.1: Test frequencies (Clause 4.3.1)

TDoc	Title	Source
R5-210077	Update of EN-DC inter-band configurations in clause 4.3.1	China Telecommunications
R5-210349	Addition of 3 band EN-DC Test Frequency (DC_1A-8A_n78A, DC_3A-8A_n78A)	KT Corp.
R5-210350	Addition of 4 band EN-DC Test Frequency (DC_1A-3A-8A_n78A)	KT Corp.
R5-210563	New note added for band n71	Ericsson
R5-210897	Correction to test frequency parameters for band n83	Huawei, Hisilicon
R5-210898	Correction to test frequency parameters for band n84	Huawei, Hisilicon
R5-211032	Correction test frequencies for CA_n261(2A)	Ericsson
R5-211107	Corrections to subclauses in 38.508-1 with appropriate subclause level and heading styles	ZTE Corporation
R5-211116	Update of 4.3.1.1.3.41.1 for test frequency of NR intra-band contiguous CA_n41C	ZTE Corporation
R5-211118	Update of 4.3.1.1.3.78.1 for test frequency of NR intra-band contiguous CA_n78C	ZTE Corporation
R5-211660	Update of EN-DC inter-band configurations in clause 4.3.1	China Telecommunications
R5-211661	Addition of 3 band EN-DC Test Frequency (DC_1A-8A_n78A, DC_3A-8A_n78A)	KT Corp.
R5-211662	Addition of 4 band EN-DC Test Frequency (DC_1A-3A-8A_n78A)	KT Corp.

5.3.2.1.2: Test environment for RF (Clauses 5)

TDoc	Title	Source
R5-210599	Editorial correction on numbering of several Tables in 38.508-1	TTA
R5-210768	Update PDSCH-TimeDomainResourceAllocationList to consider coreset0 for Demod FR2 test cases	Keysight Technologies UK Ltd
R5-210771	Correction in CodebookConfig for 4Tx RI Demod test cases	Keysight Technologies UK Ltd
R5-210772	Alignment xOverhead setting with PDSCH RMCs for Demod FR2 testing	Keysight Technologies UK Ltd
R5-210949	Updating the value of P-Max for EN-DC and NR SA test cases	Huawei, HiSilicon
R5-211046	Update message content for PMI reporting test cases	Keysight Technologies UK Ltd
R5-211090	Correction to the message contents for CQI reporting tests in 5.4.2.4	Anritsu
R5-211091	Correction to the message contents for PMI reporting tests in 5.4.2.5	Anritsu
R5-211663	Update PDSCH-TimeDomainResourceAllocationList to consider coreset0 for Demod FR2 test cases	Keysight Technologies UK Ltd
R5-211664	Update message content for PMI reporting test cases	Keysight Technologies UK Ltd
R5-211855	Updating the value of P-Max for EN-DC and NR SA test cases	Huawei, HiSilicon
R5-211856	Correction to the message contents for CQI reporting tests in 5.4.2.4	Anritsu
R5-211857	Correction to the message contents for PMI reporting tests in 5.4.2.5	Anritsu

5.3.2.1.3: Test environment for RRM (Clause 7)

TDoc	Title	Source
R5-210455	Update text in permitted test setups for RRM FR2	ROHDE & SCHWARZ
R5-210469	Changes to RRM default message contents	ROHDE & SCHWARZ
R5-210477	Add SSB Index table for RRM with SECOND_SSB condition	ROHDE & SCHWARZ
R5-210824	Number of control symbols for RRM tests with 240kHz SSB SCS	ANRITSU LTD
R5-210872	Addition of default configuration of CSI-IM for RRM tests	Huawei, HiSilicon
R5-210873	Correction of aperiodic CSI-RS reference configuration for RRM tests	Huawei, HiSilicon
R5-211199	Specify CSI-SSB-ResourceSet for RRM	ROHDE & SCHWARZ
R5-211665	Changes to RRM default message contents	ROHDE & SCHWARZ
R5-211666	Add SSB Index table for RRM with SECOND_SSB condition	ROHDE & SCHWARZ
R5-211667	Addition of default configuration of CSI-IM for RRM tests	Huawei, HiSilicon
R5-211668	Specify CSI-SSB-ResourceSet for RRM	ROHDE & SCHWARZ

5.3.2.1.4: Other clauses / Annexes

TDoc	Title	Source
R5-210461	Editorial rework of the conditions for CSI-FrequencyOccupation	ROHDE & SCHWARZ
R5-210462	Align TDD UL DL Common for RRM with TS 38.533	ROHDE & SCHWARZ
R5-210468	Add new SIB combination for RRM tests with single cell	ROHDE & SCHWARZ
R5-210479	Correct reportOffsetList in CSI-ReportConfig	ROHDE & SCHWARZ
R5-210480	Specify CSI-SSB-ResourceSet	ROHDE & SCHWARZ
R5-211047	Clarification on the connection diagram for FR2 demod and RRM test cases	Anritsu
R5-211089	Clarification on the initialBWP condition in PDCCH-ConfigCommon in 4.6.3	Anritsu
R5-211187	CR to 38.508-1 on larger quiet zone with grey box approach	Keysight Technologies UK Ltd
R5-211669	Editorial rework of the conditions for CSI-FrequencyOccupation	ROHDE & SCHWARZ
R5-211670	Align TDD UL DL Common for RRM with TS 38.533	ROHDE & SCHWARZ
R5-211671	Correct reportOffsetList in CSI-ReportConfig	ROHDE & SCHWARZ
R5-211672	Specify CSI-SSB-ResourceSet	ROHDE & SCHWARZ
R5-211673	Clarification on the connection diagram for FR2 demod and RRM test cases	Anritsu

5.3.2.2: TS 38.508-2

TDoc	Title	Source
R5-210078	Update of UE capabilities for EN-DC configurations	China Telecommunications
R5-210353	Update of Table A.4.3.2B.2.3.2-2 (DC_1A-8A_n78A, DC_3A-8A_n78A)	KT Corp.
R5-210354	Update of Table A.4.3.2B.2.3.3-2 (DC_1A-3A-8A_n78A)	KT Corp.
R5-210483	Correction of core spec Ref. for 4 Rx antenna ports Capabilities	CAICT
R5-210484	Addition of PUSCH HalfPi BPSK capability in FR2	CAICT
R5-210566	Update on manufacturer declaration required for Receiver Beam Peak Search	Keysight Technologies UK Ltd
R5-210834	Introducing declaration of antenna size D for FR2 tests	Anritsu
R5-211001	Update to NR FR1 2Rx-4Rx implementation Capabilities	Bureau Veritas, Samsung
R5-211035	Introduction of UE capabilities for Rel-15 EN-DC FR1 configurations	Ericsson
R5-211036	Introduction of UE capabilities for Rel-15 EN-DC FR2 configuration CA_n261(2A)	Ericsson
R5-211108	Corrections to subclauses in 38.508-2 with appropriate subclause level and heading styles	ZTE Corporation
R5-211182	Addition of PICS powerBoosting-pi2BPSK	Google Inc.
R5-211195	CR to 38.508-2 on Antenna Aperture Declarations	Keysight Technologies UK Ltd
R5-211251	CR to 38.508-2 on larger quiet zone with grey box approach	Keysight Technologies UK Ltd
R5-211674	Introduction of UE capabilities for Rel-15 EN-DC FR2 configuration CA_n261(2A)	Ericsson
R5-211849	CR to 38.508-2 on larger quiet zone with grey box approach	Keysight Technologies UK Ltd
R5-211858	Update of UE capabilities for EN-DC configurations	China Telecommunications
R5-211859	Update of Table A.4.3.2B.2.3.2-2 (DC_1A-8A_n78A, DC_3A-8A_n78A)	KT Corp.
R5-211860	Update of Table A.4.3.2B.2.3.3-2 (DC_1A-3A-8A_n78A)	KT Corp.
R5-211861	Introduction of UE capabilities for Rel-15 EN-DC FR1 configurations	Ericsson
R5-211862	Addition of PICS powerBoosting-pi2BPSK	Google Inc.

5.3.2.3: TS 38.509

TDoc	Title	Source
R5-210519	Clarification of DRB identity in CLOSE UE TEST LOOP message in 38.509	Anritsu
R5-211675	Clarification of DRB identity in CLOSE UE TEST LOOP message in 38.509	Anritsu

5.3.2.4.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210023	Clean up editors note	Anritsu
R5-210291	Message exceptions definition in test case 6.2.2	Keysight Technologies UK Ltd
R5-210292	Clarifications for ON/OFF time mask for UL MIMO test case	Keysight Technologies UK Ltd
R5-210485	Correction of test purpose for 6.3.2 and 6.3D.2	CAICT
R5-210486	Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 6	CAICT
R5-210723	Omitting of FR1 Rx cases with UL-MIMO on TDD bands	Huawei, HiSilicon
R5-210793	Update of the test configuration for carrier leakage for SUL	Huawei, HiSilicon
R5-210899	Removal of the highest SCS from test configuration for Tx spurious emissions for CA	Huawei, Hisilicon
R5-210906	Updating A-SEM for MIMO testing for NS_04	Huawei, Hisilicon
R5-210907	Updating AMPR for MIMO test case for NS_35	Huawei, Hisilicon
R5-210908	Updating test applicability of test case 6.5D.2.4.2-UTRA ACLR for UL MIMO	Huawei, Hisilicon
R5-210910	Correction to RB allocation start for test case 6.3D.4.2	Huawei, Hisilicon, Ericsson
R5-210911	Correction to test configuration table Test IDs for test case 6.5D.3.3	Huawei, Hisilicon
R5-210988	Change of RB allocation start in test case 6.3D.4.2	Ericsson
R5-210995	Update for 6.5.3.2 Spurious emission for UE co-existence_R15	Qualcomm Korea
R5-211002	Correction to TC6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK	Bureau Veritas
R5-211024	Update of Tx test procedure for PC2 UE on FDD bands due to maxUplinkDutyCycle	Huawei, HiSilicon, Bureau Veritas
R5-211042	Spurious emissions for UE co-existence update to core specs	Keysight Technologies UK Ltd
R5-211051	Introduction of additional Rel-15 EN-DC inter-band configurations to EN-DC MOP test case 6.2B.1.3	Ericsson
R5-211052	Introduction of dTIB,c for inter-band EN-DC Rel-15 EN-DC inter-band configurations	Ericsson
R5-211092	Test ID separation to powerBoostPiBPSK 1 and 0 in Table 6.5.2.2.4.1-1	Anritsu
R5-211109	Corrections to subclauses in 38.521-1 with appropriate subclause level and heading styles	ZTE Corporation
R5-211113	Corrections to reference figures for transmission bandwidth in FR1	ZTE Corporation
R5-211129	Introduction of dRIB,c for inter-band EN-DC Rel-15 EN-DC inter-band configurations	Ericsson
R5-211176	Reference to measurement BW corrected in 6.5D.4 TX intermodulation test case	Keysight Technologies UK Ltd
R5-211281	Correction to TC6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK	Bureau Veritas
R5-211608	Update of Tx test procedure for PC2 UE on FDD bands due to maxUplinkDutyCycle	Huawei, HiSilicon, Bureau Veritas
R5-211613	Spurious emissions for UE co-existence update to core specs	Keysight Technologies UK Ltd
R5-211676	Clarifications for ON/OFF time mask for UL MIMO test case	Keysight Technologies UK Ltd
R5-211677	Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 6	CAICT
R5-211678	Updating AMPR for MIMO test case for NS_35	Huawei, Hisilicon
R5-211679	Correction to RB allocation start for test case 6.3D.4.2	Huawei, Hisilicon, Ericsson

5.3.2.4.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-210487	Editorial correction for error in Table 7.6.4.4.1-1	CAICT
R5-210488	Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 7	CAICT
R5-210902	Updating test case 7.3A.1_1 for 4Rx test requirements	Huawei, Hisilicon
R5-210903	Editorial correction to clause 7.3.1	Huawei, Hisilicon
R5-210904	Updating test case 7.3C.2-Reference sensitivity power level for SUL	Huawei, Hisilicon, CAICT
R5-210991	Update for 7.3.2 Reference sensitivity power level	Qualcomm Korea
R5-211680	Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 7	CAICT
R5-211681	Updating test case 7.3C.2-Reference sensitivity power level for SUL	Huawei, Hisilicon, CAICT

5.3.2.4.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-210290	Clarification of uplink power measurement uncertainty in test case 6.3.4.3	Keysight Technologies UK Ltd
R5-210802	Update of clause 5 to R15 TS 38.521-1	China Unicom
R5-211048	Correction to test tolerance for FR1 blocking tests	Anritsu
R5-211682	Update of clause 5 to R15 TS 38.521-1	China Unicom

5.3.2.5.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210293	New FR2 Common Uplink Configurations definition in section 6	Keysight Technologies UK Ltd
R5-210297	Editorial corrections in Occupied bandwidth test procedure	Keysight Technologies UK Ltd
R5-210489	Correction of test purpose for 6.3.2 Transmit OFF power	CAICT
R5-210490	Addition of new test case 6.3D.2 Transmit OFF power for UL MIMO	CAICT
R5-210543	FR2 UL CA Frequency error test cases update	Keysight Technologies UK Ltd
R5-210547	FR2 MPR, ACLR and SEM test cases update as per TP analysis update	Keysight Technologies UK Ltd, Ericsson, CAICT
R5-210724	Omitting of FR2 Rx cases with UL-MIMO on TDD bands	Huawei, HiSilicon
R5-210727	Addition of Inner_partial allocation in general section and a few test cases	Huawei, HiSilicon, Keysight
R5-210728	Correction of parameter configuration for open loop power control	Huawei, HiSilicon
R5-210729	Removing test condition of extreme voltage	Huawei, HiSilicon
R5-210730	Cleaning up of FR2 test specification	Huawei, HiSilicon
R5-210893	Update of TX Test Cases for UL MIMO in FR2	Sporton
R5-211028	Addition of new test case 6.2A.1.1.4 UE maximum output power - EIRP and TRP for 5UL CA	KTL
R5-211029	Addition of new test case 6.2A.1.1.5 UE maximum output power - EIRP and TRP for 6UL CA	KTL
R5-211030	Addition of new test case 6.2A.1.1.6 UE maximum output power - EIRP and TRP for 7UL CA	KTL
R5-211031	Addition of new test case 6.2A.1.1.7 UE maximum output power - EIRP and TRP for 8UL CA	KTL
R5-211093	Correction to ACLR relaxation value in TC 6.5.2.3	Anritsu
R5-211094	Correction to assumption of aggregated channel bandwidth in TC 6.5A.2.2	Anritsu
R5-211095	Correction to definition of power control window size in FR2 relative power tolerance in TC 6.3.4.3	Anritsu
R5-211097	Definition of relaxation value of spurious emissions UE co-existence in TC 6.5.3.2	Anritsu
R5-211110	Corrections to subclauses in 38.521-2 with appropriate subclause level and heading styles	ZTE Corporation
R5-211114	Corrections to reference figures for transmission bandwidth configuration in FR2	ZTE Corporation
R5-211231	FR2 Tx additional spurious emission test case updates	Qualcomm Finland RFFE Oy
R5-211683	Editorial corrections in Occupied bandwidth test procedure	Keysight Technologies UK Ltd
R5-211684	FR2 UL CA Frequency error test cases update	Keysight Technologies UK Ltd
R5-211685	Addition of Inner_partial allocation in general section and a few test cases	Huawei, HiSilicon, Keysight
R5-211686	Correction of parameter configuration for open loop power control	Huawei, HiSilicon
R5-211688	Addition of new test case 6.2A.1.1.4 UE maximum output power - EIRP and TRP for 5UL CA	KTL
R5-211689	Addition of new test case 6.2A.1.1.5 UE maximum output power - EIRP and TRP for 6UL CA	KTL
R5-211690	Addition of new test case 6.2A.1.1.6 UE maximum output power - EIRP and TRP for 7UL CA	KTL
R5-211691	Addition of new test case 6.2A.1.1.7 UE maximum output power - EIRP and TRP for 8UL CA	KTL
R5-211692	Corrections to reference figures for transmission bandwidth configuration in FR2	ZTE Corporation
R5-211863	FR2 MPR, ACLR and SEM test cases update as per TP analysis update	Keysight Technologies UK Ltd, Ericsson, CAICT
R5-211864	Cleaning up of FR2 test specification	Huawei, HiSilicon
R5-211865	Update of TX Test Cases for UL MIMO in FR2	Sporton
R5-211866	Correction to definition of power control window size in FR2 relative power tolerance in TC 6.3.4.3	Anritsu
R5-211867	FR2 Tx additional spurious emission test case updates	Qualcomm Finland RFFE Oy
R5-211921	Correction to ACLR relaxation value in TC 6.5.2.3	Anritsu

5.3.2.5.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-210294	ACS FR2 test case update	Keysight Technologies UK Ltd
R5-210295	IBB FR2 test case update	Keysight Technologies UK Ltd
R5-210491	Correction of test applicability and test description for 7.4 Maximum input level	CAICT
R5-210492	Addition of new test cases for 7.4A Maximum input level for CA	CAICT
R5-210493	Addition of new test case 7.4D Maximum input level for UL MIMO	CAICT
R5-211096	Correction to editors note about beam peak direction	Anritsu
R5-211868	ACS FR2 test case update	Keysight Technologies UK Ltd
R5-211869	IBB FR2 test case update	Keysight Technologies UK Ltd

5.3.2.5.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-210296	MU and TT definition for REFSENS FR2 CA test cases	Keysight Technologies UK Ltd
R5-210494	Removal of brackets for MU of EIS spherical coverage	CAICT
R5-210495	Correction of Annex P for Modified MPR behaviour	CAICT
R5-210496	Correction of definition for EIS	CAICT
R5-210565	Update of waveform to be used during Rx peam peak search in Annex K.1.2	Keysight Technologies UK Ltd
R5-210731	Adding definition of FR2a, FR2b and FR2c in general section	Huawei, HiSilicon
R5-210732	Cleaning up of Annex K	Huawei, HiSilicon
R5-211098	Update FR2 MU and TT in 38.521-2	Anritsu
R5-211126	Update of 5.5A.2 for corrections to configurations for intra-band non-contiguous CA	ZTE Corporation
R5-211188	CR to 38.521-2 on larger quiet zone with grey box approach	Keysight Technologies UK Ltd
R5-211190	CR to 38.521-2 on PC1 Measurement Grid MUs	Keysight Technologies UK Ltd
R5-211265	Update of ETC MTSU	ROHDE & SCHWARZ
R5-211267	Update of Annex F for test case 7.3.4	ROHDE & SCHWARZ
R5-211693	Update of Annex F for test case 7.3.4	ROHDE & SCHWARZ
R5-211922	MU and TT definition for REFSENS FR2 CA test cases	Keysight Technologies UK Ltd
R5-211923	Update FR2 MU and TT in 38.521-2	Anritsu
R5-211924	CR to 38.521-2 on PC1 Measurement Grid MUs	Keysight Technologies UK Ltd
R5-211925	Update of ETC MTSU	ROHDE & SCHWARZ

5.3.2.6.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210117	Editorial addition of editors notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4	CMCC, Qualcomm, Bureau Veritas, Ericsson, R&S, Huawei, CAICT, Apple
R5-210298	Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition	Keysight Technologies UK Ltd
R5-210301	Completion of OBW intra-band non-contiguous test 6.5B.1.2	Keysight Technologies UK Ltd
R5-210302	Addition of new test case 6.5B.1.4D OBW for inter-band EN-DC FR2 UL MIMO	Keysight Technologies UK Ltd
R5-210303	ACLR for intra-band non-contiguous EN-DC Test Definition	Keysight Technologies UK Ltd
R5-210386	Update Test description of 6.5B.1.1	Guangdong OPPO Mobile Telecom.
R5-210387	Correction to EN-DC OoB emissions	ROHDE & SCHWARZ
R5-210415	Addition of new test case 6.4B.2.4.3_1.1 In-band Emissions for inter-band EN-DC including FR2 with 3 CCs	LG Electronics
R5-210416	Addition of new test case 6.4B.2.4.3_1.2 In-band Emissions for inter-band EN-DC including FR2 with 4 CCs	LG Electronics
R5-210417	Addition of new test case 6.4B.2.4.3_1.3 In-band Emissions for inter-band EN-DC including FR2 with 5 CCs	LG Electronics
R5-210497	Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 6.2B.1.3	CAICT
R5-210498	Addition of editor note to the incomplete test cases	CAICT
R5-210499	Correction of test applicability of 6.5B.5.3	CAICT
R5-210500	Correction of test configuration tables in section 6	CAICT
R5-210545	EN-DC FR2 UL CA Frequency error test cases update	Keysight Technologies UK Ltd
R5-210618	CR for 38.521-3: Update Editors Notes in Power Control tests	Apple Portugal
R5-210725	Omitting of NSA Rx cases with UL-MIMO on TDD bands	Huawei, HiSilicon
R5-210736	Correcting EN-DC A-MPR test requirements for non-overlapping test points	Huawei, HiSilicon
R5-210737	Correction of test requirements for EN-DC configured output power	Huawei, HiSilicon, Anritsu
R5-210909	Editorial correction to test case 6.2B.4.1.3	Huawei, Hisilicon
R5-210944	Removing Editor note in 6.2B.4 configured transmitted power for EN-DC within FR1	Huawei, HiSilicon
R5-210947	Removing the reconfiguration of TDD-config across EN-DC Tx test cases	Huawei, HiSilicon
R5-210951	Correction to the TDM pattern configuration for EN-DC Tx test cases	Huawei, HiSilicon
R5-210987	Update for 6.5B.3.3.2 Spurious emission band UE co-existence	Qualcomm Korea
R5-211053	Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211054	Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211055	Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211056	Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211057	Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211058	Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211059	Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211060	Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211061	Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211062	Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211063	Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211099	Correction to editors note about number of E-UTRA carriers	Anritsu
R5-211100	Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1	Anritsu
R5-211111	Corrections to subclauses in 38.521-3 with appropriate subclause level and heading styles	ZTE Corporation
R5-211694	Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition	Keysight Technologies UK Ltd
R5-211695	ACLR for intra-band non-contiguous EN-DC Test Definition	Keysight Technologies UK Ltd
R5-211696	Update Test description of 6.5B.1.1	Guangdong OPPO Mobile Telecom.
R5-211697	EN-DC FR2 UL CA Frequency error test cases update	Keysight Technologies UK Ltd
R5-211698	Correction of test requirements for EN-DC configured output power	Huawei, HiSilicon, Anritsu
R5-211699	Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211700	Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211701	Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211702	Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211703	Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211704	Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211705	Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211706	Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211707	Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211708	Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211709	Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2	Ericsson
R5-211852	Update for 6.5B.3.3.2 Spurious emission band UE co-existence	Qualcomm Korea
R5-211870	Editorial addition of editors notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4	CMCC, Qualcomm, Bureau Veritas, Ericsson, R&S, Huawei, CAICT, Apple
R5-211871	Correcting EN-DC A-MPR test requirements for non-overlapping test points	Huawei, HiSilicon
R5-211872	Correction to the TDM pattern configuration for EN-DC Tx test cases	Huawei, HiSilicon
R5-211873	Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1	Anritsu

