TDoc | Title | Source |
---|---|---|
R5-232020 | Agenda - opening session | WG Chairman |
R5-232023 | RAN5#99 Session Programme | WG Chairman |
R5-232774 | Agenda - opening session | WG Chairman |
TDoc | Title | Source |
---|---|---|
R5-232024 | RAN5 Leadership Team | WG Chairman |
R5-232025 | RAN5#98 WG Minutes | ETSI Secretariat |
R5-232026 | RAN5#98 WG Action Points | ETSI Secretariat |
R5-232027 | Latest RAN Plenary notes | WG Chairman |
R5-232028 | Latest RAN Plenary draft Report | WG Chairman |
R5-232029 | Post Plenary Active Work Item update | ETSI Secretariat |
R5-232190 | MCC TF160 Status Report | MCC TF160 |
R5-233301 | RAN5#98 WG Minutes | ETSI Secretariat |
R5-233302 | MCC TF160 Status Report | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232030 | RAN5 SR to RP#99 | WG Chairman |
R5-232031 | TF160 SR to RP#99 | WG Chairman |
R5-232760 | GCF 3GPP TCL after GCF CAG#74 | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232040 | Reply LS from CT6 to review mandate of the implementation of UI/MMI features for Wearable form factor. | TSG WG CT6 |
R5-232042 | Reply LS to ETSI TC MSG/TFES on NR TRP and TRS requirements | TSG WG RAN4 |
R5-232044 | Reply to LS to 3GPP on ECC request for standardisation support related to ECC Decision (22)07 on “harmonised framework on aerial UE usage in MFCN harmonised bands” | TSG RAN |
R5-232045 | LS Reply on ECC request for standardisation support related to ECC Decision (22)07 on “harmonised framework on aerial UE usage in MFCN harmonised bands” | TSG WG SA2 |
R5-232048 | Non-Support of Ciphering Algorithm GEA2 | GCF SG |
R5-232049 | NR Bandwidth for OTA TRS testing | GSMA TSGAP |
TDoc | Title | Source |
---|---|---|
R5-232261 | New WID on UE Conformance - High-power UE operation for fixed-wireless/vehicle-mounted use cases in LTE bands and NR bands | Nokia, Nokia Shanghai Bell |
R5-232299 | New WID on UE Conformance - High power UE (power class 2) for NR FR1 FDD single band | China Unicom |
R5-232335 | New WID on UE Conformance - IMS voice service support and network usability guarantee for UE’s E-UTRA capability disabled scenario in 5GS | China Telecom |
R5-232415 | New WID on UE Conformance - Rel-18 High Power UE for NR CA and DC; and NR and LTE DC Configurations | China Telecom |
R5-232826 | New WID on UE Conformance - High power UE (power class 1.5) for NR FR1 TDD single band | CMCC, Huawei, HiSilicon |
R5-232894 | New WID on UE Conformance – Multi-carrier enhancements for NR | China Telecom, Huawei, HiSilicon |
R5-233063 | New WID for IMS Data Channel test | Huawei, Hisilicon |
R5-233105 | New WID on UE Conformance - Rel-17 Power Class 2 UE for NR inter-band CA/DC with or without SUL configurations with x (6>=x>2) bands DL and y (y=1, 2) bands UL | Huawei, HiSilicon |
R5-233106 | New WID on UE Conformance - Rel-18 NR CA and DC; and NR and LTE DC Configurations | Huawei, HiSilicon, CMCC |
R5-233107 | New WID on UE Conformance - New Rel-18 NR licensed bands and extension of existing NR bands | Huawei, HiSilicon, China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232446 | Discussion on sending/receiving test mode commands/acknowledgement in RRC INACTIVE state | Nokia, Nokia Shanghai Bell |
R5-233056 | WF on creating Rel-18 basket Wis | Huawei, HiSilicon, China Telecom, CMCC, China Unicom, Nokia, ZTE, CATT, CAICT |