5.3.2.6.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-210299	Correction of LTE frequency for 19-n79 combo in 7.3B.2.3	Keysight Technologies UK Ltd, Ericsson
R5-210300	Correction in Refsens test case 7.3B.2.3_1.1 for DC_1A-7A_n78A combo	Keysight Technologies UK Ltd, Ericsson
R5-210351	Correction of MSD test point on Table 7.3B.2.0.3.5.2-1 DC_1A-8A_n78A	KT Corp.
R5-210352	Update of 7.3B.2.3_1.1 RefSens DC_3A-8A_n78A	KT Corp.
R5-210358	Addition of new test case 7.3B.4 for EIS Spherical Coverage	ROHDE & SCHWARZ
R5-210501	Completion of 7.6B.2.3_1.3 Inband blocking for EN-DC within FR1 5 CCs	CAICT
R5-210502	Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 7.6B.3.3	CAICT
R5-210503	Editorial correction for errors in 7.6B.4.3_1	CAICT
R5-210504	Correction of test configuration tables in section 7	CAICT
R5-210517	Update to EN-DC Reference Sensitivity	ROHDE & SCHWARZ
R5-210738	Clarification of tested Rx antenna numbers on E-UTRA band	Huawei, HiSilicon, Bureau Veritas
R5-210989	Update for 7.3B.2.0 Minimum Conformance Requirements of Reference sensitivity for EN-DC	Qualcomm Korea
R5-211000	Correction to EN-DC Wideband Intermodulation tests	Bureau Veritas, Anritsu
R5-211010	Update of reference sensitivity for intra-band contiguous EN-DC	Huawei, HiSilicon
R5-211011	Update of reference sensitivity for intra-band non-contiguous EN-DC	Huawei, HiSilicon
R5-211012	Update of reference sensitivity for inter-band 2CC EN-DC	Huawei, HiSilicon
R5-211013	Correction to refsens test requirements for DC_1A-7A_n78A	Huawei, HiSilicon, Keysight Technologies UK Ltd, Ericsson
R5-211014	Adding in-gap tests to ACS for intra-band non-contiguous EN-DC	Huawei, HiSilicon
R5-211016	Update of test configuration for inter-band 2CC EN-DC configurations affected by reference sensitivity exceptions	Huawei, HiSilicon
R5-211017	Update of test coverage for reference sensitivity for 3CC EN-DC	Huawei, HiSilicon
R5-211101	Correction to test points of FR1 EN-DC intermodulation with 3CC in TC 7.8B.2.6	Anritsu
R5-211137	Update of 2CC refsens test case 7.3B.2.3	Ericsson
R5-211138	Update of 3CC refsens test case 7.3B.2.3_1.1	Ericsson
R5-211139	Correction of configurations not to be tested in 4CC refsens test case 7.3B.2.3_1.2	Ericsson
R5-211141	Addition of DC_8A_n77A in test case 7.3B.2.3	Ericsson
R5-211143	Addition of DC_11A_n79A in test case 7.3B.2.3	Ericsson
R5-211145	Addition of DC_26A_n41A in test case 7.3B.2.3	Ericsson
R5-211147	Addition of DC_26A_n77A and DC_26A_n78A in test case 7.3B.2.3	Ericsson
R5-211149	Addition of DC_26A_n79A in test case 7.3B.2.3	Ericsson
R5-211151	Addition of DC_41A_n77A and DC_41A_n78A in test case 7.3B.2.3	Ericsson
R5-211687	Correction to test points of FR1 EN-DC intermodulation with 3CC in TC 7.8B.2.6	Anritsu
R5-211710	Correction of MSD test point on Table 7.3B.2.0.3.5.2-1 DC_1A-8A_n78A	KT Corp.
R5-211711	Update of 7.3B.2.3_1.1 RefSens DC_3A-8A_n78A	KT Corp.
R5-211712	Addition of new test case 7.3B.4 for EIS Spherical Coverage	ROHDE & SCHWARZ
R5-211713	Editorial correction for errors in 7.6B.4.3_1	CAICT
R5-211714	Correction of test configuration tables in section 7	CAICT
R5-211715	Clarification of tested Rx antenna numbers on E-UTRA band	Huawei, HiSilicon, Bureau Veritas
R5-211854	Correction to EN-DC Wideband Intermodulation tests	Bureau Veritas, Anritsu
R5-211874	Correction of LTE frequency for 19-n79 combo in 7.3B.2.3	Keysight Technologies UK Ltd, Ericsson
R5-211875	Update to EN-DC Reference Sensitivity	ROHDE & SCHWARZ
R5-211876	Update of reference sensitivity for intra-band non-contiguous EN-DC	Huawei, HiSilicon
R5-211877	Update of reference sensitivity for inter-band 2CC EN-DC	Huawei, HiSilicon
R5-211878	Correction to refsens test requirements for DC_1A-7A_n78A	Huawei, HiSilicon, Keysight Technologies UK Ltd, Ericsson
R5-211879	Update of test configuration for inter-band 2CC EN-DC configurations affected by reference sensitivity exceptions	Huawei, HiSilicon
R5-211880	Update of 2CC refsens test case 7.3B.2.3	Ericsson
R5-211881	Update of 3CC refsens test case 7.3B.2.3_1.1	Ericsson
R5-211882	Correction of configurations not to be tested in 4CC refsens test case 7.3B.2.3_1.2	Ericsson
R5-211883	Addition of DC_8A_n77A in test case 7.3B.2.3	Ericsson
R5-211884	Addition of DC_11A_n79A in test case 7.3B.2.3	Ericsson
R5-211885	Addition of DC_26A_n41A in test case 7.3B.2.3	Ericsson
R5-211886	Addition of DC_26A_n77A and DC_26A_n78A in test case 7.3B.2.3	Ericsson
R5-211887	Addition of DC_26A_n79A in test case 7.3B.2.3	Ericsson
R5-211888	Addition of DC_41A_n77A and DC_41A_n78A in test case 7.3B.2.3	Ericsson

5.3.2.6.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-210305	MU definition for UE MOP for Inter-Band EN-DC including FR2 (3CCs)	Keysight Technologies UK Ltd
R5-210306	MU and TT defintion for REFSENS EN-DC including FR2 up to 5CCs	Keysight Technologies UK Ltd
R5-210548	Default message exceptions for LTE carriers in EN-DC	Keysight Technologies UK Ltd
R5-211004	Update to EN-DC R15 Configuration information in clause 5	Bureau Veritas
R5-211102	Update FR2 MU and TT in 38.521-3	Anritsu
R5-211926	MU definition for UE MOP for Inter-Band EN-DC including FR2 (3CCs)	Keysight Technologies UK Ltd
R5-211927	MU and TT defintion for REFSENS EN-DC including FR2 up to 5CCs	Keysight Technologies UK Ltd
R5-211928	Update FR2 MU and TT in 38.521-3	Anritsu

5.3.2.7.1: Conducted Demod Performance and CSI Reporting Requirements (Clauses 5&6)

TDoc	Title	Source
R5-210521	Correction to test applicability for LTE-NR coexistence performance test cases	Anritsu
R5-210524	Correction to test time for Subband CQI test case	Anritsu
R5-210525	Correction to DCI bit size for PDSCH Type B performance and LTE coexistence tests	Anritsu
R5-210526	Correction to LB setup DRB in CLOSE UE TEST LOOP message	Anritsu
R5-210773	Correction in 6.4.2.1_1 test requirements	Keysight Technologies UK Ltd
R5-210869	Correction to Test Purpose of PDCCH test cases	Huawei, HiSilicon
R5-210870	Correction to NR test case 6.2.2.1.2.1	Huawei, HiSilicon
R5-210993	Editorial, cleanup of some references in 38.521-4	Ericsson
R5-211716	Correction to DCI bit size for PDSCH Type B performance and LTE coexistence tests	Anritsu
R5-211717	Correction to LB setup DRB in CLOSE UE TEST LOOP message	Anritsu
R5-211718	Correction to NR test case 6.2.2.1.2.1	Huawei, HiSilicon

5.3.2.7.2: Radiated Demod Performance and CSI Reporting Requirements (Clauses 7&8)

TDoc	Title	Source
R5-210520	Correction to SR config for TDD PDSCH Type A performance test cases	Anritsu
R5-210522	Correction to wideband CQI reporting under fading test cases	Anritsu
R5-210523	Addition of 8.3.2.2.1 2Rx TDD FR2 Single PMI with 2TX TypeI-SinglePanel Codebook	Anritsu
R5-210770	Update message content in test case 7.3.2.2.2	Keysight Technologies UK Ltd
R5-211084	Update to FR2 PDSCH test case for maximum testable SNR	Qualcomm Wireless GmbH
R5-211085	Update to FR2 CQI reporting test case for maximum testable SNR	Qualcomm Wireless GmbH
R5-211260	Update of FR2 demod test cases	ROHDE & SCHWARZ
R5-211929	Update of FR2 demod test cases	ROHDE & SCHWARZ

5.3.2.7.3: Interworking Demod Performance and CSI Reporting Requirements (Clauses 9&10)

TDoc	Title	Source
R5-210871	Correction to NR TC 9.4B.1.1	Huawei, HiSilicon
R5-211851	Correction to NR TC 9.4B.1.1	Huawei, HiSilicon

5.3.2.7.4: Clauses 1-4 / Annexes

TDoc	Title	Source
R5-210318	Correction to E-UTRA link setup for NSA testing	ROHDE & SCHWARZ
R5-210868	Correction to Table F.1.1.2-2 for FR1 test cases	Huawei, HiSilicon
R5-211081	Update to downlink physical channel EPRE level for LTE-NR coex scenario	Qualcomm Wireless GmbH
R5-211719	Correction to E-UTRA link setup for NSA testing	ROHDE & SCHWARZ

5.3.2.8: TS 38.522

TDoc	Title	Source
R5-210476	Editorial: correct title of PRACH test cases to match RRM work plan - Applicability	ROHDE & SCHWARZ
R5-210505	Correction of applicability definitions for PUSCH HalfPi BPSK related test cases	CAICT
R5-210506	Correction of applicability definitions for long DRX cycle related test cases	CAICT
R5-210726	Updating applicability of FR1 Rx cases with UL-MIMO to only FDD bands	Huawei, HiSilicon
R5-211003	Update to applicability spec for 5G test cases	Bureau Veritas, ROHDE & SCHWARZ, TTA, KTL, Ericsson, Huawei, HiSilicon, CAICT, Google Inc., Anritsu
R5-211183	Correction PICS condition of test case 6.4.2.5	Google Inc.
R5-211200	Applicability for 5.4.3.1	ROHDE & SCHWARZ
R5-211201	Applicability for FR2 iRAT	ROHDE & SCHWARZ
R5-211202	Applicability for 4.5.7.1	ROHDE & SCHWARZ
R5-211720	Correction of applicability definitions for PUSCH HalfPi BPSK related test cases	CAICT
R5-211721	Correction PICS condition of test case 6.4.2.5	Google Inc.
R5-211853	Update to applicability spec for 5G test cases	Bureau Veritas, ROHDE & SCHWARZ, TTA, KTL, Ericsson, Huawei, HiSilicon, CAICT, Google Inc., Anritsu

5.3.2.9.1: EN-DC with all NR cells in FR1 (Clause 4)

TDoc	Title	Source
R5-210134	Update of first preamble power for EN-DC TC 4.3.2.2.1 and 4.3.2.2.2	MediaTek Inc.
R5-210174	Update of Scell activation and CSI reporting time for EN-DC TC 4.5.3.1	MediaTek Inc.
R5-210179	Update of PRACH configuration for EN-DC TC 4.5.5.3 and 4.5.5.4	MediaTek Inc.
R5-210436	Complete RRM 4.5.7.1 including TT analysis results	ROHDE & SCHWARZ
R5-210442	Update TT results for SS-RSRP measurement accuracy test cases chapter 4	ROHDE & SCHWARZ
R5-210446	Update TT results for SS-RSRQ measurement accuracy test cases chapter 4	ROHDE & SCHWARZ
R5-210458	Correction RLM config for event triggered test cases	ROHDE & SCHWARZ
R5-210459	Correction EN-DC FR1 timing tests	ROHDE & SCHWARZ
R5-210460	Corrections to 5.4.1.1	ROHDE & SCHWARZ
R5-210467	Corrections to 4.3.2.2.2	ROHDE & SCHWARZ
R5-210471	Clarification on SSB Index to use in the PUxCH-PowerControl for RRM tests with more than one SSB - EN-DC	ROHDE & SCHWARZ
R5-210472	Editorial: correct title of PRACH test cases to match RRM work plan - EN-DC FR1	ROHDE & SCHWARZ
R5-210507	Correction of test applicability for long DRX cycle related test cases in section 4	CAICT
R5-210527	Clarification of SNR for 4RX UE in RLM Test Cases	Anritsu
R5-210529	Correction to Interruptions during measurements on deactivated NR SCC test cases	Anritsu
R5-210530	Correction to message configuration for NSA CSI-RS-based RLM RS test cases	Anritsu
R5-210533	Correction to 4.5.1.2 and 6.5.1.2 PDCCH Aggregation Level	Anritsu
R5-210536	Correction to L1-RSRP test cases	Anritsu
R5-210538	Update of DRX configuration in FR1 Event-triggered Test cases	Anritsu
R5-210606	RACH-Config Correction for Non-Contention based Random Access test case 4.3.2.2.2	Keysight Technologies UK Ltd
R5-210607	Correction in 4.7.3.2.1 test parameters	Keysight Technologies UK Ltd
R5-210608	Correction in 4.5.2.1 and 4.5.2.2 test procedure	Keysight Technologies UK Ltd
R5-210795	Clarification of BWP1 and BWP2 in 4.6.1.3, 4.6.1.4, 4.6.1.6	MediaTek Inc.
R5-210821	Update Test Tolerance for FR1 RLM Test Cases	ANRITSU LTD
R5-210851	Update of FR1 TT for 4.5.5.1 and 4.5.5.2 SSB based LR	Huawei, HiSilicon
R5-210852	Update of FR1 TT for 4.5.5.3 and 4.5.5.4 CSI-RS based LR	Huawei, HiSilicon
R5-210853	Correction to 4.6.4.3 and 4.6.4.4 L1-RSRP reporting delay	Huawei, HiSilicon
R5-210854	Correction to EN-DC radio link monitoring	Huawei, HiSilicon
R5-210855	Update of 4.5.3.1 SCell activation and deactivation	Huawei, HiSilicon
R5-210954	Update to 4.5.4.1 EN-DC FR1 UE UL carrier RRC reconfiguration delay	Qualcomm Technologies Netherlands B.V.
R5-210955	Update to 4.7.5.1 EN-DC FR1 SFTD measurement accuracy	Qualcomm Technologies Netherlands B.V.
R5-211211	Correction of applied TT for EN-DC FR1 L1-RSRP measurement test cases	Ericsson
R5-211255	Clarification of BWP1 and BWP2 in 4.6.1.3, 4.6.1.4, 4.6.1.6	Keysight Technologies UK Ltd
R5-211614	Update of Scell activation and CSI reporting time for EN-DC TC 4.5.3.1	MediaTek Inc.
R5-211615	Complete RRM 4.5.7.1 including TT analysis results	ROHDE & SCHWARZ
R5-211616	Update Test Tolerance for FR1 RLM Test Cases	ANRITSU LTD
R5-211617	Correction to EN-DC radio link monitoring	Huawei, HiSilicon
R5-211618	Update of 4.5.3.1 SCell activation and deactivation	Huawei, HiSilicon
R5-211619	Update to 4.5.4.1 EN-DC FR1 UE UL carrier RRC reconfiguration delay	Qualcomm Technologies Netherlands B.V.
R5-211620	Update to 4.7.5.1 EN-DC FR1 SFTD measurement accuracy	Qualcomm Technologies Netherlands B.V.
R5-211621	Correction of applied TT for EN-DC FR1 L1-RSRP measurement test cases	Ericsson
R5-211722	Correction EN-DC FR1 timing tests	ROHDE & SCHWARZ
R5-211723	Corrections to 5.4.1.1	ROHDE & SCHWARZ
R5-211724	Clarification of SNR for 4RX UE in RLM Test Cases	Anritsu
R5-211725	Correction in 4.7.3.2.1 test parameters	Keysight Technologies UK Ltd

5.3.2.9.2: EN-DC with at least 1 NR Cell in FR2 (Clause5)

TDoc	Title	Source
R5-210176	Update of Scell activation and CSI reporting time for EN-DC TC 5.5.3.1	MediaTek Inc.
R5-210180	Update of PRACH configuration for EN-DC TC 5.5.5.x	MediaTek Inc.
R5-210432	Update 5.4.3.1 with TT analysis results	ROHDE & SCHWARZ
R5-210508	Correction of test applicability for long DRX cycle related test cases in section 5	CAICT
R5-210816	Update of FR2 Tx Timing Test case 5.4.1.1 Test Tolerances	ANRITSU LTD
R5-210952	Update to 5.4.1.1 EN-DC FR2 UE transmit timing accuracy	Qualcomm Technologies Netherlands B.V.
R5-210953	Update to 5.4.3.1 EN-DC FR2 timing advance adjustment accuracy	Qualcomm Technologies Netherlands B.V.
R5-211213	Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.1 including TT	Ericsson
R5-211214	Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.3 including TT	Ericsson
R5-211601	Update to 5.4.3.1 EN-DC FR2 timing advance adjustment accuracy	Qualcomm Technologies Netherlands B.V.
R5-211603	Update to 5.4.1.1 EN-DC FR2 UE transmit timing accuracy	Qualcomm Technologies Netherlands B.V.
R5-211622	Update 5.4.3.1 with TT analysis results	ROHDE & SCHWARZ
R5-211623	Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.1 including TT	Ericsson
R5-211624	Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.3 including TT	Ericsson

5.3.2.9.3: NR Standalone in FR1 (Clause 6)

TDoc	Title	Source
R5-210135	Update of first preamble power for SA TC 6.3.2.2.1 and 6.3.2.2.2	MediaTek Inc.
R5-210136	Update of UE initial state for SA RLM TC 6.5.1.x	MediaTek Inc.
R5-210138	Update of cell frequency for TC 6.7.2.2.2	MediaTek Inc.
R5-210171	Editorial update of SS-RSRP for TC 6.7.1.2.1	MediaTek Inc.
R5-210172	Update of RRC message for TC 6.3.1.4, 6.3.1.5 and 6.3.2.3.2	MediaTek Inc.
R5-210173	Update of RRC message for TC 6.4.3.1 and 6.5.2.1	MediaTek Inc.
R5-210175	Update of CSI reporting time for SA TC 6.5.3.1	MediaTek Inc.
R5-210181	Update of PRACH configuration for SA TC 6.5.5.3 and 6.5.5.4	MediaTek Inc.
R5-210443	Update TT results for SS-RSRP measurement accuracy test cases chapter 6	ROHDE & SCHWARZ
R5-210447	Update TT results for SS-RSRQ measurement accuracy test cases chapter 6	ROHDE & SCHWARZ
R5-210450	Update TT results for 6.3.1.1	ROHDE & SCHWARZ
R5-210464	Corrections NR SA FR1 timing test cases	ROHDE & SCHWARZ
R5-210465	Editorial correction of title of clause 6	ROHDE & SCHWARZ
R5-210466	Corrections to 6.3.2.2.1 and 6.3.2.2.2	ROHDE & SCHWARZ
R5-210470	Clarification on SSB Index to use in the PUxCH-PowerControl for RRM tests with more than one SSB	ROHDE & SCHWARZ
R5-210473	Editorial: correct title of PRACH test cases to match RRM work plan - SA FR1	ROHDE & SCHWARZ
R5-210509	Correction of test applicability for long DRX cycle related test cases in section 6	CAICT
R5-210528	Correction to test procedure in test case 6.5.1.4	Anritsu
R5-210531	Correction to NR SA RLM out-of-sync test cases	Anritsu
R5-210532	Correction to NR SA FR1 RRC Re-establishment test cases	Anritsu
R5-210534	Correction to NR SA FR1 E-UTRA RRC connection release with redirection	Anritsu
R5-210535	Correction to FR1 NSA SS-SINR measurement test cases	Anritsu
R5-210537	Correction to the procedure to add a step for establishing SRB2 and DRB	Anritsu
R5-210601	Clarification of BWP1 and BWP2 in 6.6.1.3, 6.6.1.4, 6.6.1.6	Keysight Technologies UK Ltd
R5-210605	RACH-Config Correction for Non-Contention based Random Access test case 6.3.2.2.2	Keysight Technologies UK Ltd
R5-210612	Editorial correction in 6.5.2.1	Keysight Technologies UK Ltd
R5-210614	Correction in 6.1.2.2 test procedure	Keysight Technologies UK Ltd
R5-210856	Correction to SA radio link monitoring	Huawei, HiSilicon
R5-210857	Update of FR1 TT for 6.5.5.1 and 6.5.5.2 SSB based LR	Huawei, HiSilicon
R5-210858	Update of FR1 TT for 6.5.5.3 and 6.5.5.4 CSI-RS based LR	Huawei, HiSilicon
R5-210859	Correction to NR TC 6.6.3.2-Inter-RAT DRX	Huawei, HiSilicon
R5-210860	Correction to 6.6.4.3 and 6.6.4.4 L1-RSRP reporting delay	Huawei, HiSilicon
R5-210861	Update of 6.5.1.2 and 6.5.1.4 SSB based RLM	Huawei, HiSilicon
R5-210862	Update of 6.5.2 interruption during measurement on deactivated SCC	Huawei, HiSilicon, Keysight
R5-210863	Update of 6.5.3.1 SCell activation and deactivation	Huawei, HiSilicon
R5-210956	Update to 6.3.2.2.1 Contention based random access test in FR1 for NR standalone	Qualcomm Technologies Netherlands B.V.
R5-210957	Update to 6.3.2.2.2 Non-Contention based random access test in FR1 for NR standalone	Qualcomm Technologies Netherlands B.V.
R5-210958	Update to 6.5.2.1 NR SA FR1 interruptions during measurements on deactivated NR SCC	Qualcomm Technologies Netherlands B.V.
R5-210959	Update to 6.5.4.1 NR SA FR1 UE UL carrier RRC reconfiguration delay	Qualcomm Technologies Netherlands B.V.
R5-210960	Update to 6.6.3.1 NR SA FR1 - E-UTRAN event-triggered reporting in non-DRX	Qualcomm Technologies Netherlands B.V.
R5-210961	Update to 6.6.3.2 NR SA FR1 - E-UTRAN event-triggered reporting in DRX	Qualcomm Technologies Netherlands B.V.
R5-211212	Correction of applied TT for SA FR1 L1-RSRP measurement test cases	Ericsson
R5-211612	Update of 6.5.2 interruption during measurement on deactivated SCC	Huawei, HiSilicon, Keysight
R5-211625	Update of CSI reporting time for SA TC 6.5.3.1	MediaTek Inc.
R5-211626	Correction to SA radio link monitoring	Huawei, HiSilicon
R5-211627	Update to 6.3.2.2.1 Contention based random access test in FR1 for NR standalone	Qualcomm Technologies Netherlands B.V.
R5-211628	Update to 6.3.2.2.2 Non-Contention based random access test in FR1 for NR standalone	Qualcomm Technologies Netherlands B.V.
R5-211629	Update to 6.5.2.1 NR SA FR1 interruptions during measurements on deactivated NR SCC	Qualcomm Technologies Netherlands B.V.
R5-211630	Update to 6.6.3.1 NR SA FR1 - E-UTRAN event-triggered reporting in non-DRX	Qualcomm Technologies Netherlands B.V.
R5-211631	Update to 6.6.3.2 NR SA FR1 - E-UTRAN event-triggered reporting in DRX	Qualcomm Technologies Netherlands B.V.
R5-211632	Correction of applied TT for SA FR1 L1-RSRP measurement test cases	Ericsson
R5-211726	Update of RRC message for TC 6.3.1.4, 6.3.1.5 and 6.3.2.3.2	MediaTek Inc.
R5-211727	Corrections NR SA FR1 timing test cases	ROHDE & SCHWARZ
R5-211728	Correction to NR TC 6.6.3.2-Inter-RAT DRX	Huawei, HiSilicon
R5-211729	Update of 6.5.1.2 and 6.5.1.4 SSB based RLM	Huawei, HiSilicon
R5-211889	Update TT results for 6.3.1.1	ROHDE & SCHWARZ

5.3.2.9.4: NR standalone with at least one NR cell in FR2 (Clause7)

TDoc	Title	Source
R5-210177	Update of CSI reporting time for SA TC 7.5.3.1 and 7.5.3.2	MediaTek Inc.
R5-210178	Update of PRACH configuration for SA TC 7.3.2.2.2	MediaTek Inc.
R5-210182	Update of PRACH configuration for SA TC 7.5.5.x	MediaTek Inc.
R5-210474	Editorial: correct title of PRACH test cases to match RRM work plan - SA FR2	ROHDE & SCHWARZ
R5-210510	Correction of test applicability for long DRX cycle related test cases in section 7	CAICT
R5-210796	Clarification of BWP1 and BWP2 in 7.6.1.3 and 7.6.1.4	MediaTek Inc.
R5-211215	Correction of SA FR2 inter-freq measurement test case 7.6.2.1 including TT	Ericsson
R5-211216	Correction of SA FR2 inter-freq measurement test case 7.6.2.3 including TT	Ericsson
R5-211633	Correction of SA FR2 inter-freq measurement test case 7.6.2.1 including TT	Ericsson
R5-211634	Correction of SA FR2 inter-freq measurement test case 7.6.2.3 including TT	Ericsson
R5-211730	Clarification of BWP1 and BWP2 in 7.6.1.3 and 7.6.1.4	MediaTek Inc.

5.3.2.9.5: E-UTRA – NR Inter-RAT with E-UTRA serving cell (Clause 8)

TDoc	Title	Source
R5-210137	Update of process delay for SFTD measurement TC 8.4.1.x	MediaTek Inc.
R5-210439	Complete FR2 iRAT measurement accuracy test cases	ROHDE & SCHWARZ
R5-210511	Correction of test applicability for long DRX cycle related test cases in section 8	CAICT
R5-211635	Complete FR2 iRAT measurement accuracy test cases	ROHDE & SCHWARZ

5.3.2.9.6: Clauses 1-3 / Annexes

TDoc	Title	Source
R5-210183	Update of prach-ConfigurationIndex for FR1 PRACH configuration 4 in A.7	MediaTek Inc.
R5-210433	Update Annex F for 5.4.3.1 and 7.4.3.1 with TT analysis results	ROHDE & SCHWARZ
R5-210434	Correct cell mapping for 5.4.3.1	ROHDE & SCHWARZ
R5-210437	Annex E and F 4.5.7.1 PSCell addition test	ROHDE & SCHWARZ
R5-210440	Update of TT analysis results in Annex F for FR2 iRAT test cases	ROHDE & SCHWARZ
R5-210444	Update TT results for SS-RSRP measurement accuracy test cases Annex F	ROHDE & SCHWARZ
R5-210448	Update TT results for SS-RSRQ measurement accuracy test cases Annex F	ROHDE & SCHWARZ
R5-210451	Update TT results for 6.3.1.1 Annex F	ROHDE & SCHWARZ
R5-210453	Update DL AWGN MU for RRM FR2	ROHDE & SCHWARZ
R5-210456	Update Annex I to TS 38.533	ROHDE & SCHWARZ
R5-210457	Update NR frequency band groups for FR1	ROHDE & SCHWARZ
R5-210463	Addition of Serving Cell Config for RRM timing test cases	ROHDE & SCHWARZ
R5-210475	Editorial: correct title of PRACH test cases to match RRM work plan - Annexes	ROHDE & SCHWARZ
R5-210478	Align Annex A with TS 38.133	ROHDE & SCHWARZ
R5-210613	Correction in SIB5 for iRAT cell reselection	Keysight Technologies UK Ltd
R5-210615	Correction in Table H.3.6-5	Keysight Technologies UK Ltd
R5-210813	Update FR2 Downlink and Uplink MU values	ANRITSU LTD
R5-210814	Finalise FR2 Timing MU values	ANRITSU LTD
R5-210835	Correction to AoA Test Setup applicability per permitted test method	Anritsu
R5-210864	Update of D.4 antenna configuration	Huawei, HiSilicon
R5-210865	Update of Annex F for Test Tolerance	Huawei, HiSilicon
R5-210866	Correction to CSI-RS RMC	Huawei, HiSilicon
R5-210867	Correction to default configuration on L1-RSRP reporting in Annex H	Huawei, HiSilicon
R5-211049	Additional of default downlink level for FR2	Anritsu
R5-211217	Correction of MTSU and applied TT in Annex F	Ericsson
R5-211225	Addition of new RMCs and OCNGs into Annex A	Ericsson
R5-211636	Update Annex F for 5.4.3.1 and 7.4.3.1 with TT analysis results	ROHDE & SCHWARZ
R5-211637	Update DL AWGN MU for RRM FR2	ROHDE & SCHWARZ
R5-211638	Update FR2 Downlink and Uplink MU values	ANRITSU LTD
R5-211639	Update of Annex F for Test Tolerance	Huawei, HiSilicon
R5-211640	Correction of MTSU and applied TT in Annex F	Ericsson
R5-211641	Addition of new RMCs and OCNGs into Annex A	Ericsson
R5-211731	Addition of Serving Cell Config for RRM timing test cases	ROHDE & SCHWARZ
R5-211890	Update TT results for 6.3.1.1 Annex F	ROHDE & SCHWARZ

5.3.2.10: TS 36.508

TDoc	Title	Source
R5-210767	Update to UECapabilityInformation	China Telecommunications
R5-210946	Correction to default TDD configuration for EN-DC RF test cases	Huawei, HiSilicon
R5-210950	Updating the value of PLTE for EN-DC test cases	Huawei, HiSilicon
R5-211891	Updating the value of PLTE for EN-DC test cases	Huawei, HiSilicon

5.3.2.15: TR 38.903 ((NR MU & TT analyses)

TDoc	Title	Source
R5-210307	Adjacent Channel Selectivity FR2 MU definition in 38.903	Keysight Technologies UK Ltd
R5-210308	In-band Blocking FR2 MU definition in 38.903	Keysight Technologies UK Ltd
R5-210431	Test tolerance analysis for 7.4.3.1 and 5.4.3.1	ROHDE & SCHWARZ
R5-210435	Test tolerance analysis for 4.5.7.1	ROHDE & SCHWARZ
R5-210438	Update TT analyses for FR2 iRAT measurement accuracy test cases	ROHDE & SCHWARZ
R5-210441	Update SS-RSRP measurement accuracy TT analyses for SNR uncertainty change	ROHDE & SCHWARZ
R5-210445	Update SS-RSRQ measurement accuracy TT analyses for SNR uncertainty change	ROHDE & SCHWARZ
R5-210449	Correct 6.3.1.1 TT analysis	ROHDE & SCHWARZ
R5-210454	Update RRM MU values for FR2	ROHDE & SCHWARZ
R5-210603	Update on DL AWGN absolute power uncertainty values for DFF	Keysight Technologies UK Ltd
R5-210604	Update MU threshold for DL AWGN absolute power for RRM FR2	Keysight Technologies UK Ltd
R5-210735	Editorial correction to several MU factors	Huawei, HiSilicon
R5-210815	Update Test Tolerance analyses for FR2 Tx Timing Test cases	ANRITSU LTD
R5-210817	Update Test Tolerance analyses for FR2 RLM Test cases	ANRITSU LTD
R5-210818	Update Test Tolerance analyses for FR2 Event-Trig Test cases	ANRITSU LTD
R5-210819	Update Test Tolerance analyses for FR2 SS-RSRP Test cases	ANRITSU LTD
R5-210820	Update Test Tolerance analyses for FR1 RLM Test cases	ANRITSU LTD
R5-210836	Update on FR2 Blocking Test MU	Anritsu
R5-210837	Update MU for FR2 RRM	Anritsu
R5-210846	Update of grouping of test cases in clause 8	Huawei, HiSilicon
R5-210847	Update of FR1 TT for SCell activation	Huawei, HiSilicon
R5-210848	Update of FR1 TT for SSB based link recovery	Huawei, HiSilicon
R5-210849	Update of FR1 TT for CSI-RS based link recovery	Huawei, HiSilicon
R5-210850	Update of FR1 TT for RRC re-establishment	Huawei, HiSilicon
R5-211103	Update FR2 MU and TT in 38.903	Anritsu
R5-211175	FR2 Minimum output power measurement uncertainty update	Keysight Technologies UK Ltd
R5-211185	CR to 38.903 on ETC Testing	Keysight Technologies UK Ltd
R5-211191	CR to 38.903 on PC1 Measurement Grid MUs	Keysight Technologies UK Ltd
R5-211208	Update of Test Tolerance analysis for FR1 event triggered reporting test cases	Ericsson
R5-211209	Update of Test Tolerance analysis for FR1 SSB-based L1-RSRP test cases	Ericsson
R5-211210	Update of Test Tolerance analysis for FR1 CSI-RS based L1-RSRP test cases	Ericsson
R5-211261	Update of demod SNR testability	ROHDE & SCHWARZ
R5-211264	Update of QoQZ MU	ROHDE & SCHWARZ
R5-211273	Test Tolerance analysis for FR2 event triggered reporting test cases	Ericsson
R5-211607	Update MU threshold for DL AWGN absolute power for RRM FR2	Keysight Technologies UK Ltd
R5-211642	Test tolerance analysis for 4.5.7.1	ROHDE & SCHWARZ
R5-211643	Update SS-RSRP measurement accuracy TT analyses for SNR uncertainty change	ROHDE & SCHWARZ
R5-211644	Update RRM MU values for FR2	ROHDE & SCHWARZ
R5-211645	Update of FR1 TT for SCell activation	Huawei, HiSilicon
R5-211646	Update of FR1 TT for SSB based link recovery	Huawei, HiSilicon
R5-211647	Update of FR1 TT for CSI-RS based link recovery	Huawei, HiSilicon
R5-211648	Update of FR1 TT for RRC re-establishment	Huawei, HiSilicon
R5-211649	Update of Test Tolerance analysis for FR1 event triggered reporting test cases	Ericsson
R5-211650	Update of Test Tolerance analysis for FR1 SSB-based L1-RSRP test cases	Ericsson
R5-211651	Update of Test Tolerance analysis for FR1 CSI-RS based L1-RSRP test cases	Ericsson
R5-211652	Test Tolerance analysis for FR2 event triggered reporting test cases	Ericsson
R5-211732	Editorial correction to several MU factors	Huawei, HiSilicon
R5-211892	Correct 6.3.1.1 TT analysis	ROHDE & SCHWARZ
R5-211930	Adjacent Channel Selectivity FR2 MU definition in 38.903	Keysight Technologies UK Ltd
R5-211931	In-band Blocking FR2 MU definition in 38.903	Keysight Technologies UK Ltd
R5-211932	Update on FR2 Blocking Test MU	Anritsu
R5-211933	Update MU for FR2 RRM	Anritsu
R5-211934	Update FR2 MU and TT in 38.903	Anritsu
R5-211935	CR to 38.903 on ETC Testing	Keysight Technologies UK Ltd
R5-211936	Update of demod SNR testability	ROHDE & SCHWARZ

5.3.2.16: TR 38.905 (NR Test Points Radio Transmission and Reception )

TDoc	Title	Source
R5-210090	Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1	Nokia, Nokia Shanghai Bell
R5-210309	TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous	Keysight Technologies UK Ltd
R5-210310	TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous	Keysight Technologies UK Ltd
R5-210512	Introduction of test point analysis for SA FR2 7.4A Maximum input level for CA	CAICT
R5-210544	Update of test point analysis for FR2 UL CA frequency error test cases	Keysight Technologies UK Ltd
R5-210546	Update of test point analysis for FR2 MPR, SEM and ACLR test cases	Keysight Technologies UK Ltd, Ericsson, CAICT
R5-210900	Updating TP analysis for Spurious Emissions for CA in FR1	Huawei, Hisilicon
R5-210901	Updating test point analysis for FR1 REFSENS for CA test case	Huawei, Hisilicon
R5-210905	Updating TP analysis for FR1 REFSENS for SUL testing	Huawei, Hisilicon
R5-210941	Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC	Ericsson, Huawei, Hisilicon
R5-210942	Moving of principles for reference sensitivity test point selection from attachments to annexes	Ericsson
R5-211064	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A	Ericsson
R5-211065	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A	Ericsson
R5-211066	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A	Ericsson
R5-211067	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A	Ericsson
R5-211068	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A	Ericsson
R5-211069	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A	Ericsson
R5-211070	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A	Ericsson
R5-211071	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A	Ericsson
R5-211072	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A	Ericsson
R5-211073	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A	Ericsson
R5-211074	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A	Ericsson
R5-211136	TP analysis update for EN_DC refsens	Ericsson
R5-211140	TP analysis for DC_8A_n77A	Ericsson
R5-211142	TP analysis for DC_11A_n79A	Ericsson
R5-211144	TP analysis for DC_26A_n41A	Ericsson
R5-211146	TP analysis for DC_26A_n77A and DC_26A_n78A	Ericsson
R5-211148	TP analysis for DC_26A_n79A	Ericsson
R5-211150	TP analysis for DC_41A_n77A and DC_41A_n78A	Ericsson
R5-211228	Test Point analysis update for FR2 Tx additional spurious emission test case	Qualcomm Finland RFFE Oy
R5-211606	Updating test point analysis for FR1 REFSENS for CA test case	Huawei, Hisilicon
R5-211733	Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1	Nokia, Nokia Shanghai Bell
R5-211734	TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous	Keysight Technologies UK Ltd
R5-211735	TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous	Keysight Technologies UK Ltd
R5-211736	Update of test point analysis for FR2 UL CA frequency error test cases	Keysight Technologies UK Ltd
R5-211737	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A	Ericsson
R5-211738	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A	Ericsson
R5-211739	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A	Ericsson
R5-211740	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A	Ericsson
R5-211741	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A	Ericsson
R5-211742	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A	Ericsson
R5-211743	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A	Ericsson
R5-211744	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A	Ericsson
R5-211745	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A	Ericsson
R5-211746	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A	Ericsson
R5-211747	Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A	Ericsson
R5-211748	Test Point analysis update for FR2 Tx additional spurious emission test case	Qualcomm Finland RFFE Oy
R5-211893	Update of test point analysis for FR2 MPR, SEM and ACLR test cases	Keysight Technologies UK Ltd, Ericsson, CAICT
R5-211894	Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC	Ericsson, Huawei, Hisilicon
R5-211895	Moving of principles for reference sensitivity test point selection from attachments to annexes	Ericsson
R5-211896	TP analysis update for EN_DC refsens	Ericsson
R5-211897	TP analysis for DC_8A_n77A	Ericsson
R5-211898	TP analysis for DC_11A_n79A	Ericsson
R5-211899	TP analysis for DC_26A_n41A	Ericsson
R5-211900	TP analysis for DC_26A_n77A and DC_26A_n78A	Ericsson
R5-211901	TP analysis for DC_26A_n79A	Ericsson
R5-211902	TP analysis for DC_41A_n77A and DC_41A_n78A	Ericsson

5.3.2.17: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210311	On ACS and IBB FR2 MU definition	Keysight Technologies UK Ltd
R5-210312	On minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1	Keysight Technologies UK Ltd
R5-210420	Discussion on equal PSD and PCC prioritization for UL CA test	Guangdong OPPO Mobile Telecom.
R5-210452	On the DL AWGN MTSU for RRM	ROHDE & SCHWARZ
R5-210515	Discussion on test issue of ONOFF time mask for UL MIMO	Guangdong OPPO Mobile Telecom.
R5-210557	On the QoQZ standard deviation for ETC testing	ROHDE & SCHWARZ
R5-210600	On MTSU definition for RRM	Keysight Technologies UK Ltd
R5-210617	AP#87e.24 Input for Large Device Size	Apple Portugal
R5-210722	Discussion on omitting of Rx cases with UL-MIMO on TDD bands	Huawei, HiSilicon
R5-210733	Discussion on FR2 TT calculation in special scenarios	Huawei, HiSilicon, Vivo
R5-210734	Discussion on draft LS on on nominal channel spacing calculation	Huawei, HiSilicon
R5-210775	On Testability Aspects for FR2 Demodulation Testing	Keysight Technologies UK Ltd
R5-210822	Handover of Test Tolerance review process in RAN5	ANRITSU LTD
R5-210823	Summary of known issues for NR RRM Test cases in 38.533	ANRITSU LTD
R5-210838	On MU for FR2 Blocker Test using offset antenna	Anritsu
R5-210839	On declaration of FR2 antenna implementation and test method applicability	Anritsu
R5-210840	On Quality of Quiet Zone for DFF	Anritsu
R5-210841	On MU for FR2 Blocker Test	Anritsu
R5-210842	On MU of IFF DFF test method for FR2 RRM	Anritsu
R5-210843	On FR2 OBW MU	Anritsu
R5-210844	On MTSU for FR2 RRM test	Anritsu
R5-210845	On FR2 relative power measurement uncertainty	Anritsu
R5-210945	Discussion on the default TDD configuration for EN-DC RF test cases	Huawei, HiSilicon
R5-210948	Discussion on the uplink power configuration for EN-DC RF cases	Huawei, HiSilicon
R5-211015	Discussion on test coverage for reference sensitivity for EN-DC configs with exceptions	Huawei, HiSilicon
R5-211083	Input on fading crest factor margin for FR2 Demodulation test cases	Qualcomm Wireless GmbH
R5-211104	Correction of parameters of FR2 ACLR test cases	Anritsu
R5-211105	The degradation of TE noise floor for ON OFF time mask and how to avoid it	Anritsu
R5-211112	Discussion on inter-band CA configurations in RAN5 specs	ZTE Corporation
R5-211135	Discussion on test points for EN-DC refsens with exception avoiding	Ericsson
R5-211179	On Additional Spurious emissions	Keysight Technologies UK Ltd
R5-211184	On ETC MUs	Keysight Technologies UK Ltd, Rohde & Schwarz
R5-211186	On Larger Quiet Zone Sizes with Grey Box	Keysight Technologies UK Ltd
R5-211189	PC1 MUs based on the revised antenna array assumptions	Keysight Technologies UK Ltd
R5-211192	On n259 QoQZ and XPD MU	Keysight Technologies UK Ltd
R5-211193	On the MU Element “Uncertainty of an absolute gain of the calibration antenna” for n259	Keysight Technologies UK Ltd
R5-211194	On Declaration of Antenna Aperture for DFF based RRM systems	Keysight Technologies UK Ltd
R5-211206	FR1 Test Tolerance review training	Ericsson
R5-211207	FR2 Test Tolerance review training	Ericsson
R5-211227	Discussion on PCC prioritization for FR1 and FR2 UL CA testing	Qualcomm Finland RFFE Oy
R5-211232	Quality of the Quiet Zone measurement results for 20cm QZ	ROHDE & SCHWARZ
R5-211235	Discussion on the size of Quiet Zone above 30cm	ROHDE & SCHWARZ
R5-211247	Simplified Quality of the Quiet Zone procedure	ROHDE & SCHWARZ
R5-211259	On the achievable SNR for demod test cases	ROHDE & SCHWARZ
R5-211262	On the QoQZ standard deviation for ETC testing	ROHDE & SCHWARZ
R5-211263	On the MU for n259	ROHDE & SCHWARZ
R5-211266	On the MU of FR2 OBW	ROHDE & SCHWARZ
R5-211268	On FR2 ON/OFF Time Mask	ROHDE & SCHWARZ
R5-211275	Measurement uncertainties for PC1 devices	Keysight Technologies UK Ltd
R5-211276	FR2 Extreme testing conditions applicability	Keysight Technologies UK Ltd
R5-211653	On the DL AWGN MTSU for RRM	ROHDE & SCHWARZ
R5-211654	FR1 Test Tolerance review training	Ericsson
R5-211655	FR2 Test Tolerance review training	Ericsson
R5-211656	On the MU for n259	ROHDE & SCHWARZ
R5-211850	On minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1	Keysight Technologies UK Ltd
R5-211937	Discussion on equal PSD and PCC prioritization for UL CA test	Guangdong OPPO Mobile Telecom.
R5-211938	Discussion on the uplink power configuration for EN-DC RF cases	Huawei, HiSilicon
R5-211939	Discussion on test coverage for reference sensitivity for EN-DC configs with exceptions	Huawei, HiSilicon
R5-211940	Discussion on test points for EN-DC refsens with exception avoiding	Ericsson
R5-211941	Discussion on PCC prioritization for FR1 and FR2 UL CA testing	Qualcomm Finland RFFE Oy
R5-211943	On ACS and IBB FR2 MU definition	Keysight Technologies UK Ltd
R5-211944	On the QoQZ standard deviation for ETC testing	ROHDE & SCHWARZ
R5-211945	On MU for FR2 Blocker Test	Anritsu
R5-211946	On FR2 OBW MU	Anritsu
R5-211947	Input on fading crest factor margin for FR2 Demodulation test cases	Qualcomm Wireless GmbH
R5-211948	On Additional Spurious emissions	Keysight Technologies UK Ltd
R5-211949	On Larger Quiet Zone Sizes with Grey Box	Keysight Technologies UK Ltd
R5-211950	On the achievable SNR for demod test cases	ROHDE & SCHWARZ

5.3.3.2: TS 36.521-1

TDoc	Title	Source
R5-210073	Addition of new test case 9.6.1.1_A.6	DEKRA
R5-210074	Addition of new test case 9.6.1.2_A.6	DEKRA
R5-210262	Add support for new CA combos to Table 7.4A.8.4.1-1 and Table 7.4A.8.4.2-1	C Spire Wireless
R5-210403	Addition of the definition of CA capability with 6DL and 7DL CCs	LG Electronics
R5-210404	Introduction of FDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (7DL CA)	LG Electronics
R5-210405	Introduction of FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA (7DL CA)	LG Electronics
R5-210406	Introduction of FDD PDSCH Single Antenna Port Performance for CA (7DL CA)	LG Electronics
R5-210407	Update to Applicability and test rules for different CA configurations for 6DL CA test cases	LG Electronics
R5-210409	Update to TDD FDD 7DL CA PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 Performance test cases	LG Electronics
R5-210410	Update to TDD FDD 7DL CA PDSCH Open Loop Spatial Multiplexing 2x2 Performance test cases	LG Electronics
R5-210411	Update to TDD FDD 7DL CA Single Antenna Port Performance test cases	LG Electronics
R5-211749	Addition of new test case 9.6.1.1_A.6	DEKRA
R5-211750	Addition of new test case 9.6.1.2_A.6	DEKRA
R5-211751	Addition of the definition of CA capability with 6DL and 7DL CCs	LG Electronics

5.3.3.3: TS 36.521-2

TDoc	Title	Source
R5-210408	Update to applicability TDD FDD 7DL CA Peformance test cases	LG Electronics
R5-211752	Update to applicability TDD FDD 7DL CA Peformance test cases	LG Electronics

5.3.3.4: TS 36.521-3

TDoc	Title	Source
R5-210075	Addition of new test case 9.1.72	DEKRA
R5-210076	Addition of new test case 9.2.59	DEKRA
R5-211753	Addition of new test case 9.1.72	DEKRA
R5-211754	Addition of new test case 9.2.59	DEKRA