R5-233303 | WF on creating Rel-18 basket Wis | Huawei, HiSilicon, China Telecom, CMCC, China Unicom, Nokia, ZTE, CATT, CAICT |
TDoc | Title | Source |
---|---|---|
R5-232745 | Discussion on GNSS emulation for NTN | Rohde & Schwarz |
R5-233062 | Discussion paper on IMS Data Channel test | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232032 | RAN5#99 LS Template | WG Chairman |
TDoc | Title | Source |
---|---|---|
R5-232033 | Meeting schedule for 2023-24 | WG Chairman |
TDoc | Title | Source |
---|---|---|
R5-232021 | Agenda - midweek session | WG Chairman |
TDoc | Title | Source |
---|---|---|
R5-232520 | NR NTN test frequencies for n255 | |
R5-232990 | Correction to frequency range for ssb-PositionsInBurst | Anritsu |
R5-233200 | Discussion – Software Implementation of NR Applicability Specifications | Qualcomm CDMA Technologies |
R5-233675 | Update to TS 38.508-1 clause 4.6.3-200BB for FR2 UL Gaps IE | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232041 | Reply LS on 15 dBm output power requirement for NS_41 | TSG WG RAN4 |
R5-232043 | Reply LS on lower humidity limit in normal temperature test environment | TSG WG RAN4 |
R5-232046 | Reply LS on FR2 RLM/BFD and beam sweeping from multiple directions | TSG WG RAN4 |
R5-232047 | LS on clarification of test configurations for CA/DC MSD requirements | TSG WG RAN4 |
R5-233220 | Discussion on lower humidity limit of test environment in RAN5 | ZTE Corporation, Samsung R&D Institute UK |
TDoc | Title | Source |
---|---|---|
R5-232338 | Addition of test frequencies for new EN-DC comb within FR2 | KDDI Corporation |
R5-232654 | Update of NR inter-band CA configurations in FR1 for CA_n3A-n8A | China Unicom |
R5-232790 | Addition of test frequencies of CA_n39A-n41A config TC 4.3.1.1.2.1 | CMCC |
R5-232877 | Addition of new CA configuration CA-n41A-n66A-n71A | Ericsson |
R5-232895 | Addition of test frequency for new 3/4 band EN-DC comb | KT Corp. |
R5-233501 | Addition of test frequency for new 3/4 band EN-DC comb | KT Corp. |
R5-233734 | Addition of test frequency for new 3/4 band EN-DC comb | KT Corp. |
TDoc | Title | Source |
---|---|---|
R5-232108 | Introduction of CA_n28A-n78A for physical layer baseline implementation capabilities | Nokia, Nokia Shanghai Bell |
R5-232363 | Addition of UE capability for new EN-DC comb within FR2 | KDDI Corporation |
R5-232624 | Update 38.508-2 for CA_n2A-n5A and CA_n2A-n48A | Qualcomm India Pvt Ltd |
R5-232655 | Update of ICS baseline for CA_n3A-n8A | China Unicom |
R5-232793 | Addition of CA_n39A-n41A RF Baseline Implementation Capabilities | CMCC |
R5-232875 | Introduction of CA_n5A-n66A and CA_n41A-n66A-n71A. | Ericsson |
R5-232896 | Update of Table A.4.3.2B.2.3.2-2 and A.4.3.2B.2.3.3-2 for new 3/4 band EN-DC comb | KT Corp. |
R5-233503 | Update of Table A.4.3.2B.2.3.2-2 and A.4.3.2B.2.3.3-2 for new 3/4 band EN-DC comb | KT Corp. |
R5-233735 | Update of Table A.4.3.2B.2.3.2-2 and A.4.3.2B.2.3.3-2 for new 3/4 band EN-DC comb | KT Corp. |
TDoc | Title | Source |
---|---|---|