5.3.5.2: TS 36.521-1

TDoc	Title	Source
R5-210776	Correction to the physical configuration for sTTI RF test cases	Huawei, HiSilicon
R5-210777	Correction to the physical configuration for sTTI Demod test cases	Huawei, HiSilicon
R5-210778	Correction to the physical configuration for sTTI CQI reporting test cases	Huawei, HiSilicon
R5-210779	Addition of new test case 6.6.2.1_s SEM for sTTI	Huawei, HiSilicon
R5-210780	Addition of new test case 6.6.2.2_s A-SEM for sTTI	Huawei, HiSilicon
R5-210781	Addition of new test case 6.6.2.3_s ACLR for sTTI	Huawei, HiSilicon
R5-211755	Addition of new test case 6.6.2.1_s SEM for sTTI	Huawei, HiSilicon
R5-211756	Addition of new test case 6.6.2.3_s ACLR for sTTI	Huawei, HiSilicon
R5-211903	Addition of new test case 6.6.2.2_s A-SEM for sTTI	Huawei, HiSilicon

5.3.6.2: TS 36.521-2

TDoc	Title	Source
R5-210832	Introduction of MU and TT for CA Idle Mode Measurements	Nokia, Nokia Shanghai Bell
R5-210833	Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities	Nokia, Nokia Shanghai Bell
R5-211292	Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities	Nokia, Nokia Shanghai Bell
R5-211757	Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities	Nokia, Nokia Shanghai Bell

5.3.6.3: TS 36.521-3

TDoc	Title	Source
R5-210828	FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier	Nokia, Nokia Shanghai Bell
R5-210829	FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier	Nokia Corporation
R5-210830	FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier	Nokia, Nokia Shanghai Bell
R5-210831	FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements	Nokia, Nokia Shanghai Bell
R5-211291	Introduction of MU and TT for CA Idle Mode Measurements	Nokia, Nokia Shanghai Bell
R5-211293	FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier	Nokia, Nokia Shanghai Bell
R5-211294	FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier	Nokia, Nokia Shanghai Bell
R5-211295	FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements	Nokia, Nokia Shanghai Bell
R5-211758	Introduction of MU and TT for CA Idle Mode Measurements	Nokia, Nokia Shanghai Bell
R5-211759	FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier	Nokia, Nokia Shanghai Bell
R5-211760	FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier	Nokia, Nokia Shanghai Bell
R5-211761	FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements	Nokia, Nokia Shanghai Bell

5.3.7.1: TS 38.508-1

TDoc	Title	Source
R5-211115	Update of 4.3.1.1.3.40.1 for test frequency of NR intra-band contiguous CA_n40B	ZTE Corporation
R5-211117	Update of 4.3.1.1.3.66.1 for test frequency of NR intra-band contiguous CA_n66B	ZTE Corporation
R5-211119	Update of 4.3.1.1.3.78.2 for test frequency of NR intra-band contiguous CA_n78B	ZTE Corporation
R5-211121	Update of 4.3.1.3.2.1 for test frequencies for NR-DC configurations between FR1 and FR2	ZTE Corporation
R5-211122	Update of 4.3.1.4.1 for test frequencies for EN-DC band combinations within FR1	ZTE Corporation
R5-211123	Update of 4.3.1.5.1 for test frequencies for EN-DC band combinations including FR2	ZTE Corporation
R5-211124	Update of 4.3.1.6.1.3 for test frequencies for EN-DC band combinations including FR1 and FR2	ZTE Corporation
R5-211762	Update of 4.3.1.4.1 for test frequencies for EN-DC band combinations within FR1	ZTE Corporation
R5-211763	Update of 4.3.1.5.1 for test frequencies for EN-DC band combinations including FR2	ZTE Corporation

5.3.7.2: TS 38.508-2

TDoc	Title	Source
R5-210937	Introducing PICS for CA_n28A-n41A	Huawei, Hisilicon
R5-211248	Updating UE capability for Rel-16 NR inter-band CA configurations for band n1	DOCOMO Communications Lab.
R5-211602	Introducing PICS for CA_n28A-n41A	Huawei, Hisilicon
R5-211904	Updating UE capability for Rel-16 NR inter-band CA configurations for band n1	DOCOMO Communications Lab.

5.3.7.3.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210913	Updating Transmitter power for CA requiements for CA_n28A-n41A	Huawei, Hisilicon
R5-210914	Updating test case general spurious emission for CA_n28A-n41A	Huawei, Hisilicon
R5-210915	Updating Spurious emission for UE co-existence for CA_n28A-n41A	Huawei, Hisilicon
R5-211256	Updating 6.2A.1.1 for CA_n1A-n79A	DOCOMO Communications Lab.
R5-211274	Updating 6.5A.3.2 for CA_n1A-n79A	DOCOMO Communications Lab.

5.3.7.3.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-210169	Addition of TC 7.3A.0.3.2.4 RIB,c for four bands	CMCC
R5-210170	Update of TC 7.7A.3	CMCC
R5-210380	Update of 7.5A.3 Adjacent channel selectivity for 4DL CA	China Telecommunications
R5-210381	Update of 7.5A.3 Adjacent channel selectivity for 4DL CA	China Telecommunications
R5-210382	Update of 7.5A.3 Adjacent channel selectivity for 4DL CA	China Telecommunications
R5-210539	Introduction 4CA Reference Sensitivity test 7.3A.3	WE Certification Oy, DISH Network
R5-210540	Introduction 4CA Maximum Input Level test 7.4A.3	WE Certification Oy, DISH Network
R5-210541	Introduction 4CA In-Band Blocking test 7.6A.2.3	WE Certification Oy, DISH Network
R5-211008	Update of CA_n1A-n78C into 3DL CA Refsense TC 7.3A.2	China Unicom
R5-211026	Update of CA_n1A-n78C into 3DL CA maximum input level TC 7.4A.2	China Unicom
R5-211764	Update of 7.5A.3 Adjacent channel selectivity for 4DL CA	China Telecommunications

5.3.7.3.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-210803	Update of R16 CADC configurations into TS38.521-1 clause 5	China Unicom, Huawei, HiSilicon, NTT DOCOMO
R5-211252	Updating Rel-16 NR inter-band CA configuration for band n1	DOCOMO Communications Lab.
R5-211765	Update of R16 CADC configurations into TS38.521-1 clause 5	China Unicom, Huawei, HiSilicon, NTT DOCOMO

5.3.7.5.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210087	Introduction of Rel-16 EN-DC configuration DC_7A_n3A to spurious emission test case 6.5B.3.3.2	Nokia, Nokia Shanghai Bell, Ericsson
R5-210088	Introduction of Rel-16 EN-DC configuration DC_8A_n3A to spurious emission test case 6.5B.3.3.2	Nokia, Nokia Shanghai Bell, Ericsson
R5-210089	Introduction of Rel-16 EN-DC configuration DC_20A_n1A to spurious emission test case 6.5B.3.3.2	Nokia, Nokia Shanghai Bell, Ericsson
R5-210943	Adding delta TIB and delta RIB for DC_2-7-7-66_n78	Huawei, HiSilicon
R5-210986	Update for 6.5B.3.3.2 Spurious emission band UE co-existence_Rel16	Qualcomm Korea
R5-211021	Adding Delta TIB,c for DC_1A-28A_n3A, DC_7A-20A_n1A and DC_7A-28A_n3A to clause 6.2B.4.2.3.3	Ericsson
R5-211766	Introduction of Rel-16 EN-DC configuration DC_7A_n3A to spurious emission test case 6.5B.3.3.2	Nokia, Nokia Shanghai Bell, Ericsson
R5-211767	Introduction of Rel-16 EN-DC configuration DC_8A_n3A to spurious emission test case 6.5B.3.3.2	Nokia, Nokia Shanghai Bell, Ericsson
R5-211768	Introduction of Rel-16 EN-DC configuration DC_20A_n1A to spurious emission test case 6.5B.3.3.2	Nokia, Nokia Shanghai Bell, Ericsson
R5-211769	Update for 6.5B.3.3.2 Spurious emission band UE co-existence_Rel16	Qualcomm Korea, Ericsson
R5-211770	Adding Delta TIB,c for DC_1A-28A_n3A, DC_7A-20A_n1A and DC_7A-28A_n3A to clause 6.2B.4.2.3.3	Ericsson

5.3.7.5.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-210091	Introduction of DC_7A_n3A to reference sensitivity test	Nokia, Nokia Shanghai Bell
R5-210092	Introduction of DC_8A_n1A and DC_8A_n3A to reference sensitivity test	Nokia, Nokia Shanghai Bell
R5-210093	Introduction of DC_7A-20A_n3A to reference sensitivity test	Nokia, Nokia Shanghai Bell
R5-210516	Adding Inter-band EN-DC combination within FR1	KDDI Corporation
R5-211239	Introduction of DC_1A-28A_n3A to reference sensitivity test	Ericsson
R5-211240	Introduction of DC_7A-20A_n1A to reference sensitivity test	Ericsson
R5-211241	Introduction of DC_7A- 28A_n3A \nto referce sensitivity test	Ericsson
R5-211771	Introduction of DC_7A_n3A to reference sensitivity test	Nokia, Nokia Shanghai Bell
R5-211772	Introduction of DC_8A_n1A and DC_8A_n3A to reference sensitivity test	Nokia, Nokia Shanghai Bell
R5-211773	Adding Inter-band EN-DC combination within FR1	KDDI Corporation
R5-211905	Introduction of DC_1A-28A_n3A to reference sensitivity test	Ericsson

5.3.7.5.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-211005	Update to EN-DC R16 Configuration information in clause 5	Bureau Veritas, Ericsson
R5-211020	Adding EN-DC configurations DC_1A-28A_n3A and DC_7A-28A_n3A to clause 5.5B.4.2	Ericsson
R5-211125	Update of 5.3B for UE channel bandwidth for EN-DC	ZTE Corporation

5.3.7.10: TR 38.905 (NR Test Points Radio Transmission and Reception)

TDoc	Title	Source
R5-210084	Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A	Nokia, Nokia Shanghai Bell, Ericsson
R5-210085	Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A	Nokia, Nokia Shanghai Bell, Ericsson
R5-210086	Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A	Nokia, Nokia Shanghai Bell, Ericsson
R5-210916	Addition of TP analysis for CA_n28A-n41A in Tx Spurious Emision cases	Huawei, Hisilicon
R5-210962	Spur emission TP analysis R16 DC_2A_n41A	Qualcomm Korea, Ericsson
R5-210963	Spur emission TP analysis R16 DC_5A_n2A	Qualcomm Korea
R5-210980	Spur emission TP analysis R16 DC_13A_n2A	Qualcomm Korea
R5-210981	Spur emission TP analysis R16 DC_48A_n5A	Qualcomm Korea
R5-210982	Spur emission TP analysis R16 DC_48A_n66A	Qualcomm Korea
R5-210985	Spur emission TP analysis R16 DC_66A_n41A	Qualcomm Korea, Ericsson
R5-211242	Reference sensitivity TP analysis for DC_1A-28A_n3A	Ericsson
R5-211243	Reference sensitivity analysis for DC_3A-7A_n1A	Ericsson
R5-211244	Reference sensitivity TP analysis for DC_7A-20A_n1A	Ericsson
R5-211245	Reference sensitivity TP analysis for DC_7A-28A_n3A	Ericsson
R5-211774	Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A	Nokia, Nokia Shanghai Bell, Ericsson
R5-211775	Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A	Nokia, Nokia Shanghai Bell, Ericsson
R5-211776	Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A	Nokia, Nokia Shanghai Bell, Ericsson
R5-211777	Spur emission TP analysis R16 DC_2A_n41A	Qualcomm Korea, Ericsson
R5-211778	Spur emission TP analysis R16 DC_13A_n2A	Qualcomm Korea
R5-211779	Spur emission TP analysis R16 DC_48A_n5A	Qualcomm Korea, Ericsson
R5-211780	Spur emission TP analysis R16 DC_48A_n66A	Qualcomm Korea
R5-211781	Spur emission TP analysis R16 DC_66A_n41A	Qualcomm Korea, Ericsson
R5-211906	Reference sensitivity TP analysis for DC_1A-28A_n3A	Ericsson
R5-211907	Reference sensitivity analysis for DC_3A-7A_n1A	Ericsson
R5-211908	Reference sensitivity TP analysis for DC_7A-20A_n1A	Ericsson
R5-211909	Reference sensitivity TP analysis for DC_7A-28A_n3A	Ericsson

5.3.7.11: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210083	Conclusion of some Rel-16 inter-band EN-DC configurations	Nokia, Nokia Shanghai Bell
R5-211249	Discussion paper to align DL CA Rx test cases	Dish Network

5.3.9.1: TR 37.901-5

TDoc	Title	Source
R5-210593	Updates to 37.901-5 Annex A for Downlink Throughput tests with Fading and FRC scenario	QUALCOMM communications-France
R5-210594	Updates to connection diagram for Application Layer Data Throughput	QUALCOMM communications-France
R5-210595	Updates to Impact of Modem Performance in Application Layer Throughput	QUALCOMM communications-France
R5-210596	Updates to Test System Uncertainty and Test Tolerance for Application Layer Data Throughput	QUALCOMM communications-France
R5-210597	Updates to Conclusion for Application Layer Data Throughput	QUALCOMM communications-France
R5-211782	Updates to Impact of Modem Performance in Application Layer Throughput	QUALCOMM communications-France

5.3.10.1: TS 36.521-1

TDoc	Title	Source
R5-210874	Update of 6.2.3A.1_3 Maximum Power Reduction for CA and HPUE	Huawei, HiSilicon
R5-210875	Update of 6.6.2.3_1 ACLR for HPUE	Huawei, HiSilicon
R5-211783	Update of 6.2.3A.1_3 Maximum Power Reduction for CA and HPUE	Huawei, HiSilicon

5.3.11.1: TS 38.508-1

TDoc	Title	Source
R5-211120	Update of 4.3.1.0A for mid test channel bandwidth	ZTE Corporation, Ericsson
R5-211233	Correction of test frequencies for NR band n48	Ericsson
R5-211604	Introduction of test frequencies for CBW 70 MHz for n77	Ericsson, China Unicom
R5-211605	Introduction of test frequencies for CBW 70 MHz for n78	Ericsson, China Unicom
R5-211784	Update of 4.3.1.0A for mid test channel bandwidth	ZTE Corporation, Ericsson
R5-211785	Correction of test frequencies for NR band n48	Ericsson

5.3.11.2: TS 38.508-2

TDoc	Title	Source
R5-210081	Introduction of Additional capabilities for NR Band n53	Nokia, Nokia Shanghai Bell
R5-211229	Add n26 to 2Rx capabilities declaration	Dish Network

5.3.11.3.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210739	Correction of test points for NS_48	Huawei, HiSilicon
R5-210741	Addition of A-MPR test for NS_49	Huawei, HiSilicon
R5-210912	Correction to test case 6.2.3 AMPR for NS_24	Huawei, Hisilicon
R5-210997	Update for 6.5.3.2 Spurious emission for UE co-existence_R16	Qualcomm Korea, Keysight
R5-211040	Addition of 70M into 38.521-1 TC6.3A.1	China Unicom
R5-211041	Addition of 70M into 38.521-1 TC6.3D	China Unicom
R5-211181	PC1 and PC3 Updates for Band n14	AT&T
R5-211657	PC1 and PC3 Updates for Band n14	AT&T
R5-211786	Correction of test points for NS_48	Huawei, HiSilicon
R5-211787	Addition of A-MPR test for NS_49	Huawei, HiSilicon
R5-211788	Update for 6.5.3.2 Spurious emission for UE co-existence_R16	Qualcomm Korea, Keysight

5.3.11.3.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-210602	Addition of R16 new channel bandwidths for n3 in 38.521-1	China Telecommunications
R5-211789	Addition of R16 new channel bandwidths for n3 in 38.521-1	China Telecommunications

5.3.11.9: TR 38.905 (NR Test Points Radio Transmission and Reception)

TDoc	Title	Source
R5-210740	Updating TP analysis of FR1 A-MPR for NS_48	Huawei, HiSilicon
R5-210742	Adding TP analysis of FR1 A-MPR for NS_49	Huawei, HiSilicon
R5-210743	Resubmitting TP analysis of FR1 A-MPR for NS_44	Huawei, HiSilicon
R5-211230	NS_12, NS_13, NS_14, NS_15 TP analysis to 38.905	Dish Network

5.3.11.10: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210286	Discussion about n259 OBW relaxation	DOCOMO Communications Lab.
R5-211951	Discussion about n259 OBW relaxation	DOCOMO Communications Lab.

5.3.12.3: TS 36.521-2

TDoc	Title	Source
R5-210889	Addition of applicability for NB-IoT RRM TDD Test Cases	Sporton

5.3.12.4: TS 36.521-3

TDoc	Title	Source
R5-210883	Addition of 6.2.21 TDD Contention Based Random Access on Non-anchor Carrier Test for UE category NB1 UEs In-band mode in Enhanced Coverage	Sporton
R5-210884	Addition of 7.1.27 E-UTRAN TDD UE Transmit Timing Accuracy Tests for Category NB1 UE In-Band mode under normal coverage	Sporton
R5-210885	Addition of 7.1.28 E-UTRAN TDD - UE Transmit Timing Accuracy Tests for Category NB1 UE In-band mode under enhanced coverage	Sporton
R5-210886	Addition of 7.2.15 E-UTRAN TDD TDD UE Timing Advance Adjustment Accuracy Test for UE Category NB1 in Standalone Mode under Enhanced Coverage	Sporton
R5-210887	Addition of 7.3.88 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in normal coverage	Sporton
R5-210888	Addition of 7.3.89 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in enhanced coverage	Sporton
R5-210890	Addition of Cell configuration mapping for NB-IoT RRM TDD Test Cases in Annex E	Sporton
R5-210892	Update of MU for addition of new NB-IoT TDD Test Cases	Sporton
R5-211790	Addition of 6.2.21 TDD Contention Based Random Access on Non-anchor Carrier Test for UE category NB1 UEs In-band mode in Enhanced Coverage	Sporton
R5-211791	Addition of 7.1.27 E-UTRAN TDD UE Transmit Timing Accuracy Tests for Category NB1 UE In-Band mode under normal coverage	Sporton
R5-211792	Addition of 7.1.28 E-UTRAN TDD - UE Transmit Timing Accuracy Tests for Category NB1 UE In-band mode under enhanced coverage	Sporton
R5-211793	Addition of 7.2.15 E-UTRAN TDD TDD UE Timing Advance Adjustment Accuracy Test for UE Category NB1 in Standalone Mode under Enhanced Coverage	Sporton
R5-211794	Addition of 7.3.88 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in normal coverage	Sporton
R5-211795	Addition of 7.3.89 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in enhanced coverage	Sporton

5.3.12.5: TS 37.571-1

TDoc	Title	Source
R5-210751	Addition of TDD NB-IOT RSTD measurement test case 9.7.1	Huawei, HiSilicon
R5-210752	Addition of TDD NB-IOT RSTD measurement test case 9.7.2	Huawei, HiSilicon
R5-210753	Addition of TDD NB-IOT RSTD measurement test case 9.7.3	Huawei, HiSilicon
R5-210754	Addition of TDD NB-IOT RSTD measurement test case 9.8.1	Huawei, HiSilicon
R5-210755	Addition of TDD NB-IOT RSTD measurement test case 9.8.2	Huawei, HiSilicon
R5-210756	Addition of TDD NB-IOT RSTD measurement test case 9.8.3	Huawei, HiSilicon
R5-210757	Update to Annex C for TDD NB-IOT RSTD measurement test cases	Huawei, HiSilicon
R5-211796	Addition of TDD NB-IOT RSTD measurement test case 9.7.1	Huawei, HiSilicon
R5-211797	Addition of TDD NB-IOT RSTD measurement test case 9.7.2	Huawei, HiSilicon
R5-211798	Addition of TDD NB-IOT RSTD measurement test case 9.7.3	Huawei, HiSilicon
R5-211799	Addition of TDD NB-IOT RSTD measurement test case 9.8.1	Huawei, HiSilicon
R5-211800	Addition of TDD NB-IOT RSTD measurement test case 9.8.2	Huawei, HiSilicon
R5-211801	Addition of TDD NB-IOT RSTD measurement test case 9.8.3	Huawei, HiSilicon

5.3.12.6: TS 37.571-3

TDoc	Title	Source
R5-210758	Addition of applicability for TDD NB-IOT RSTD measurement test cases	Huawei, HiSilicon
R5-211802	Addition of applicability for TDD NB-IOT RSTD measurement test cases	Huawei, HiSilicon

5.3.13.2: TS 36.521-1

TDoc	Title	Source
R5-210549	Adding subPRB allocation to test case 6.2.3EC, Maximum Power Reduction (MPR) for UE category M2	Ericsson
R5-210550	Core spec alignment, adding missing note in test case 8.11.1.2.3.1	Ericsson
R5-210552	Adding subPRB allocation to 6.5.2.1EA.2, PUSCH-EVM with exclusion period for UE category M1	Ericsson
R5-210553	Adding subPRB allocation to 6.5.2.2EA and 6.5.2.2EC	Ericsson
R5-210558	Adding subPRB allocation to 6.6.2.1EC, Spectrum Emission Mask for UE category M2	Ericsson
R5-210559	Adding subPRB allocation to 6.6.2.3EC, Adjacent Channel Leakage power Ratio for UE category M2	Ericsson
R5-210560	Adding subPRB allocation to 6.6.3EA.1, Transmitter Spurious emissions for UE category M1	Ericsson

5.3.13.3: TS 36.521-2

TDoc	Title	Source
R5-211177	Correction of Table 4.1-1	Google Inc.
R5-211803	Correction of Table 4.1-1	Google Inc.

5.3.14.2: TS 38.508-2

TDoc	Title	Source
R5-210744	Adding PICS for UL switching	Huawei, HiSilicon
R5-210926	Introduction of PICS for intra-band non-contiguous CA configurations	Huawei, Hisilicon
R5-211910	Adding PICS for UL switching	Huawei, HiSilicon

5.3.14.3.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210384	Add TT to power control for UL CA	Guangdong OPPO Mobile Telecom.
R5-210918	Updating MOP and MPR for MIMO testing for several NR bands	Huawei, Hisilicon
R5-210919	Updating 6.5A.3.1.0 for intra-band CA	Huawei, Hisilicon
R5-210920	Updating test requirement of CA test cases for CA configurations including n90	Huawei, Hisilicon
R5-210923	Adding NR test case-Time mask for Uplink carriers switching	Huawei, Hisilicon
R5-210936	Updating Editors Note in 6.2A.2 and 6.2A.4 for intra-band UL CA	Huawei, Hisilicon
R5-211037	Addition of minimum requirement for intra-band UL CA in the test case 6.4A.2	KTL
R5-211804	Updating Editors Note in 6.2A.2 and 6.2A.4 for intra-band UL CA	Huawei, Hisilicon
R5-211911	Adding NR test case-Time mask for Uplink carriers switching	Huawei, Hisilicon

5.3.14.3.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-210921	Updating test case 7.3A.2 for CA_n79D	Huawei, Hisilicon
R5-210922	Updating test case 7.6A.4 for band n48	Huawei, Hisilicon

5.3.14.3.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-210385	Update MU/TT on power control for UL CA	Guangdong OPPO Mobile Telecom.
R5-210917	Updating general requirements for intra-band non-contiguous CA	Huawei, Hisilicon
R5-210925	Adding MU and TT for Uplink carriers switching testing	Huawei, Hisilicon
R5-211805	Updating general requirements for intra-band non-contiguous CA	Huawei, Hisilicon
R5-211912	Adding MU and TT for Uplink carriers switching testing	Huawei, Hisilicon

5.3.14.5: TS 38.522

TDoc	Title	Source
R5-210745	Adding test applicability for switching test case	Huawei, HiSilicon
R5-211913	Adding test applicability for switching test case	Huawei, HiSilicon

5.3.14.8: TR 38.905 (NR Test Points Radio Transmission and Reception)

TDoc	Title	Source
R5-210383	Correct a tpyo of 6.3A.4.2	Guangdong OPPO Mobile Telecom.
R5-210924	Adding TP analysis for NR test case-Time mask for UL carrier switching	Huawei, Hisilicon
R5-211914	Adding TP analysis for NR test case-Time mask for UL carrier switching	Huawei, Hisilicon

5.3.17.4.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210419	Addition of new test case 6.4E.2.2.1 Error Vector Magnitude for V2X for non-concurrent operation	LG Electronics
R5-210422	Addition of 6.5E.2.2.1	Guangdong OPPO Mobile Telecom.
R5-210423	Addition of 6.5E.2.2.1D	Guangdong OPPO Mobile Telecom.
R5-210424	Addition of 6.5E.2.3.1	Guangdong OPPO Mobile Telecom.
R5-210425	Addition of 6.5E.2.3.1D	Guangdong OPPO Mobile Telecom.
R5-210426	Addition of 6.5E.2.4.1	Guangdong OPPO Mobile Telecom.
R5-210427	Addition of 6.5E.2.4.1D	Guangdong OPPO Mobile Telecom.
R5-210428	Addition of 6.5E.3.2.1	Guangdong OPPO Mobile Telecom.
R5-210429	Addition of 6.5E.3.2.1D	Guangdong OPPO Mobile Telecom.
R5-211806	Addition of 6.5E.2.2.1	Guangdong OPPO Mobile Telecom.

5.3.17.7: TS 38.522

TDoc	Title	Source
R5-211610	Applicability of Error Vector Magnitude for V2X for non-concurrent operation	LG Electronics

5.3.18.3.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210782	Update of A-MPR minimum requirements for Rel-16 DMRS	Huawei, HiSilicon
R5-210784	Adding test point for Rel-16 DMRS in EVM equalizer spectrum flatness test case	Huawei, HiSilicon
R5-210786	Adding additional TP for half Pi BPSK DMRS to MPR test case for SUL	Huawei, HiSilicon
R5-210787	Adding additional TP for half Pi BPSK DMRS to SEM test case for SUL	Huawei, HiSilicon
R5-210788	Adding additional TP for half Pi BPSK DMRS to NR ACLR test case for SUL	Huawei, HiSilicon
R5-210790	Addition of new test case 6.4C.2.5 EVM equalizer spectrum flatness for half Pi BPSK DMRS for SUL	Huawei, HiSilicon
R5-210996	Addition of test case 6.5D.2_1.4.2, UTRA ACLR for UL MIMO (Rel-16 onward)	Ericsson
R5-211133	Addition of ULFPTx in MPR test case	Ericsson
R5-211807	Adding test point for Rel-16 DMRS in EVM equalizer spectrum flatness test case	Huawei, HiSilicon
R5-211808	Addition of new test case 6.4C.2.5 EVM equalizer spectrum flatness for half Pi BPSK DMRS for SUL	Huawei, HiSilicon
R5-211915	Adding additional TP for half Pi BPSK DMRS to MPR test case for SUL	Huawei, HiSilicon

5.3.18.7: TS 38.522

TDoc	Title	Source
R5-210792	Adding the test applicability of RF test cases for eMIMO	Huawei, HiSilicon

5.3.18.10: TR 38.905 (NR Test Points Radio Transmission and Reception)

TDoc	Title	Source
R5-210783	Adding TP analysis for Rel-16 DMRS in A-MPR test case	Huawei, HiSilicon
R5-210785	Update of TP analysis for EVM equalizer spectrum flatness for half Pi BPSK	Huawei, HiSilicon
R5-210789	Update of TP analysis for FR1 SUL test cases	Huawei, HiSilicon
R5-210791	Adding TP selection for 6.4C.2 Transmit modulation quality for SUL	Huawei, HiSilicon
R5-210999	TP analysis for test case 6.5D.1_1, Occupied bandwidth for UL MIMO (Rel-16 onward)	Ericsson
R5-211018	TP analysis for test case 6.5D.2_1.4.2, UTRA ACLR for UL MIMO (Rel-16 onward)	Ericsson
R5-211134	TP analysis for ULFPTx in MPR test case	Ericsson
R5-211809	Adding TP analysis for Rel-16 DMRS in A-MPR test case	Huawei, HiSilicon
R5-211810	Update of TP analysis for EVM equalizer spectrum flatness for half Pi BPSK	Huawei, HiSilicon
R5-211811	Update of TP analysis for FR1 SUL test cases	Huawei, HiSilicon

5.3.21.3: TS 37.571-5

TDoc	Title	Source
R5-210054	Addition of support for BDS B1C signal	Spirent Communications, CATT, CAICT
R5-211812	Addition of support for BDS B1C signal	Spirent Communications, CATT, CAICT

5.3.24.3.1: Conducted Demod Performance and CSI Reporting Requirements (Clauses 5&6)

TDoc	Title	Source
R5-211050	Updating applicability in test case 5.2.2.2.4_1	Ericsson
R5-211075	Adding new test case 6.3.2.2.3, 2Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA	Ericsson
R5-211078	Adding new test case 6.3.2.2.4, 2Rx TDD FR1 Single PMI with 32Tx Type1 - SinglePanel codebook for both SA and NSA	Ericsson
R5-211079	Adding new test case 6.3.3.2.3, 4Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA	Ericsson
R5-211160	Addition of new test case 6.3.2.1.3 2Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA	China Telecom
R5-211161	Addition of new test case 6.3.3.1.3 4Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA	China Telecom
R5-211658	Addition of new test case 6.3.2.1.3 2Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA	China Telecom
R5-211659	Addition of new test case 6.3.3.1.3 4Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA	China Telecom
R5-211813	Adding new test case 6.3.2.2.3, 2Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA	Ericsson
R5-211814	Adding new test case 6.3.3.2.3, 4Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA	Ericsson
R5-211916	Adding new test case 6.3.2.2.4, 2Rx TDD FR1 Single PMI with 32Tx Type1 - SinglePanel codebook for both SA and NSA	Ericsson

5.3.24.3.4: Clauses 1-4 / Annexes

TDoc	Title	Source
R5-211086	Adding new CSI test cases to annex F	Ericsson

5.3.24.4: TS 38.522

TDoc	Title	Source
R5-211158	Addition of applicability new test case 6.3.2.1.3 in TS 38.521-4	China Telecom
R5-211159	Addition of applicability new test case 6.3.3.1.3 in TS 38.521-4	China Telecom

5.3.24.7: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-211082	Test case structure updates for CA PDSCH Demodulation test cases	Qualcomm Wireless GmbH
R5-211942	Test case structure updates for CA PDSCH Demodulation test cases	Qualcomm Wireless GmbH

5.3.25.2: TS 38.508-2

TDoc	Title	Source
R5-210285	Addition of common ICS in A.4.3.11 for Rel-16 HST	CMCC
R5-211815	Addition of common ICS in A.4.3.11 for Rel-16 HST	CMCC

5.3.25.3: TS 38.521-4

TDoc	Title	Source
R5-210418	Update of minimum conformance requirements for 4Rx FDD FR1 PDSCH in TC 5.2.3.1.1_1	LG Electronics
R5-211816	Update of minimum conformance requirements for 4Rx FDD FR1 PDSCH in TC 5.2.3.1.1_1	LG Electronics

5.3.25.3.1: Conducted Demod Performance and CSI Reporting Requirements (Clause 5)

TDoc	Title	Source
R5-210109	Addition of Applicability of different requirements for R16 NR HST in 5.1.1.7	CMCC
R5-210112	Update of Applicability of requirements for mandatory UE features with capability signalling for R16 NR HST in 5.1.1.4	CMCC
R5-210113	Update of Applicability of requirements for optional UE features for R16 NR HST in 5.1.1.3	CMCC
R5-211817	Addition of Applicability of different requirements for R16 NR HST in 5.1.1.7	CMCC
R5-211818	Update of Applicability of requirements for mandatory UE features with capability signalling for R16 NR HST in 5.1.1.4	CMCC
R5-211819	Update of Applicability of requirements for optional UE features for R16 NR HST in 5.1.1.3	CMCC

5.3.25.3.2: Clauses 1-4 / Annexes

TDoc	Title	Source
R5-210108	Addition of Abbreviations and References for R16 NR HST in 3.3 and References	CMCC
R5-210110	Addition of HST-DPS Channel Profile in B.3.3	CMCC
R5-210111	Addition of HST-SFN Channel Profile in B.3.2	CMCC
R5-210114	Update of Combinations of channel model parameters for R16 NR HST in B.2.2	CMCC
R5-210115	Update of Reference measurement channels for PDSCH performance requirements for R16 NR HST in A.3.2	CMCC
R5-210116	Update of Single Tap Channel Profile for R16 NR HST in B.3.1	CMCC
R5-211820	Addition of Abbreviations and References for R16 NR HST in 3.3 and References	CMCC
R5-211821	Addition of HST-DPS Channel Profile in B.3.3	CMCC
R5-211822	Addition of HST-SFN Channel Profile in B.3.2	CMCC
R5-211823	Update of Combinations of channel model parameters for R16 NR HST in B.2.2	CMCC
R5-211824	Update of Reference measurement channels for PDSCH performance requirements for R16 NR HST in A.3.2	CMCC
R5-211825	Update of Single Tap Channel Profile for R16 NR HST in B.3.1	CMCC

5.3.25.4: TS 38.522

TDoc	Title	Source
R5-211218	Addition of new RRM test cases to the applicability table in 4.2	Ericsson
R5-211611	Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7	CMCC
R5-211917	Addition of new RRM test cases to the applicability table in 4.2	Ericsson
R5-211918	Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7	CMCC

5.3.25.5: TS 38.533

TDoc	Title	Source
R5-210279	Addition of minimum conformance requirements for R16 NR HST cell re-selection in 6.1.1.0	CMCC
R5-210280	Addition of new test case 6.1.1.7 for R16 NR HST	CMCC
R5-210281	Addition of minimum conformance requirements for R16 NR HST measurement in 6.6.1.0	CMCC
R5-210282	Addition of new test case 6.6.1.7 for R16 NR HST	CMCC
R5-210283	Update of Annex H.2.1-3 for R16 NR HST	CMCC
R5-210284	Addition of cell configuration mapping in Annex E for R16 NR HST	CMCC
R5-211219	Correction of the minimum conformance requirements for Inter-RAT measurements 6.6.3.0	Ericsson
R5-211220	Addition of new RRM iRAT measurement Inter-RAT measurements test case 6.6.3.3	Ericsson
R5-211221	Correction of the minimum conformance requirements for E-UTRA - NR FR1 Cell reselection 8.2.1.0	Ericsson
R5-211222	Addition of new RRM E-UTRA - NR FR1 Cell reselection test case 8.2.1.2	Ericsson
R5-211223	Correction of the minimum conformance requirements for E-UTRA - NR Inter-RAT event triggered reporting tests 8.4.2.0	Ericsson
R5-211224	Addition of new RRM E-UTRA - NR Inter-RAT event triggered reporting test case 8.4.2.9	Ericsson
R5-211827	Addition of new test case 6.1.1.7 for R16 NR HST	CMCC
R5-211828	Addition of new test case 6.6.1.7 for R16 NR HST	CMCC
R5-211829	Addition of cell configuration mapping in Annex E for R16 NR HST	CMCC
R5-211830	Correction of the minimum conformance requirements for E-UTRA - NR FR1 Cell reselection 8.2.1.0	Ericsson
R5-211831	Addition of new RRM E-UTRA - NR FR1 Cell reselection test case 8.2.1.2	Ericsson
R5-211832	Correction of the minimum conformance requirements for E-UTRA - NR Inter-RAT event triggered reporting tests 8.4.2.0	Ericsson
R5-211833	Addition of new RRM E-UTRA - NR Inter-RAT event triggered reporting test case 8.4.2.9	Ericsson

5.3.26.3.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-210082	Introduction of FR2 DL 256QAM	Nokia, Nokia Shanghai Bell
R5-211919	Introduction of FR2 DL 256QAM	Nokia, Nokia Shanghai Bell

5.3.27.2: TS 36.521-1

TDoc	Title	Source
R5-211236	Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 5	Ericsson
R5-211237	Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 6	Ericsson
R5-211238	Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 7.3	Ericsson
R5-211834	Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 5	Ericsson
R5-211835	Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 6	Ericsson

5.3.28.2: TS 36.521-1

TDoc	Title	Source
R5-210562	Adding band 7,42, 43 to Rx test cases for cat M2	Ericsson

5.3.30.1: TS 38.508-1

TDoc	Title	Source
R5-210927	Updating Rel-17 mid and highest channel bandwitch for n83 and n84	Huawei, Hisilicon
R5-210928	Adding Rel-17 CBW 30MHz test frequencies for n83	Huawei, Hisilicon
R5-210929	Updating test frequencies for Rel-17 new CBWs for band n84	Huawei, Hisilicon
R5-211076	Introduction of test frequencies for n41 adding CBW 70 MHz	Ericsson
R5-211077	Introduction of test frequencies for n48 adding CBW 70 MHz - DL only	Ericsson
R5-211836	Introduction of test frequencies for n48 adding CBW 70 MHz - DL only	Ericsson

5.3.30.3.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210930	Updating MPR testing for SUL band n83	Huawei, Hisilicon
R5-210931	Updating AMPR testing for SUL band n83 and n84	Huawei, Hisilicon
R5-210932	Updating Additional spurious emisisons testing for SUL band n83 and n84	Huawei, Hisilicon
R5-211837	Updating MPR testing for SUL band n83	Huawei, Hisilicon
R5-211838	Updating AMPR testing for SUL band n83 and n84	Huawei, Hisilicon

5.3.30.3.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-211174	Addition of R17 new CBWs into 38.521-1 clause 5	China Unicom, Huawei, HiSilicon

5.3.31.1: TS 38.508-1

TDoc	Title	Source
R5-211178	Updating test frequencies for Rel-17 inter-band EN-DC configurations for band n1	DOCOMO Communications Lab.

5.3.31.2: TS 38.508-2

TDoc	Title	Source
R5-210938	Adding PICS for SUL with DL CA configurations	Huawei, Hisilicon
R5-211196	Updating UE capability for Rel-17 NR CA configuration	DOCOMO Communications Lab.
R5-211226	Updating UE capability for Rel-17 NR inter-band EN-DC configurations for band n1	DOCOMO Communications Lab.
R5-211839	Adding PICS for SUL with DL CA configurations	Huawei, Hisilicon

5.3.31.3.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-210933	Updating clause 6.2C.2 for Rel-17 SUL combinations	Huawei, Hisilicon

5.3.31.3.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-210934	Updating REFSENS for SUL for new R17 configurations	Huawei, Hisilicon

5.3.31.3.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-210804	Update of R17 CADC configurations into TS38.521-1 clause 5	China Unicom, Huawei, HiSilicon

5.3.31.5.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-211270	Updating 6.2B.1.3 for Rel-17 NR inter-band EN-DC configurations for band n1	DOCOMO Communications Lab.

5.3.31.5.3: Clauses 1-5 / Annexes

TDoc	Title	Source
R5-211006	Update to EN-DC R17 Configuration information in clause 5	Bureau Veritas
R5-211253	Updating Rel-17 NR inter-band EN-DC configurations for band n1	DOCOMO Communications Lab.

5.3.31.11: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210935	Discussion about REFSENS for SUL testing for 3CC	Huawei, Hisilicon

5.4.1: TS 38.521-3

TDoc	Title	Source
R5-210304	Updates on configured Output Power Level for EN-DC test cases 6.2B.4.1.1.x	Keysight Technologies UK Ltd
R5-210746	Updating Rel-16 EN-DC PC2 MOP to include powerClassNRPart-r16	Huawei, HiSilicon
R5-210747	Updating Rel-16 EN-DC PC2 MPR to include powerClassNRPart-r16	Huawei, HiSilicon
R5-210748	Updating Rel-16 EN-DC PC2 A-MPR to include powerClassNRPart-r16	Huawei, HiSilicon
R5-210749	Updating Rel-16 EN-DC PC2 configured output power to include powerClassNRPart-r16	Huawei, HiSilicon
R5-210750	TEI16 Status update of introduction of PowerClassNRPart capability	Huawei, HiSilicon
R5-211840	Updating Rel-16 EN-DC PC2 MOP to include powerClassNRPart-r16	Huawei, HiSilicon
R5-211841	Updating Rel-16 EN-DC PC2 MPR to include powerClassNRPart-r16	Huawei, HiSilicon
R5-211842	Updating Rel-16 EN-DC PC2 A-MPR to include powerClassNRPart-r16	Huawei, HiSilicon
R5-211843	Updating Rel-16 EN-DC PC2 configured output power to include powerClassNRPart-r16	Huawei, HiSilicon

5.5.1.1: TS 36.508

TDoc	Title	Source
R5-211127	Minor corrections of 4.1 for test environment conditions	ZTE Corporation

5.5.1.2.1: Tx Requirements (Clause 6)

TDoc	Title	Source
R5-211088	Correction to A-MPR test requirement of NS_22 in TC 6.2.4	Anritsu
R5-211257	Update for Band 48 in test case 6.2.2	ROHDE & SCHWARZ
R5-211920	Correction to A-MPR test requirement of NS_22 in TC 6.2.4	Anritsu

5.5.1.2.2: Rx Requirements (Clause 7)

TDoc	Title	Source
R5-211258	Editorial Correction in test case 7.3A9	ROHDE & SCHWARZ

5.5.1.3: TS 36.521-2

TDoc	Title	Source
R5-210481	Correction of applicability definition for 2Rx related test cases to exclude category 1bis UEs equipped with single Rx antenna	CAICT, Spreadtrum Communications
R5-210482	Addition of the Additional Information for some RF test cases in 9.6.1	CAICT
R5-210598	Correction to Additional Information of 8.2.1.3.1_A and 8.7.1.1_A in Table 4.1-1	TTA
R5-210894	Correct of test applicability for TC with and without UL CA	Sporton
R5-210990	Addition of Note 7 in the Additional Information column of RF conformance test cases with 2Rx and 4Rx Branch in secton 8 and section 9	CAICT
R5-211180	Correction of Table A.4.3-3d	Google Inc.
R5-211844	Correction of applicability definition for 2Rx related test cases to exclude category 1bis UEs equipped with single Rx antenna	CAICT, Spreadtrum Communications
R5-211845	Correct of test applicability for TC with and without UL CA	Sporton
R5-211846	Correction of Table A.4.3-3d	Google Inc.

5.5.1.4: TS 36.521-3

TDoc	Title	Source
R5-210891	Correction of Table number for RRM Radio Link Monitoring Test Cases	Sporton
R5-211847	Correction of Table number for RRM Radio Link Monitoring Test Cases	Sporton

5.6.11: TS 37.571-5

TDoc	Title	Source
R5-210052	Corrections for support of multiple signals in a GNSS	Spirent Communications
R5-211848	Corrections for support of multiple signals in a GNSS	Spirent Communications

5.6.15: TS 37.544

TDoc	Title	Source
R5-210377	Correction of TRS numeric symbol	Intertek

5.7: Outgoing liaison statements for provisional approval

TDoc	Title	Source
R5-210313	LS on minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1	TSG WG RAN5
R5-211600	Reply LS on nominal channel spacing calculation for two carriers at band n41 with 40MHz and 80MHz channel bandwidths	TSG WG RAN5
R5-211609	Clarification on exception requirements for Intermodulation due to Dual uplink (IMD)	TSG WG RAN5
R5-211826	LS on minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1	TSG WG RAN5

6.3.2.1.1: Generic Procedures and Test Procedures (Clauses 4.5 / 4.5A & 4.9)

TDoc	Title	Source
R5-210055	Corrections to generic test procedures for IMS	ROHDE & SCHWARZ, Ericsson, MCC TF160
R5-210058	Update Generic Test Procedure for IMS MO speech call	Ericsson
R5-210069	Correction to Table 4.5.2.2-4: NR RRC_IDLE Extension	Keysight Technologies UK
R5-210070	Correction to generic procedure for UE-requested PDU session modification after S1 to N1 change	Keysight Technologies UK
R5-210194	Correction to test procedure 4.9.7	MCC TF160
R5-210195	Corrections to test procedure 4.9.19	MCC TF160
R5-210402	Correction to RRC IDLE procedures	Keysight Technologies UK, Qualcomm
R5-210573	Correction to Tracking area updating / Inter-system change from S1 mode to N1 mode in 5GMM/EMM-IDLE	MediaTek Inc.
R5-211038	Addition of procedure for clearing Ues Last Registered PLMN	Qualcomm Incorporated
R5-211272	Correction to clause 4.5.2 RRC_IDLE	Qualcomm CDMA Technologies
R5-211369	Corrections to generic test procedures for IMS	ROHDE & SCHWARZ, Ericsson, MCC TF160
R5-211370	Correction to generic procedure for UE-requested PDU session modification after S1 to N1 change	Keysight Technologies UK
R5-211371	Correction to test procedure 4.9.7	MCC TF160
R5-211372	Correction to RRC IDLE procedures	Keysight Technologies UK, Qualcomm
R5-211373	Addition of procedure for clearing Ues Last Registered PLMN	Qualcomm Incorporated

6.3.2.1.2: Default NG-RAN RRC messages and IEs (Clause 4.6)

TDoc	Title	Source
R5-210187	Editorial update IE PhysicalCellGroupConfig	Ericsson
R5-210264	Update IE FailureInformation	Ericsson
R5-210325	Editorial update IE DLDedicatedMessageSegment	Ericsson
R5-210326	Editorial update DLDedicatedMessageSegment message	Ericsson
R5-210328	Editorial update RRCReconfiguration message	Ericsson
R5-210611	Update IE PDCCH-ConfigCommon	Ericsson, MCC TF160, Anritsu
R5-210623	Correction to Table 4.6.1-13 RRCReconfiguration	Huawei, Hisilicon
R5-210624	Correction to Table 4.6.3-185 SSB-MTC	Huawei, Hisilicon, Ericsson
R5-210625	Correction to Table 4.6.3-192 TDD-UL-DL-ConfigCommon	Huawei, Hisilicon
R5-210826	Editorial update IE ServingCellConfigCommon	Ericsson
R5-211374	Update IE PDCCH-ConfigCommon	Ericsson, MCC TF160, Anritsu
R5-211375	Correction to Table 4.6.3-185 SSB-MTC	Huawei, Hisilicon, Ericsson

6.3.2.1.4: Test environment for SIG (Clause 6)

TDoc	Title	Source
R5-210626	Correction to Table 6.4.1-11 USIM Configuration 11	Huawei, Hisilicon
R5-211033	Correction test frequencies for CA_n261(2A) for protocol testing	Ericsson
R5-211034	Correction of protocol applicability for test frequencies for DC_xA_n261(2A) configurations	Ericsson

6.3.2.1.5: Other clauses / Annexes

TDoc	Title	Source
R5-210627	Correction to Table 4.8.2.1-7 Reference QoS rule 7	Huawei, Hisilicon
R5-211171	Update to RRCReconfiguration-Speech IE	Ericsson

6.3.2.2: TS 38.508-2

TDoc	Title	Source
R5-210393	Addition and update of PICS	Lenovo, Motorola Mobility, Qualcomm
R5-210570	Update test case applicability for 6.2.3.9	MediaTek (Chengdu) Inc.
R5-210579	Add capability for I-RAT cell counting	MediaTek Inc.
R5-211376	Addition and update of PICS	Lenovo, Motorola Mobility, Qualcomm

6.3.2.4.2: Idle Mode (Clause 6)

TDoc	Title	Source
R5-210062	Correction to NR Idle mode test case 6.4.1.1	Keysight Technologies UK
R5-210157	Editorial changes to 38.523-1 Section 6	Samsung
R5-210320	Correction to NR Idle mode test cases	Keysight Technologies UK Ltd, Qualcomm
R5-210363	Correction to NR5G Idle mode TCs	Qualcomm CDMA Technologies
R5-210401	Correction to NR Idle mode test case 6.1.1.6	Keysight Technologies UK
R5-210574	Correction to test case 6.1.1.3	MediaTek Inc.
R5-210576	Correction to test case 6.1.2.8	MediaTek Inc.
R5-210577	Correction to test case 6.4.1.2	MediaTek Inc.
R5-210609	Correction to PLMN Selection Test Case 6.2.1.2	Apple (UK) Limited
R5-210610	Correction to Inter-RAT Cell Reselection Test Case 6.4.3.1	Apple (UK) Limited
R5-210628	Correction to NR TC 6.1.1.6-PLMN Selection with MinimumPeriodicSearchTimer	Huawei, Hisilicon
R5-210629	Correction to NR TC 6.1.2.2-Cell Selection Qqualmin	Huawei, Hisilicon
R5-210630	Correction to NR TC 6.1.2.9-Cell Reselection	Huawei, Hisilicon
R5-210631	Correction to NR TC 6.2.3.2-L2N cell reselection	Huawei, Hisilicon
R5-210632	Correction to NR TC 6.2.3.4-N2L cell reselection	Huawei, Hisilicon
R5-210633	Correction to NR TC 6.3.1.1-SoR security check successful	Huawei, Hisilicon
R5-210634	Correction to NR TC 6.3.1.2-SoR ACK has NOT requested	Huawei, Hisilicon
R5-210635	Correction to NR TC 6.3.1.3-SoR Security check unsuccessful	Huawei, Hisilicon
R5-210636	Correction to NR TC 6.3.1.5-SoR UE configured but not receive Steering of Roaming from Network	Huawei, Hisilicon
R5-210637	Correction to NR TC 6.3.1.8-Automatic PLMN selection mode	Huawei, Hisilicon
R5-210807	Correction to NR Idle Mode Test Case 6.3.1.7	ZTE Corporation
R5-211022	Update to idle mode test cases 6.2.1.2, 6.2.1.3, 6.4.3.1	Qualcomm Incorporated
R5-211173	Correction NR RRC idle mode test case 6.1.2.14	ANRITSU LTD, Qualcomm
R5-211316	Remove Idle Mode test case 6.2.3.9	MediaTek Inc.
R5-211329	Correction to test case 6.1.1.3	MediaTek Inc.
R5-211330	Correction to test case 6.1.2.8	MediaTek Inc.
R5-211331	Correction to test case 6.4.1.2	MediaTek Inc.
R5-211377	Editorial changes to 38.523-1 Section 6	Samsung
R5-211378	Correction to NR5G Idle mode TCs	Qualcomm CDMA Technologies
R5-211379	Correction to NR TC 6.3.1.1-SoR security check successful	Huawei, Hisilicon
R5-211380	Correction to NR TC 6.3.1.2-SoR ACK has NOT requested	Huawei, Hisilicon
R5-211381	Remove Idle Mode test case 6.2.3.9	MediaTek Inc.

6.3.2.4.3.1.2: MAC

TDoc	Title	Source
R5-210022	Correction to NR MAC test case 7.1.1.4.2.5	Keysight Technologies UK Ltd
R5-210063	Correction to NR MAC test case 7.1.1.8.1	Keysight Technologies UK
R5-210064	Correction to NR MAC test case 7.1.1.9.1	Keysight Technologies UK, Qualcomm
R5-210065	Correction to NR MAC test case 7.1.1.4.2.5	Keysight Technologies UK
R5-210158	Editorial changes to 38.523-1 Section 7	Samsung
R5-210321	Correction to UL-SCH TBS selection test cases common clause 7.1.1.4.2.0	Keysight Technologies UK, Samsung
R5-210542	Corrections to MAC RACH Beam Failure test case	Lenovo, Motorola Mobility, MCC TF160
R5-210567	Corrections to DL SPS test case	Lenovo, Motorola Mobility, MCC TF160
R5-210568	Corrections to UL configured grant type 1 test case	Lenovo, Motorola Mobility, MCC TF160
R5-210569	Corrections to UL configured grant type 2 test case	Lenovo, Motorola Mobility, MCC TF160
R5-210575	Correction to NR5G MAC TC 7.1.1.1.3	Qualcomm CDMA Technologies, Keysight Technologies UK Ltd., MCC TF160
R5-210638	Correction to NR TC 7.1.1.2.2-PDSCH Aggregate	Huawei, Hisilicon, MCC TF160
R5-210639	Correction to NR TC 7.1.1.3.8.X-PHR report	Huawei, Hisilicon
R5-211382	Correction to NR MAC test case 7.1.1.8.1	Keysight Technologies UK
R5-211383	Editorial changes to 38.523-1 Section 7	Samsung
R5-211384	Correction to NR TC 7.1.1.2.2-PDSCH Aggregate	Huawei, Hisilicon, MCC TF160
R5-211385	Correction to NR TC 7.1.1.3.8.X-PHR report	Huawei, Hisilicon

6.3.2.4.3.1.3: RLC

TDoc	Title	Source
R5-210197	Corrections to RLC test case 7.1.2.3.8	MCC TF160
R5-210640	Correction to NR TC 7.1.2.3.3 and 7.1.2.3.4-RLC SN sequence	Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160
R5-211386	Correction to NR TC 7.1.2.3.3 and 7.1.2.3.4-RLC SN sequence	Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160

6.3.2.4.3.1.4: PDCP

TDoc	Title	Source
R5-210360	Correction to NR5G PDCP TC 7.1.3.1.1 and 7.1.3.1.2	Qualcomm CDMA Technologies
R5-210641	Correction to NR TC 7.1.3.1.1 and 7.1.3.1.2-PDCP SN sequence	Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160
R5-211387	Correction to NR TC 7.1.3.1.1 and 7.1.3.1.2-PDCP SN sequence	Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160

6.3.2.4.4.1.1: RRC Connection Management Procedures (clause 8.1.1)

TDoc	Title	Source
R5-210361	Correction to NR5G RRC TC 8.1.1.3.3	Qualcomm CDMA Technologies
R5-211009	Update to NR RRC test case 8.1.1.3.2	Qualcomm Incorporated
R5-211312	Correction to NR5GC RRC test case 8.1.1.2.4	Keysight Technologies UK
R5-211388	Update to NR RRC test case 8.1.1.3.2	Qualcomm Incorporated

6.3.2.4.4.1.3: RRC Measurement Configuration Control and Reporting (clause 8.1.3)

TDoc	Title	Source
R5-210642	Correction to NR test case 8.1.3.1.13-CSI-RS based intra-freq measure	Huawei, Hisilicon
R5-210643	Correction to NR TC 8.1.3.1.15A-bliacklisting	Huawei, Hisilicon
R5-210644	Correction to NR TC 8.1.3.2.2-Event B2	Huawei, Hisilicon
R5-211390	Correction to NR test case 8.1.3.1.13-CSI-RS based intra-freq measure	Huawei, Hisilicon

6.3.2.4.4.1.4: RRC Handover (clause 8.1.4)

TDoc	Title	Source
R5-210066	Correction to NR5GC IRAT test case 8.1.4.2.1.1	Keysight Technologies UK
R5-210067	Correction of NR RRC test case 8.1.4.1.5	Keysight Technologies UK
R5-210131	Correction of NR CA TC 8.1.4.1.7.x	MediaTek Inc., Keysight Technologies
R5-210132	Correction of NR CA TC 8.1.4.1.9.x	MediaTek Inc., Keysight Technologies
R5-210367	Correction to NR5G RRC IRAT TC 8.1.4.2.1.1	Qualcomm CDMA Technologies
R5-211332	Correction of NR RRC test case 8.1.4.1.5	Keysight Technologies UK
R5-211391	Correction of NR CA TC 8.1.4.1.9.x	MediaTek Inc., Keysight Technologies

6.3.2.4.4.1.5: RRC Others (clause 8.1.5)

TDoc	Title	Source
R5-210379	Update of RRC TC 8.1.5.6.5.1	Intertek
R5-210645	Correction to NR TC 8.1.5.6.1-RLF	Huawei, Hisilicon
R5-210646	Correction to NR TC 8.1.5.8.1-Latency check	Huawei, Hisilicon, MCC TF160, Qualcomm
R5-210647	Addition of NR TC 8.1.5.8.2.1-intra-band SCell Latency check	Huawei, Hisilicon, MCC TF160
R5-210648	Addition of NR TC 8.1.5.8.2.2-inter-band SCell Latency check	Huawei, Hisilicon, MCC TF160
R5-210649	Addition of NR TC 8.1.5.8.2.3-intra-band non-contigous SCell Latency check	Huawei, Hisilicon, MCC TF160
R5-211027	Update to NR RRC test case 8.1.5.8.1	Qualcomm Incorporated
R5-211234	Update to NR RRC UE capability transfer test case 8.1.5.1.1	Qualcomm Incorporated
R5-211296	Correction to test case 8.1.5.1.1	MediaTek Inc.
R5-211392	Correction to NR TC 8.1.5.8.1-Latency check	Huawei, Hisilicon, MCC TF160, Qualcomm
R5-211393	Addition of NR TC 8.1.5.8.2.1-intra-band SCell Latency check	Huawei, Hisilicon, MCC TF160
R5-211394	Correction to test case 8.1.5.1.1	MediaTek Inc.

6.3.2.4.4.2.1: RRC UE Capability / Others (clause 8.2.1)

TDoc	Title	Source
R5-211246	Update to MR-DC RRC UE capability transfer test case 8.2.1.1.1	Qualcomm Incorporated
R5-211297	Correction to test case 8.2.1.1.1	MediaTek Inc.
R5-211395	Correction to test case 8.2.1.1.1	MediaTek Inc.

6.3.2.4.4.2.2: RRC Radio Bearer (clause 8.2.2)

TDoc	Title	Source
R5-210159	Editorial changes to 38.523-1 Section 8	Samsung
R5-210650	Correction to NR-DC TC 8.2.2.7.2-bearer type change without security key change	Huawei, Hisilicon
R5-210651	Correction to NR-DC TC 8.2.2.9.2-Split DRB	Huawei, Hisilicon

6.3.2.4.4.2.3: RRC Measurement / Handovers (clause 8.2.3)

TDoc	Title	Source
R5-210362	Correction to NR5G TCs 8.1.X on SINR reporting	Qualcomm CDMA Technologies, Mediatek
R5-210378	Update of RRC TC 8.2.3.12.1	Intertek
R5-210389	Correction to MR-DC test case 8.2.3.2.1	Guangdong OPPO Mobile Telecom.
R5-210390	Correction to MR-DC test case 8.2.3.6.1a and 8.2.3.6.1b	Guangdong OPPO Mobile Telecom.
R5-210391	Correction to MR-DC test case 8.2.3.7.1	Guangdong OPPO Mobile Telecom.
R5-210392	Correction to MR-DC test case 8.2.3.9.1	Guangdong OPPO Mobile Telecom.
R5-210397	Correction to NR-DC Test case 8.2.2.8.2	ANRITSU LTD
R5-210619	Correction to NR-DC RRC test case 8.2.3.14.2	TDIA, CATT
R5-210620	Correction to NR-DC RRC test case 8.2.3.14.2	TDIA, CATT
R5-210652	Correction to NR-DC TC 8.2.3.16.2-Intra NR measurements	Huawei, Hisilicon
R5-211389	Correction to NR5G TCs 8.1.X on SINR reporting	Qualcomm CDMA Technologies, Mediatek
R5-211396	Correction to MR-DC test case 8.2.3.7.1	Guangdong OPPO Mobile Telecom.
R5-211397	Correction to NR-DC RRC test case 8.2.3.14.2	TDIA, CATT

6.3.2.4.4.2.4: RRC Carrier Aggregation (clause 8.2.4)

TDoc	Title	Source
R5-210068	Correction to NR CA testcases 8.2.4.1.1.x	Keysight Technologies UK
R5-210561	Correction to EN-DC test case 8.2.4.3.1.3	ANRITSU LTD

6.3.2.4.4.2.5: RRC Reconfiguration / Radio Link Failure (clause 8.2.5)

TDoc	Title	Source
R5-210265	Addition of NR-DC RRC TC 8.2.5.3.2	Qualcomm CDMA Technologies
R5-210266	Addition of NR-DC RRC TC 8.2.5.4.2	Qualcomm CDMA Technologies
R5-210365	Correction to NR-DC RRC TC 8.2.5.1.2	Qualcomm CDMA Technologies, TDIA, CATT
R5-210366	Correction to NR-DC RRC TC 8.2.5.2.2	Qualcomm CDMA Technologies
R5-210621	Correction of NR-DC tese case 8.2.5.1.2	TDIA, CATT
R5-211398	Addition of NR-DC RRC TC 8.2.5.3.2	Qualcomm CDMA Technologies
R5-211399	Addition of NR-DC RRC TC 8.2.5.4.2	Qualcomm CDMA Technologies
R5-211400	Correction to NR-DC RRC TC 8.2.5.1.2	Qualcomm CDMA Technologies, TDIA, CATT

6.3.2.4.4.2.6: RRC Others (clause 8.2.6)

TDoc	Title	Source
R5-210653	Correction to NR-DC TC 8.2.6.1.2.1-RLC failure	Huawei, Hisilicon
R5-211401	Correction to NR-DC TC 8.2.6.1.2.1-RLC failure	Huawei, Hisilicon

6.3.2.4.5.3: MM Registration & De-registration (clauses 9.1.5 & 9.1.6)

TDoc	Title	Source
R5-210026	Addition of new 5GS NAS test case to test handling of extended octets	NTT DOCOMO INC.
R5-210160	Editorial changes to 38.523-1 Sections 9-12	Samsung
R5-210191	Correction of NR test case 9.1.5.1.8	Qualcomm Incorporated, ANRITSU LTD
R5-210267	Update to 5GC NAS TC 9.1.5.2.9	Qualcomm CDMA Technologies
R5-210322	Correction to 5GMM Initial Registration test cases	Keysight Technologies UK Ltd, Qualcomm
R5-210572	Removing test case 9.1.5.2.9	MediaTek Inc.
R5-211333	Removing test case 9.1.5.2.9	MediaTek Inc.
R5-211402	Addition of new 5GS NAS test case to test handling of extended octets	NTT DOCOMO INC.

6.3.2.4.5.5: MM SMS Over NAS (clause 9.1.8)

TDoc	Title	Source
R5-211007	Correction to NR TC 9.1.8.1-SMS	Huawei, Hisilicon
R5-211403	Correction to NR TC 9.1.8.1-SMS	Huawei, Hisilicon

6.3.2.4.5.6: Inter-system Mobility (clause 9.3)

TDoc	Title	Source
R5-210794	Correction to 5GMM Inter-system mobility test case 9.3.1.2	Keysight Technologies UK
R5-211019	Update of Inter system mobility test case 9.3.1.1	Qualcomm Incorporated
R5-211404	Correction to 5GMM Inter-system mobility test case 9.3.1.2	Keysight Technologies UK
R5-211405	Update of Inter system mobility test case 9.3.1.1	Qualcomm Incorporated

6.3.2.4.6.3: SM UE-requested PDU session establishment / modification & release (clauses 10.1.4 / 10.1.5 & 10.1.6)

TDoc	Title	Source
R5-210398	Correction to NR5GC NAS test cases for handling additional PDN	ANRITSU LTD

6.3.2.4.8.1: EPS Fallback

TDoc	Title	Source
R5-210133	Update of power level tables for Multilayer EPSFB TC 11.1.x	MediaTek Inc.
R5-210268	Correction to EPS Fallback Test Case 11.1.1	Qualcomm CDMA Technologies, Anritsu
R5-210654	Correction to NR TC 11.1.3-EPS Fallback with handover	Huawei, Hisilicon
R5-211319	Correction to EPS FallBack test cases 11.1.X	ANRITSU LTD, Qualcomm, Keysight
R5-211406	Correction to NR TC 11.1.3-EPS Fallback with handover	Huawei, Hisilicon
R5-211407	Correction to EPS FallBack test cases 11.1.X	ANRITSU LTD, Qualcomm, Keysight
R5-211547	Correction to EPS Fallback Test Case 11.1.1	Qualcomm CDMA Technologies, Anritsu

6.3.2.4.8.3: Unified Access Control (UAC)

TDoc	Title	Source
R5-210198	Corrections to test case 11.3.1	MCC TF160
R5-210356	Corrections to test case 11.3.1	ROHDE & SCHWARZ, MCC TF160
R5-210364	Correction to NR5G UAC TC 11.3.4	Qualcomm CDMA Technologies, Keysight
R5-211025	Update of UAC test case 11.3.6	Qualcomm Incorporated
R5-211318	Correction to NR5GC UAC test case 11.3.7	Keysight Technologies UK, Qualcomm
R5-211408	Correction to NR5G UAC TC 11.3.4	Qualcomm CDMA Technologies, Keysight
R5-211409	Update of UAC test case 11.3.6	Qualcomm Incorporated
R5-211410	Correction to NR5GC UAC test case 11.3.7	Keysight Technologies UK, Qualcomm

6.3.2.4.8.4: Emergency Services

TDoc	Title	Source
R5-210163	Update of TC for IMS emergency TC 11.4.10 5GMM-REGISTERED.NORMAL-SERVICE N26 interface not supported N1 to S1	Samsung
R5-210164	Update to indication of Max nr cells in emergency test cases being active during test execution	Samsung
R5-210165	Introduction of new IMS emergency TC 11.4.11 5GMM-REGISTERED.NORMAL-SERVICE N26 interface not supported S1 to N1	Samsung
R5-210388	Correction to 11.4.2 and 11.4.3	MediaTek Inc.
R5-210571	Correction to 11.4.8	MediaTek Inc.
R5-211411	Correction to 11.4.2 and 11.4.3	MediaTek Inc.

6.3.2.5: TS 38.523-2

TDoc	Title	Source
R5-210025	Update release applicability of RRC TC 8.1.1.2.4	NTT DOCOMO INC.
R5-210161	Aligning content of 38.523-2 with 38.523-1	Samsung
R5-210162	Adding missing applicability for TC 6.1.2.7 and 8.1.5.2.2	Samsung
R5-210166	Adding applicability for new IMS emergency TC 11.4.11	Samsung
R5-210190	Update of 5G-NR test cases applicability	Qualcomm Incorporated, Mediatek
R5-210578	Update test case applicability for 6.2.3.9	MediaTek Inc.
R5-210655	Correction to NR TC applicability for 5GS	Huawei, Hisilicon
R5-211315	Update test case applicability for 6.2.3.9	MediaTek Inc.
R5-211412	Update release applicability of RRC TC 8.1.1.2.4	NTT DOCOMO INC.
R5-211413	Adding missing applicability for TC 6.1.2.7 and 8.1.5.2.2	Samsung
R5-211414	Adding applicability for new IMS emergency TC 11.4.11	Samsung
R5-211415	Update of 5G-NR test cases applicability	Qualcomm Incorporated, Mediatek
R5-211416	Correction to NR TC applicability for 5GS	Huawei, Hisilicon

6.3.2.6: TS 38.523-3

TDoc	Title	Source
R5-210199	5G Test Models updates	MCC TF160
R5-211417	5G Test Models updates	MCC TF160

6.3.2.7: TS 34.229-1

TDoc	Title	Source
R5-210059	Voiding A.1.9	ROHDE & SCHWARZ
R5-210347	Adding NG.114 dependencies to Annex A.2.1	ROHDE & SCHWARZ
R5-211418	Adding NG.114 dependencies to Annex A.2.1	ROHDE & SCHWARZ

6.3.2.8: TS 34.229-2

TDoc	Title	Source
R5-210079	Addition of applicabilities for new IMS over 5GS test cases	ROHDE & SCHWARZ
R5-210094	Corrections and extensions to applicability statements of IMS over 5GS test cases	ROHDE & SCHWARZ
R5-210346	Adding NG.114 dependencies and PICS for test case 7.4	ROHDE & SCHWARZ
R5-211299	Applicability of ‘Re-registration after capability update / 5GS’ test case	Apple Inc.
R5-211419	Addition of applicabilities for new IMS over 5GS test cases	ROHDE & SCHWARZ
R5-211420	Corrections and extensions to applicability statements of IMS over 5GS test cases	ROHDE & SCHWARZ

6.3.2.10: TS 34.229-5

TDoc	Title	Source
R5-210056	Corrections to A.5 on MT Voice Call	ROHDE & SCHWARZ, MCC TF160
R5-210057	Corrections to test case 6.3	ROHDE & SCHWARZ, Anritsu, Keysight, Qualcomm
R5-210072	Addition of IMS over 5GS test case 7.25	ROHDE & SCHWARZ
R5-210095	Corrections to test case 6.4	ROHDE & SCHWARZ
R5-210118	Addition of IMS over 5GS test case 7.27	ZTE Corporation
R5-210119	Addition of IMS over 5GS test case 7.28	ZTE Corporation
R5-210120	Addition of IMS over 5GS test case 7.29	ZTE Corporation
R5-210121	Addition of IMS over 5GS test case 7.30	ZTE Corporation
R5-210122	Addition of IMS over 5GS test case 7.31	ZTE Corporation
R5-210123	Addition of IMS over 5GS test case 7.32	ZTE Corporation
R5-210124	Addition of IMS over 5GS test case 7.33	ZTE Corporation
R5-210125	Addition of IMS over 5GS test case 7.34	ZTE Corporation
R5-210188	New References	ZTE Corporation
R5-210189	Update test case 7.4, 7.5, 7.6 and 7.7	ZTE Corporation
R5-210196	Corrections to SMS test case 9.5	MCC TF160
R5-210259	Corrections to A.11	ROHDE & SCHWARZ
R5-210269	Correction to Annex A.9 EPS Fallback for Voice Call / 5GS	Qualcomm CDMA Technologies
R5-210270	Correction to IMS over 5GS TC 6.2	Qualcomm CDMA Technologies
R5-210271	Correction to IMS over 5GS TC 7.2	Qualcomm CDMA Technologies
R5-210272	Correction to IMS over 5GS TC 7.11	Qualcomm CDMA Technologies
R5-210343	Corrections and extensions to test case 7.4	ROHDE & SCHWARZ
R5-210348	Adding NG.114 dependencies to Annex A.4	ROHDE & SCHWARZ
R5-210357	Editorial corrections to TS 34.229-5	ROHDE & SCHWARZ
R5-210368	Correction to IMS over 5GS TC 7.3	Qualcomm CDMA Technologies
R5-210369	Addition of IMS over 5GS TC 7.14	Qualcomm CDMA Technologies
R5-210554	Adding references	ROHDE & SCHWARZ
R5-210582	Addition of A.15.1 MTSI MO Video Call / with preconditions / 5GS	Qualcomm CDMA Technologies
R5-210589	Correction to Annex A.9 EPS Fallback for Voice Call / 5GS	Qualcomm CDMA Technologies, Anritsu
R5-210590	Correction to IMS over 5GS TC 6.2	Qualcomm CDMA Technologies
R5-210591	Correction to IMS over 5GS TC 7.2	Qualcomm CDMA Technologies, Anritsu, MCC TF160
R5-210592	Correction to IMS over 5GS TC 7.11	Qualcomm CDMA Technologies, Keysight Technologies, Anritsu
R5-210656	Correction to NR IMS TC 6.5-UE de-reg after ISIM refresh	Huawei, Hisilicon
R5-210657	Correction to NR IMS TC 7.10-Content Type not present	Huawei, Hisilicon
R5-210658	Correction to NR IMS A.9.2-Optional UPDATE after EPS fallback	Huawei, Hisilicon
R5-210659	Withdrawing NR IMS TC 7.3-MO voice-UE preconditions enabled but not included in INVITE	Huawei, Hisilicon
R5-210660	Correction to NR IMS TC 10.1-Conformance requirement update	Huawei, Hisilicon
R5-210661	Addition of NR IMS TC 7.26-MO CAT forking model	Huawei, Hisilicon
R5-210662	Addition of NR IMS TC 8.26-MO hold without announcement	Huawei, Hisilicon
R5-210663	Addition of NR IMS TC 8.28-MT hold without announcement	Huawei, Hisilicon
R5-210664	Addition of NR IMS TC 8.30-Subscription to MWI event	Huawei, Hisilicon
R5-210665	Addition of NR IMS TC 8.31-Creating and leaving conference	Huawei, Hisilicon
R5-210666	Addition of NR IMS TC 8.32-Inviting user to conference by REFER	Huawei, Hisilicon
R5-210667	Addition of NR IMS TC 8.34-Three way session	Huawei, Hisilicon
R5-210668	Addition of NR IMS TC 8.36-MO explicit communication transfer	Huawei, Hisilicon
R5-210882	Correction to NR IMS TC 7.1-Shorter Retry-after period	Huawei, Hisilicon
R5-211043	Addition of new IMS over 5GS TC 8.38 Communication Waiting and cancelling the call / 5GS	Qualcomm Incorporated
R5-211334	Addition of IMS over 5GS test case 7.25	ROHDE & SCHWARZ
R5-211421	Addition of IMS over 5GS test case 7.27	ZTE Corporation
R5-211422	Addition of IMS over 5GS test case 7.28	ZTE Corporation
R5-211423	Addition of IMS over 5GS test case 7.29	ZTE Corporation
R5-211424	Addition of IMS over 5GS test case 7.30	ZTE Corporation
R5-211425	Addition of IMS over 5GS test case 7.31	ZTE Corporation
R5-211426	Addition of IMS over 5GS test case 7.32	ZTE Corporation
R5-211427	Addition of IMS over 5GS test case 7.33	ZTE Corporation
R5-211428	Addition of IMS over 5GS test case 7.34	ZTE Corporation
R5-211429	Update test case 7.4, 7.5, 7.6 and 7.7	ZTE Corporation
R5-211430	Editorial corrections to TS 34.229-5	ROHDE & SCHWARZ
R5-211431	Addition of IMS over 5GS TC 7.14	Qualcomm CDMA Technologies
R5-211432	Adding references	ROHDE & SCHWARZ
R5-211433	Addition of A.15.1 MTSI MO Video Call / with preconditions / 5GS	Qualcomm CDMA Technologies
R5-211434	Correction to IMS over 5GS TC 7.2	Qualcomm CDMA Technologies, Anritsu, MCC TF160
R5-211435	Correction to IMS over 5GS TC 7.11	Qualcomm CDMA Technologies, Keysight Technologies, Anritsu
R5-211436	Correction to NR IMS TC 7.10-Content Type not present	Huawei, Hisilicon
R5-211437	Correction to NR IMS A.9.2-Optional UPDATE after EPS fallback	Huawei, Hisilicon
R5-211438	Correction to NR IMS TC 10.1-Conformance requirement update	Huawei, Hisilicon
R5-211439	Addition of NR IMS TC 7.26-MO CAT forking model	Huawei, Hisilicon
R5-211440	Addition of NR IMS TC 8.26-MO hold without announcement	Huawei, Hisilicon
R5-211441	Addition of NR IMS TC 8.28-MT hold without announcement	Huawei, Hisilicon
R5-211442	Addition of NR IMS TC 8.30-Subscription to MWI event	Huawei, Hisilicon
R5-211443	Addition of NR IMS TC 8.31-Creating and leaving conference	Huawei, Hisilicon
R5-211444	Addition of NR IMS TC 8.32-Inviting user to conference by REFER	Huawei, Hisilicon
R5-211445	Addition of NR IMS TC 8.34-Three way session	Huawei, Hisilicon
R5-211446	Addition of NR IMS TC 8.36-MO explicit communication transfer	Huawei, Hisilicon
R5-211447	Addition of new IMS over 5GS TC 8.38 Communication Waiting and cancelling the call / 5GS	Qualcomm Incorporated

6.3.2.11: TS 36.508

TDoc	Title	Source
R5-210399	Inclusion of SK-Counter IE in RRCConnectionReconfiguration	ANRITSU LTD

6.3.2.20: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210167	MR-DC	Ericsson
R5-210185	SST and NG.116	Ericsson
R5-210317	Discussion paper on IMS over 5GS test case 7.3 regarding flexible use of preconditions	ROHDE & SCHWARZ
R5-210580	Discussion paper to remove test case 9.1.5.2.9 from TS 38.523-1	MediaTek Inc.
R5-210806	Discussion paper on confirming successful resource reservation	ROHDE & SCHWARZ
R5-211045	Discussion paper on impact of UE’s highest channel bandwidth capability on Transport Block Selection test cases	Qualcomm Incorporated
R5-211323	MR-DC	Ericsson
R5-211325	Title: Discussion paper on IMS 180 Ringing before or after resource reservation	Huawei, Hisilicon
R5-211362	Discussion paper on impact of UE’s highest channel bandwidth capability on Transport Block Selection test cases	Qualcomm Incorporated

6.3.6.3: TS 36.523-2

TDoc	Title	Source
R5-210152	Adding missing applicability for TC 8.2.2.14.1	Samsung
R5-211448	Adding missing applicability for TC 8.2.2.14.1	Samsung

6.3.7.2: TS 38.508-2

TDoc	Title	Source
R5-211128	Correction of Table A.4.3.2B.2.3.12-1	Google Inc.
R5-211449	Correction of Table A.4.3.2B.2.3.12-1	Google Inc.

6.3.9.1: TS 38.508-1

TDoc	Title	Source
R5-211328	Correction to frequency parameters for band n53	Keysight Technologies UK, Nokia

6.3.9.3: TS 38.523-3

TDoc	Title	Source
R5-210355	Guidelines on test execution for bands n14 and n53	MCC TF160, Nokia, AT&T

6.3.10.1: TS 36.508

TDoc	Title	Source
R5-210342	Correction to NB-IoT Common contents of system information messages	CATT, TDIA

6.3.11.1: TS 36.508

TDoc	Title	Source
R5-211172	Editorial updates to RACH-ConfigCommon IE	Ericsson
R5-211450	Editorial updates to RACH-ConfigCommon IE	Ericsson

6.3.11.4: TS 36.523-2

TDoc	Title	Source
R5-211130	Completion C384 and C385 of Table 4-1a	Google Inc.
R5-211451	Completion C384 and C385 of Table 4-1a	Google Inc.

6.3.13.2: TS 36.523-1

TDoc	Title	Source
R5-211162	Addition of E-UTRAN TC 8.2.4.30.1 DAPS handover	China Telecom
R5-211452	Addition of E-UTRAN TC 8.2.4.30.1 DAPS handover	China Telecom

6.3.13.3: TS 36.523-2

TDoc	Title	Source
R5-211356	Adding applicability for E-UTRAN TC 8.2.4.30.1 DAPS handover	China Telecom
R5-211453	Adding applicability for E-UTRAN TC 8.2.4.30.1 DAPS handover	China Telecom

6.3.14.3: TS 38.523-1

TDoc	Title	Source
R5-210669	Addition of TC 7.1.1.3.1-UL grant prioritization	Huawei, Hisilicon
R5-210769	Corrections to DL Multi SPS test case	Lenovo, Motorola Mobility, MCC TF160
R5-211313	Addition of TC 7.1.1.3.11 - UL grant prioritization	Huawei, Hisilicon
R5-211454	Corrections to DL Multi SPS test case	Lenovo, Motorola Mobility, MCC TF160

6.3.14.4: TS 38.523-2

TDoc	Title	Source
R5-210670	Correction to NR TC applicability for IIoT	Huawei, Hisilicon
R5-211455	Correction to NR TC applicability for IIoT	Huawei, Hisilicon

6.3.15.1: TS 38.508-1

TDoc	Title	Source
R5-210687	Correction to Table 4.6.3-25B CondReconfigId	Huawei, Hisilicon
R5-210688	Correction to Table 4.6.3-25C CondReconfigToAddModList	Huawei, Hisilicon
R5-210689	Correction to Table 4.6.3-25D ConditionalReconfiguration	Huawei, Hisilicon
R5-210690	Correction to Table 4.6.3-142 ReportConfigNR	Huawei, Hisilicon
R5-211456	Correction to Table 4.6.3-142 ReportConfigNR	Huawei, Hisilicon

6.3.15.2: TS 38.508-2

TDoc	Title	Source
R5-210695	Add UE capability for NR MobEnc	Huawei, Hisilicon
R5-211457	Add UE capability for NR MobEnc	Huawei, Hisilicon

6.3.15.3: TS 38.523-1

TDoc	Title	Source
R5-210691	Addition of NR TC 8.1.4.4.1-Conditional handover Success	Huawei, Hisilicon
R5-210692	Addition of NR TC 8.1.4.4.2 -Conditional handover modify conditional handover configuration	Huawei, Hisilicon
R5-210693	Addition of NR TC 8.1.4.4.3-Conditional handover Failure	Huawei, Hisilicon
R5-211458	Addition of NR TC 8.1.4.4.1-Conditional handover Success	Huawei, Hisilicon
R5-211459	Addition of NR TC 8.1.4.4.2 -Conditional handover modify conditional handover configuration	Huawei, Hisilicon
R5-211460	Addition of NR TC 8.1.4.4.3-Conditional handover Failure	Huawei, Hisilicon

6.3.15.4: TS 38.523-2

TDoc	Title	Source
R5-210694	Correction to applicability for NR MobEnc	Huawei, Hisilicon
R5-211461	Correction to applicability for NR MobEnc	Huawei, Hisilicon

6.3.16.1: TS 38.508-1

TDoc	Title	Source
R5-210698	Addition of IE SL-PreconfigurationNR	Huawei, Hisilicon
R5-210699	Addition of V2X NAS IEs	Huawei, Hisilicon
R5-210700	Addition of SI combination for NR SL	Huawei, Hisilicon
R5-210701	Correction of NR SL IE SL-BWP-ConfigCommon	Huawei, Hisilicon
R5-210702	Correction of NR SL IE SL-BWP-PoolConfigCommon	Huawei, Hisilicon
R5-210703	Correction of NR SL IE SL-ConfigDedicatedNR	Huawei, Hisilicon
R5-210704	Correction of NR SL IE SL-FreqConfigCommon	Huawei, Hisilicon
R5-210705	Correction of NR SL IE SL-LogicalChannelConfig	Huawei, Hisilicon
R5-210706	Correction of NR SL IE SL-MeasConfigInfo	Huawei, Hisilicon
R5-210707	Correction of NR SL IE SL-PDCP-Config	Huawei, Hisilicon
R5-210708	Correction of NR SL IE SL-RadioBearerConfig	Huawei, Hisilicon
R5-210709	Correction of NR SL IE SL-ResourcePool	Huawei, Hisilicon
R5-210710	Correction of NR SL IE SL-RLC-BearerConfig	Huawei, Hisilicon
R5-210711	Correction of NR SL IE SL-RLC-Config	Huawei, Hisilicon
R5-210712	Correction of NR SL IE SL-SDAP-Config	Huawei, Hisilicon
R5-210713	Correction to NR Uu IE ARFCN-ValueNR	Huawei, Hisilicon
R5-210714	Correction to NR Uu IE SCS-SpecificCarrier	Huawei, Hisilicon
R5-210715	Correction to PC5-RRC message RRCReconfigurationSidelink	Huawei, Hisilicon
R5-210716	Correction to PC5-RRC message UECapabilityEnquirySidelink	Huawei, Hisilicon
R5-210717	Correction to PC5-RRC message UECapabilityInformationSidelink	Huawei, Hisilicon
R5-211335	Correction of NR SL IE SL-BWP-PoolConfigCommon	Huawei, Hisilicon
R5-211336	Correction of NR SL IE SL-SDAP-Config	Huawei, Hisilicon
R5-211337	Correction to PC5-RRC message RRCReconfigurationSidelink	Huawei, Hisilicon
R5-211338	Correction to PC5-RRC message UECapabilityEnquirySidelink	Huawei, Hisilicon
R5-211339	Correction to PC5-RRC message UECapabilityInformationSidelink	Huawei, Hisilicon
R5-211462	Addition of SI combination for NR SL	Huawei, Hisilicon

6.3.17.3: TS 38.523-1

TDoc	Title	Source
R5-210880	Correction to MultipleCoreset test case	Lenovo, Motorola Mobility
R5-210881	New MIMO enhancements test case	Lenovo, Motorola Mobility

6.3.18.2: TS 38.508-2

TDoc	Title	Source
R5-210331	Adding scell dormancy indication outside active time to physical layer baseline implementation capabilities	CATT
R5-211463	Adding scell dormancy indication outside active time to physical layer baseline implementation capabilities	CATT

6.3.18.3: TS 38.509

TDoc	Title	Source
R5-210372	Addition of UAI test function	Qualcomm CDMA Technologies
R5-211283	Addition of UAI test function	Qualcomm CDMA Technologies
R5-211549	Addition of UAI test function	Qualcomm CDMA Technologies

6.3.18.4: TS 38.523-1

TDoc	Title	Source
R5-210329	Addition of UE power saving test case 7.1.1.12.2	CATT
R5-210330	Addition of new test cases 7.1.1.12.4, 7.1.1.12.5 and 7.1.1.12.6 for UE power saving in NR	CATT
R5-210333	Correction test purpose to MAC test case 7.1.1.12.1	CATT
R5-211358	Adding new test cases of SCell Dormancy Indication for UE power saving in NR	CATT

6.3.18.5: TS 38.523-2

TDoc	Title	Source
R5-210332	Addition of test applicabilities for UE power saving in NR	CATT
R5-211464	Addition of test applicabilities for UE power saving in NR	CATT

6.3.19.1: TS 38.508-1

TDoc	Title	Source
R5-210371	Updates to SIB1 and SIB10 for Rel-16 NPN	Qualcomm CDMA Technologies
R5-210373	Addition of System information combination for Rel-16 NPN	Qualcomm CDMA Technologies
R5-210374	Addition of NID information for Rel-16 NPN	Qualcomm CDMA Technologies
R5-210375	Updates to NAS messages for Rel-16 NPN	Qualcomm CDMA Technologies
R5-211465	Updates to SIB1 and SIB10 for Rel-16 NPN	Qualcomm CDMA Technologies
R5-211466	Addition of System information combination for Rel-16 NPN	Qualcomm CDMA Technologies
R5-211548	Addition of NID information for Rel-16 NPN	Qualcomm CDMA Technologies

6.3.20.3: TS 38.523-1

TDoc	Title	Source
R5-210370	Addition of RACS RRC TC 8.1.5.9.1	Qualcomm CDMA Technologies
R5-210430	Addition of new NAS Test case 9.1.9.2 for testing RACS UE Configuration Update	Tech Mahindra Limited

6.3.20.4: TS 38.523-2

TDoc	Title	Source
R5-210513	Addition of applicability for new NAS Test case 9.1.9.2	Tech Mahindra Limited

6.3.20.10: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210277	Discussion paper for RRC Segmentation in Rel-16 RACS	Qualcomm CDMA Technologies
R5-210376	Addition of test function Set UE Capability Info	Qualcomm CDMA Technologies
R5-211324	Discussion paper for RRC Segmentation in Rel-16 RACS	Qualcomm CDMA Technologies
R5-211550	Addition of test function Set UE Capability Info	Qualcomm CDMA Technologies

6.3.22.1: TS 38.508-1

TDoc	Title	Source
R5-210288	Introduction of definition of common environment for R16 NR Immediate MDT	CMCC, ZTE
R5-210314	Updating Contents of RRC messages for Logged MDT test cases	ZTE Corporation, CMCC
R5-211467	Introduction of definition of common environment for R16 NR Immediate MDT	CMCC, ZTE
R5-211468	Updating Contents of RRC messages for Logged MDT test cases	ZTE Corporation, CMCC

6.3.22.2: TS 38.508-2

TDoc	Title	Source
R5-210289	Introduction of common implementation conformance statements for R16 NR SON and MDT	CMCC, ZTE, MediaTek Inc, HiSilicon
R5-211469	Introduction of common implementation conformance statements for R16 NR SON and MDT	CMCC, ZTE, MediaTek Inc, HiSilicon

6.3.22.3: TS 38.523-1

TDoc	Title	Source
R5-210029	Addition of new MDT test case 8.1.6.1.2.1	ZTE, SRTC, Tejet
R5-210030	Addition of new MDT test case 8.1.6.1.2.2	ZTE, SRTC, Tejet
R5-210031	Addition of new MDT test case 8.1.6.1.2.3	ZTE, SRTC, Tejet
R5-210032	Addition of new MDT test case 8.1.6.1.2.4	ZTE, SRTC, Tejet
R5-210033	Addition of new MDT test case 8.1.6.1.2.5	ZTE, SRTC, Tejet
R5-210034	Addition of new MDT test case 8.1.6.1.2.6	ZTE Corporation
R5-210035	Addition of new MDT test case 8.1.6.1.2.7	ZTE Corporation
R5-210036	Addition of new MDT test case 8.1.6.1.2.8	ZTE Corporation
R5-210037	Addition of new MDT test case 8.1.6.1.2.9	ZTE Corporation
R5-210038	Addition of new MDT test case 8.1.6.1.2.10	ZTE Corporation
R5-210039	Addition of new MDT test case 8.1.6.1.2.11	ZTE Corporation
R5-210040	Addition of new MDT test case 8.1.6.1.2.12	ZTE Corporation
R5-210041	Addition of new MDT test case 8.1.6.1.2.13	ZTE Corporation
R5-210128	Addition of new test case 8.1.6.1.1.1 for NR Immediate MDT	CMCC
R5-210129	Addition of new test case 8.1.6.1.1.2 for NR L2 measurement	CMCC
R5-210671	Addition of MDT TC 8.1.6.1.4.3-CEF-intra-NR handover	Huawei, Hisilicon
R5-210672	Addition of MDT TC 8.1.6.1.4.4-CEF-RRC re-establishment	Huawei, Hisilicon
R5-210673	Addition of MDT TC 8.1.6.1.4.5-CEF-location info	Huawei, Hisilicon
R5-210674	Addition of MDT TC 8.1.6.1.4.6-CEF-intra-freq measurements	Huawei, Hisilicon
R5-210675	Addition of MDT TC 8.1.6.1.4.7-CEF-inter-freq measurements	Huawei, Hisilicon
R5-210676	Addition of MDT TC 8.1.6.1.4.8-CEF-rach failure	Huawei, Hisilicon
R5-210798	Addition of new MDT TC 8.1.6.1.3.1	MediaTek Inc., Tejet, SRTC
R5-210799	Addition of new MDT TC 8.1.6.1.3.2	MediaTek Inc., Tejet, SRTC
R5-210800	Addition of new MDT TC 8.1.6.1.3.3	MediaTek Inc., Tejet, SRTC
R5-211470	Addition of new MDT test case 8.1.6.1.2.1	ZTE, SRTC, Tejet
R5-211471	Addition of new MDT test case 8.1.6.1.2.2	ZTE, SRTC, Tejet
R5-211472	Addition of new MDT test case 8.1.6.1.2.3	ZTE, SRTC, Tejet
R5-211473	Addition of new MDT test case 8.1.6.1.2.7	ZTE Corporation
R5-211474	Addition of new MDT test case 8.1.6.1.2.8	ZTE Corporation
R5-211475	Addition of new MDT test case 8.1.6.1.2.12	ZTE Corporation
R5-211476	Addition of new MDT test case 8.1.6.1.2.13	ZTE Corporation
R5-211477	Addition of new test case 8.1.6.1.1.1 for NR Immediate MDT	CMCC
R5-211478	Addition of new test case 8.1.6.1.1.2 for NR L2 measurement	CMCC
R5-211479	Addition of MDT TC 8.1.6.1.4.3-CEF-intra-NR handover	Huawei, Hisilicon
R5-211480	Addition of MDT TC 8.1.6.1.4.4-CEF-RRC re-establishment	Huawei, Hisilicon
R5-211481	Addition of MDT TC 8.1.6.1.4.5-CEF-location info	Huawei, Hisilicon
R5-211482	Addition of MDT TC 8.1.6.1.4.6-CEF-intra-freq measurements	Huawei, Hisilicon
R5-211483	Addition of MDT TC 8.1.6.1.4.7-CEF-inter-freq measurements	Huawei, Hisilicon
R5-211484	Addition of MDT TC 8.1.6.1.4.8-CEF-rach failure	Huawei, Hisilicon
R5-211485	Addition of new MDT TC 8.1.6.1.3.1	MediaTek Inc., Tejet, SRTC
R5-211486	Addition of new MDT TC 8.1.6.1.3.3	MediaTek Inc., Tejet, SRTC

6.3.22.4: TS 38.523-2

TDoc	Title	Source
R5-210130	Applicability statement for new test cases for NR Immediate MDT	CMCC
R5-210315	Adding applicability for new logged MDT test cases	ZTE Corporation, CMCC
R5-210677	Correction to NR TC applicability for MDT	Huawei, Hisilicon
R5-210801	Adding applicability for new MDT test cases	MediaTek Inc., Tejet, SRTC
R5-211487	Applicability statement for new test cases for NR Immediate MDT	CMCC
R5-211488	Adding applicability for new logged MDT test cases	ZTE Corporation, CMCC
R5-211489	Correction to NR TC applicability for MDT	Huawei, Hisilicon

6.3.22.6: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210316	Update UE Positioning test mode procedures and UE Positioning messages	ZTE Corporation
R5-211490	Update UE Positioning test mode procedures and UE Positioning messages	ZTE Corporation

6.3.23.4: TS 37.571-5

TDoc	Title	Source
R5-210053	Addition of support for BDS B1C signal	Spirent Communications, CATT, CAICT
R5-211340	Addition of support for BDS B1C signal	Spirent Communications, CATT, CAICT

6.3.24.1: TS 38.508-1

TDoc	Title	Source
R5-210421	Addition of Cell configurations for 5G-SRVCC from NG-RAN to UTRAN	CATT, TDIA
R5-211491	Addition of Cell configurations for 5G-SRVCC from NG-RAN to UTRAN	CATT, TDIA

6.3.24.2: TS 38.508-2

TDoc	Title	Source
R5-210622	Introduciton of general capability for NR to UTRA-FDD CELL_DCH CS handover	CATT, TDIA
R5-211492	Introduciton of general capability for NR to UTRA-FDD CELL_DCH CS handover	CATT, TDIA

6.3.24.3: TS 38.523-1

TDoc	Title	Source
R5-210412	Addition of a new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN	CATT, TDIA
R5-210678	Addition of 5G SRVCC TC 8.1.3.2.6-NR to UMTS Inter-RAT measurements-Event B1	Huawei, Hisilicon
R5-210679	Addition of 5G SRVCC TC 8.1.3.2.7-NR to UMTS Inter-RAT measurements-Event B2	Huawei, Hisilicon
R5-211493	Addition of a new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN	CATT, TDIA
R5-211494	Addition of 5G SRVCC TC 8.1.3.2.6-NR to UMTS Inter-RAT measurements-Event B1	Huawei, Hisilicon
R5-211495	Addition of 5G SRVCC TC 8.1.3.2.7-NR to UMTS Inter-RAT measurements-Event B2	Huawei, Hisilicon

6.3.24.4: TS 38.523-2

TDoc	Title	Source
R5-210413	Addition of the applicability for new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN	CATT, TDIA
R5-210564	Introduction of applicability for SRVCC from NG-RAN to 3GPP UTRAN	CATT, TDIA, Huawei, Hisilicon
R5-210680	Correction to NR TC applicability for 5G SRVCC	Huawei, Hisilicon
R5-211496	Introduction of applicability for SRVCC from NG-RAN to 3GPP UTRAN	CATT, TDIA, Huawei, Hisilicon

6.4.1: TS 38.508-1

TDoc	Title	Source
R5-210186	Update global conditions	Ericsson
R5-210263	Editorial update IE PhysicalCellGroupConfig	Ericsson
R5-210327	Update FailureInformation message	Ericsson
R5-210359	Editorial update SidelinkUEInformationNR message	Ericsson
R5-210394	Editorial update UEAssistanceInformation message	Ericsson
R5-210414	Update UECapabilityEnquiry message	Ericsson
R5-210616	Editorial update DLDedicatedMessageSegment message	Ericsson
R5-210805	Update IE SemiStaticChannelAccessConfig	Ericsson
R5-210812	Update IE ServingCellConfig	Ericsson
R5-210825	Editorial update IE SSB-MTC	Ericsson
R5-211165	Introduction of support for URLLC	Ericsson
R5-211166	Addition of QoS for URLLC	Ericsson
R5-211167	Updates to REGISTRATION ACCEPT message	Ericsson
R5-211168	Updates to PDU SESSION ESTABLISHMENT ACCEPT message	Ericsson
R5-211169	Addition of URSP details	Ericsson
R5-211170	Editorial update to BandCombinationListSidelink IE	Ericsson
R5-211204	Editorial update IE BWP	Ericsson
R5-211357	Addition of URSP details	Ericsson
R5-211497	Editorial update IE PhysicalCellGroupConfig	Ericsson
R5-211498	Introduction of support for URLLC	Ericsson
R5-211499	Addition of QoS for URLLC	Ericsson

6.4.4.4.1.4: RRC Handover (clause 8.1.4)

TDoc	Title	Source
R5-210200	Corrections to test case 8.1.4.2.1.2	MCC TF160

6.4.4.4.1.5: RRC Others (clause 8.1.5)

TDoc	Title	Source
R5-210028	Update test case 8.1.5.1.1 to add UE capability nr-HO-ToEN-DC-r16	China Telecommunications
R5-211500	Update test case 8.1.5.1.1 to add UE capability nr-HO-ToEN-DC-r16	China Telecommunications

6.4.4.4.2.1: RRC UE Capability / Others (clause 8.2.1)

TDoc	Title	Source
R5-210027	Update of test case 8.2.1.1.1 to support Inter-RAT handover from NR to EN-DC	China Telecommunications
R5-211501	Update of test case 8.2.1.1.1 to support Inter-RAT handover from NR to EN-DC	China Telecommunications

6.4.4.6: 5GS Non-3GPP Access Mobility Management (clause 9.2)

TDoc	Title	Source
R5-210808	Correction to 5GS Non-3GPP Access Test Case 9.2.2.2	ZTE Corporation
R5-210809	Correction to 5GS Non-3GPP Access Test Case 9.2.4.1	ZTE Corporation
R5-210810	Correction to 5GS Non-3GPP Access Test Case 9.2.5.1.4	ZTE Corporation
R5-210811	Correction to 5GS Non-3GPP Access Test Case 9.2.5.2.1	ZTE Corporation
R5-211321	Voiding 5GS Non-3GPP Access Test Case 9.2.5.2.1	ZTE Corporation
R5-211502	Correction to 5GS Non-3GPP Access Test Case 9.2.2.2	ZTE Corporation

6.4.4.11.1: EPS Fallback

TDoc	Title	Source
R5-210344	Introduction of a new test case for voice fallback indication under EPS Fallback with handover	CATT, TDIA
R5-211503	Introduction of a new test case for voice fallback indication under EPS Fallback with handover	CATT, TDIA

6.4.5: TS 38.523-2

TDoc	Title	Source
R5-210184	Update of applicability for RRC TC 8.1.3.1.21 and 8.1.4.2.1.2	MediaTek Inc.
R5-210345	Update to applicabilities for the EPS fallback test cases	CATT, TDIA
R5-210998	Correction to applicability conditions of test cases 8.1.4.2.1.2 and 11.1.9	Qualcomm Incorporated, MCC TF160
R5-211327	Remove applicability of 5GS Non-3GPP Access Test Case 9.2.5.2.1	ZTE Corporation
R5-211504	Update to applicabilities for the EPS fallback test cases	CATT, TDIA

6.4.7: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210155	TS 38.523-1 Tracker status before RAN5#90-e	Samsung (Rapporteur)
R5-210581	Discussion to add test cases for RRC DL segmentation	MediaTek Inc.
R5-211310	Discussion to add test cases for RRC DL segmentation	MediaTek Inc.

6.5.1: Routine Maintenance for TS 36.508

TDoc	Title	Source
R5-210071	Correction to emergency bearer service over S1 for eCall test cases	Keysight Technologies UK, Qualcomm
R5-210201	MCPTT Packet Filter	MCC TF160
R5-211203	Editorial for Table 6.6.2-10 Reference packet filter #9	NIST
R5-211320	Correction to Test frequencies for NB-IoT FDD MFBI	ANRITSU LTD
R5-211505	Correction to emergency bearer service over S1 for eCall test cases	Keysight Technologies UK, Qualcomm
R5-211506	Editorial for Table 6.6.2-10 Reference packet filter #9	NIST
R5-211507	Correction to Test frequencies for NB-IoT FDD MFBI	ANRITSU LTD

6.5.2: Routine Maintenance for TS 36.509

TDoc	Title	Source
R5-210518	Clarification of DRB identity in CLOSE UE TEST LOOP message in 36.509	Anritsu
R5-211508	Clarification of DRB identity in CLOSE UE TEST LOOP message in 36.509	Anritsu

6.5.3.1: Idle Mode

TDoc	Title	Source
R5-210142	Editorial updates of TS 36.523-1 Section 6	Samsung
R5-210681	Correction to LTE TC 6.1.1.2a	Huawei, Hisilicon, MCC TF160
R5-210682	Correction to LTE TC 6.1.1.6a	Huawei, Hisilicon, MCC TF160
R5-210683	Addition of LTE TC 6.1.1.6b	Huawei, Hisilicon, MCC TF160
R5-210684	Correction to LTE TC 6.1.2.3	Huawei, Hisilicon, MCC TF160
R5-210685	Correction to LTE TC 6.1.2.12	Huawei, Hisilicon, MCC TF160
R5-211341	Editorial updates of TS 36.523-1 Section 6	Samsung
R5-211342	Correction to LTE TC 6.1.1.6a	Huawei, Hisilicon, MCC TF160

6.5.3.2.1: MAC

TDoc	Title	Source
R5-210143	Editorial updates of TS 36.523-1 Section 7.1	Samsung
R5-211343	Editorial updates of TS 36.523-1 Section 7.1	Samsung

6.5.3.3.1: RRC Part 1 (clauses 8.1 and 8.5)

TDoc	Title	Source
R5-210144	Editorial updates of TS 36.523-1 Sections 8.1 and 8.2	Samsung
R5-211344	Editorial updates of TS 36.523-1 Sections 8.1 and 8.2	Samsung

6.5.3.3.2: RRC Part 2 (clause 8.2)

TDoc	Title	Source
R5-211023	Correction to LTE test case 8.2.4.1 for CAT-M mode UEs	ROHDE & SCHWARZ
R5-211345	Correction to LTE test case 8.2.4.1 for CAT-M mode UEs	ROHDE & SCHWARZ

6.5.3.3.3: RRC Part 3 (clause 8.3)

TDoc	Title	Source
R5-210145	Editorial updates of TS 36.523-1 Section 8.3	Samsung
R5-211346	Editorial updates of TS 36.523-1 Section 8.3	Samsung

6.5.3.3.4: Inter-RAT (clauses 8.4 & 8.4A)

TDoc	Title	Source
R5-210146	Editorial updates of TS 36.523-1 Section 8.4	Samsung
R5-211347	Editorial updates of TS 36.523-1 Section 8.4	Samsung

6.5.3.3.5: RRC LTE MDT (clause 8.6)

TDoc	Title	Source
R5-210042	Editorial TC BT measurement collection in Immediate MDT to the correct subclause	CMCC
R5-210043	Editorial TC BT measurement collection in Logged MDT to the correct subclause	CMCC
R5-210044	Editorial TC BT measurement collection in RLF logging to the correct subclause	CMCC
R5-210045	Editorial TC WLAN measurement collection in RLF logging to the correct subclause	CMCC
R5-210046	Editorial TC BT measurement collection in CEF logging to the correct subclause	CMCC
R5-210047	Editorial TC WLAN measurement collection in CEF logging to the correct subclause	CMCC
R5-210048	Update of TC WLAN measurement collection in Immediate MDT for specific sys infos	CMCC
R5-210049	Update of TC WLAN measurement collection in Logged MDT for specific sys infos	CMCC
R5-211509	Update of TC WLAN measurement collection in Immediate MDT for specific sys infos	CMCC
R5-211510	Update of TC WLAN measurement collection in Logged MDT for specific sys infos	CMCC

6.5.3.4: EPS Mobility Management

TDoc	Title	Source
R5-210147	Editorial updates of TS 36.523-1 Section 9	Samsung
R5-211348	Editorial updates of TS 36.523-1 Section 9	Samsung

6.5.3.5: EPS Session Management

TDoc	Title	Source
R5-210148	Editorial updates of TS 36.523-1 Sections 10 to 13	Samsung
R5-211205	Correction to Test Case 10.2.2	NIST
R5-211349	Editorial updates of TS 36.523-1 Sections 10 to 13	Samsung
R5-211511	Correction to Test Case 10.2.2	NIST

6.5.3.8: Multilayer Procedures

TDoc	Title	Source
R5-210153	Update to TC 13.1.22 MCPTT / Attach / Call setup CO	Samsung
R5-211512	Update to TC 13.1.22 MCPTT / Attach / Call setup CO	Samsung

6.5.3.11: Others (TS 36.523-1 clauses not covered by other AIs under AI 6.5.3 / e.g. eMBMS / Home (e)NB / MBMS in LTE / D2D / SC-PTM / NB-IoT / CIoT...)

TDoc	Title	Source
R5-210149	Editorial updates of TS 36.523-1 Sections 15, 17 and 19	Samsung
R5-210150	Editorial updates of TS 36.523-1 Sections 22 and 24	Samsung
R5-210556	Adding specs to References in TS 36.523-1	Samsung
R5-211350	Editorial updates of TS 36.523-1 Sections 15, 17 and 19	Samsung
R5-211513	Editorial updates of TS 36.523-1 Sections 22 and 24	Samsung
R5-211514	Adding specs to References in TS 36.523-1	Samsung

6.5.4: Routine Maintenance for TS 36.523-2

TDoc	Title	Source
R5-210024	Correction to test cases 22.3.1.6a, 22.3.1.9 and 22.3.2.7	ROHDE & SCHWARZ, Nordic Semiconductor, Verizon, Telstra
R5-210050	Update of LTE_MDT_BT_WLAN test cases for PICS definition	CMCC
R5-210151	Aligning content of 36.523-2 with 36.523-1	Samsung
R5-210154	Adding applicability for TC 13.1.22 MCPTT / Attach / Call setup CO	Samsung
R5-210686	Addition of LTE TC applicability	Huawei, Hisilicon, MCC TF160
R5-211351	Aligning content of 36.523-2 with 36.523-1	Samsung
R5-211352	Adding applicability for TC 13.1.22 MCPTT / Attach / Call setup CO	Samsung
R5-211368	Correction to test cases 22.3.1.6a, 22.3.1.9 and 22.3.2.7	ROHDE & SCHWARZ, Nordic Semiconductor, Verizon, Telstra
R5-211515	Addition of LTE TC applicability	Huawei, Hisilicon, MCC TF160

6.5.6: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210140	TS 36.523-1 Tracker status before RAN5#90-e	Samsung (Rapporteur)
R5-211322	Testing Early implementation of Rel-14 NB-IoT Features “Category NB2”, and “twoHARQ-Processes-r14”	ROHDE & SCHWARZ, Nordic Semiconductor, Verizon, Telstra

6.6.6.1: TS 34.229-1

TDoc	Title	Source
R5-210060	Voiding generic procedures for text call	ROHDE & SCHWARZ
R5-210061	Voiding SigComp test cases	ROHDE & SCHWARZ
R5-210202	Corrections to SMS test case 18.b1, Annexes A.7.2 and A.7.8	MCC TF160
R5-210323	Correction to annexure A.3.1	Keysight Technologies UK, MCC TF160, Qualcomm
R5-210324	Clarification of conditions used in INVITE for eCall setup	Keysight Technologies UK, MCC TF160, Qualcomm
R5-210992	Correction to XCAP test case 15.5	Qualcomm Incorporated
R5-211353	Correction to annexure A.3.1	Keysight Technologies UK, MCC TF160, Qualcomm

6.6.6.3: TS 34.229-3

TDoc	Title	Source
R5-210203	Routine maintenance for TS 34.229-3	MCC TF160

6.6.7.1: TS 37.571-2

TDoc	Title	Source
R5-210258	Definition of values for epdu fields	PCTEST Engineering Laboratory
R5-210260	Corrections and clarifications to default MBS, WLAN and Sensor assistance data in clause 5.4.1	PCTEST Engineering Laboratory
R5-211298	Corrections for support of multiple GPS signals	Spirent Communications

6.6.7.2: TS 37.571-3

TDoc	Title	Source
R5-210261	Deletion of PICS for wlan-AP-Identifier	PCTEST Engineering Laboratory

6.6.7.4: TS 37.571-5

TDoc	Title	Source
R5-210051	Corrections for support of multiple GPS signals	Spirent Communications
R5-211516	Corrections for support of multiple GPS signals	Spirent Communications

6.6.9.1: TS 36.579-1

TDoc	Title	Source
R5-210204	Addition of a generic procedure for MCPTT radio bearer establishment for use of pre-established session	MCC TF160
R5-210205	Correction to Generic Test Procedure for MCPTT CT group call establishment, manual commencement	MCC TF160
R5-210206	Correction to generic test procedure for MCPTT pre-established session establishment	MCC TF160
R5-210207	New MCPTT generic test procedures	MCC TF160, NIST, UPV/EHU, Nemergent Solutions
R5-210208	Update to Default HTTP message - POST	MCC TF160
R5-210209	Update to Default Message Content - Floor Ack, Connect, Disconnect, Acknowledge	MCC TF160
R5-210210	Update to Default Message Content - INVITE	MCC TF160
R5-210211	Update to Default Message Content - Pidf	MCC TF160
R5-210212	Update to Default Message Content - REFER and Resource-List	MCC TF160
R5-210213	Update to Default Message Content - SDP	MCC TF160
R5-210214	Update to Default Message Content - SIP 200 (OK)	MCC TF160
R5-210215	Update to Default Message Content - UPDATE	MCC TF160
R5-210216	Update to Default Message Content AFFILIATION-COMMAND	MCC TF160
R5-210217	Update to Default Message Content MIKEY-SAKKE I_MESSAGE	MCC TF160
R5-210218	Update to Default Message Content SIP 180 (Ringing) and SIP 183 (Session progress)	MCC TF160
R5-210219	Update to Default Message Content SIP MESSAGE	MCC TF160
R5-210220	Update to Default Message Content SUBSCRIBE	MCC TF160
R5-210221	Update to the MCS GKTP document	MCC TF160
R5-210319	Update to references clause	MCC TF160
R5-210551	MCPTT Info Corrections	UPV/EHU, Nemergent Solutions, MCC TF160
R5-210994	Update to default MCPTT media plane control messages	MCC TF160
R5-211044	Update of References in 36.579-1	Samsung
R5-211152	Updates to global conditions used in default messages	MCC TF160
R5-211354	Update of References in 36.579-1	Samsung
R5-211517	Addition of a generic procedure for MCPTT radio bearer establishment for use of pre-established session	MCC TF160
R5-211518	Correction to generic test procedure for MCPTT pre-established session establishment	MCC TF160
R5-211519	Update to Default Message Content - REFER and Resource-List	MCC TF160
R5-211520	MCPTT Info Corrections	UPV/EHU, Nemergent Solutions, MCC TF160

6.6.9.2: TS 36.579-2

TDoc	Title	Source
R5-210222	Correction to MCPTT Test Case 5.1	MCC TF160
R5-210223	Correction to MCPTT Test Case 5.3	MCC TF160
R5-210224	Correction to MCPTT Test Case 5.4	MCC TF160
R5-210225	Correction to MCPTT Test Case 6.1.1.1	MCC TF160
R5-210226	Correction to MCPTT Test Case 6.1.1.10	MCC TF160, NIST, UPV/EHU, Nemergent Solutions
R5-210227	Correction to MCPTT Test Case 6.1.1.11	MCC TF160
R5-210228	Correction to MCPTT Test Case 6.1.1.12	MCC TF160
R5-210229	Correction to MCPTT Test Case 6.1.1.13	MCC TF160
R5-210230	Correction to MCPTT Test Case 6.1.1.14	MCC TF160
R5-210231	Correction to MCPTT Test Case 6.1.1.2	MCC TF160
R5-210232	Correction to MCPTT Test Case 6.1.1.3	MCC TF160
R5-210233	Correction to MCPTT Test Case 6.1.1.5	MCC TF160
R5-210234	Correction to MCPTT Test Case 6.1.1.8	MCC TF160
R5-210235	Correction to MCPTT Test Case 6.1.1.9	MCC TF160
R5-210236	Correction to MCPTT Test Case 6.1.2.10	MCC TF160
R5-210237	Correction to MCPTT Test Case 6.1.2.11	MCC TF160
R5-210238	Correction to MCPTT Test Case 6.1.2.12	MCC TF160
R5-210239	Correction to MCPTT Test Case 6.1.2.7	MCC TF160
R5-210240	Correction to MCPTT Test Case 6.1.2.8	MCC TF160
R5-210241	Correction to MCPTT Test Case 6.1.2.9	MCC TF160
R5-210242	Correction to MCPTT Test Case 6.2.1	MCC TF160
R5-210243	Correction to MCPTT Test Case 6.2.14	MCC TF160
R5-210244	Correction to MCPTT Test Case 6.2.15	MCC TF160
R5-210245	Correction to MCPTT Test Case 6.2.16	MCC TF160
R5-210246	Correction to MCPTT Test Case 6.2.17	MCC TF160
R5-210247	Correction to MCPTT Test Case 6.2.2	MCC TF160
R5-210248	Correction to MCPTT Test Case 6.2.3	MCC TF160
R5-210249	Correction to MCPTT Test Case 6.2.4	MCC TF160
R5-210250	Correction to MCPTT Test Case 6.2.5	MCC TF160
R5-210251	Correction to MCPTT Test Case 6.2.6	MCC TF160
R5-210252	Correction to MCPTT Test Case 6.2.7	MCC TF160
R5-210253	Correction to MCPTT Test Case 6.2.8	MCC TF160
R5-211521	Correction to MCPTT Test Case 5.3	MCC TF160
R5-211522	Correction to MCPTT Test Case 5.4	MCC TF160
R5-211523	Correction to MCPTT Test Case 6.1.1.1	MCC TF160
R5-211524	Correction to MCPTT Test Case 6.1.1.10	MCC TF160, NIST, UPV/EHU, Nemergent Solutions
R5-211525	Correction to MCPTT Test Case 6.1.1.2	MCC TF160
R5-211526	Correction to MCPTT Test Case 6.1.1.5	MCC TF160
R5-211527	Correction to MCPTT Test Case 6.1.1.8	MCC TF160
R5-211528	Correction to MCPTT Test Case 6.1.2.10	MCC TF160
R5-211529	Correction to MCPTT Test Case 6.1.2.11	MCC TF160
R5-211530	Correction to MCPTT Test Case 6.1.2.12	MCC TF160
R5-211531	Correction to MCPTT Test Case 6.1.2.7	MCC TF160
R5-211532	Correction to MCPTT Test Case 6.1.2.8	MCC TF160
R5-211533	Correction to MCPTT Test Case 6.1.2.9	MCC TF160
R5-211534	Correction to MCPTT Test Case 6.2.1	MCC TF160
R5-211535	Correction to MCPTT Test Case 6.2.14	MCC TF160
R5-211536	Correction to MCPTT Test Case 6.2.15	MCC TF160
R5-211537	Correction to MCPTT Test Case 6.2.16	MCC TF160
R5-211538	Correction to MCPTT Test Case 6.2.17	MCC TF160
R5-211539	Correction to MCPTT Test Case 6.2.2	MCC TF160
R5-211540	Correction to MCPTT Test Case 6.2.3	MCC TF160
R5-211541	Correction to MCPTT Test Case 6.2.4	MCC TF160
R5-211542	Correction to MCPTT Test Case 6.2.5	MCC TF160
R5-211543	Correction to MCPTT Test Case 6.2.6	MCC TF160
R5-211544	Correction to MCPTT Test Case 6.2.7	MCC TF160

6.6.9.4: TS 36.579-4

TDoc	Title	Source
R5-210254	Addition of missing MCX PICS	MCC TF160
R5-211254	Adding an MCPTT test case to the applicability table	NIST
R5-211545	Addition of missing MCX PICS	MCC TF160

6.6.9.5: TS 36.579-5

TDoc	Title	Source
R5-210255	Routine maintenance for TS 36.579-5	MCC TF160

6.6.9.6: TS 36.579-6

TDoc	Title	Source
R5-211250	Correction to MCVideo Test Case 6.1.1.9	NIST
R5-211269	Correction to MCVideo Test Case 6.2.6	NIST
R5-211546	Correction to MCVideo Test Case 6.1.1.9	NIST

6.6.9.7: TS 36.579-7

TDoc	Title	Source
R5-211271	Editorial for correcting heading styles	NIST
R5-211355	Editorial for correcting heading styles	NIST

6.6.9.9: Discussion Papers / Work Plan / TC lists

TDoc	Title	Source
R5-210256	Handling of optional KMS request security	MCC TF160
R5-210257	Issues with pre-established sessions	MCC TF160
R5-211039	Issues with pre-established session establishment	UPV/EHU, Nemergent Solutions

6.7: Outgoing liaison statements for provisional approval

TDoc	Title	Source
R5-211311	LS on confirming successful resource reservation	TSG WG RAN5