R5-232109 | Introduction of Output power requirements for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232110 | Introduction of additional maximum output power reduction for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232111 | Introduction of General spurious emissions test requirements for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232112 | Introduction of Spurious emissions for UE co-existence requirements for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232113 | Introduction of Spurious emissions for UE co-existence test requirements for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232241 | Update general spurious emissions for CA_n2A-n77A, CA_n5A-n77A, and CA_n66A-n77A | Verizon |
R5-232413 | Addition of general spurious emissions for CA_n1A-n3A | China Unicom |
R5-232414 | Addition of Spurious emissions for UE co-existence for CA_n1A-n3A | China Unicom |
R5-232625 | Update 6.2A.4.0.2.3 for CA_n2A-n5A and CA_n2A-n48A | Qualcomm India Pvt Ltd |
R5-232791 | Update of delta TIB,c for CA_n39A-n41A | CMCC |
R5-233166 | Correction for CA_n66A-n71A | ROHDE & SCHWARZ |
R5-233510 | Introduction of additional maximum output power reduction for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-233511 | Introduction of Spurious emissions for UE co-existence requirements for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-233532 | Correction for CA_n66A-n71A | ROHDE & SCHWARZ |
TDoc | Title | Source |
---|---|---|
R5-232242 | Update minimum requirement table for reference sensitivity exceptions and uplink/downlink configurations due to harmonic mixing from a PC3 aggressor | Verizon, Qualcomm, Ericsson |
R5-232243 | Update inter-band NR CA PC3 reference sensitivity test configuration and test requirement tables | Verizon Switzerland AG, Qualcomm, Ericsson |
R5-232276 | Addition of refsence sensitivity for n28A-n77A | KDDI Corporation |
R5-232340 | Update for CA_n2A-n48A and CA_n2A-n77A combos in section 7.3A.0 | Keysight Technologies UK Ltd |
R5-232341 | Corrections for certain FR1 combos in section 7.3A.1_1 | Keysight Technologies UK Ltd |
R5-232411 | Addition of 7.3A.1 for CA_n1A-n8A and CA_n3A-n8A | CU Digital Technology |
R5-232559 | Correction UL RB configuration for CA_n1-n3-n78 | MediaTek Beijing Inc. |
R5-232792 | Update of delta RIB,c for CA_n39A-n41A | CMCC |
R5-232873 | Editorial changes in Table 7.3A.1.5-1 | Ericsson |
R5-232874 | Correction of delta RIB,c , Core spec alignment | Ericsson |
R5-232879 | Addition of Delta RIB,c for CA_n41A-n66A-n71A | Ericsson |
R5-232880 | Addition of CA_n41A-n66A-n71A in Table 7.3A.2.5-1 | Ericsson |
R5-233533 | Update for CA_n2A-n48A and CA_n2A-n77A combos in section 7.3A.0 | Keysight Technologies UK Ltd |
R5-233534 | Editorial changes in Table 7.3A.1.5-1 | Ericsson |
R5-233705 | Update minimum requirement table for reference sensitivity exceptions and uplink/downlink configurations due to harmonic mixing from a PC3 aggressor | Verizon, Qualcomm, Ericsson |
R5-233706 | Correction UL RB configuration for CA_n1-n3-n78 | MediaTek Beijing Inc. |
TDoc | Title | Source |
---|---|---|
R5-232408 | General updates of clause 5 for R16 CADC configurations | CU Digital Technology, Ericsson, CMCC, Rohde&Schwarz |
R5-233535 | General updates of clause 5 for R16 CADC configurations | CU Digital Technology, Ericsson, CMCC, Rohde&Schwarz |
R5-233555 | General updates of clause 5 for R16 CA configurations | CU Digital Technology, Ericsson, CMCC, Rohde&Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232447 | Addition of new CADC MOP TC | Intertek, CMCC |
R5-232448 | Addition of new CADC TC 6.3B.3.4_1.1 | Intertek, CMCC |
R5-233563 | Addition of new CADC MOP TC | Intertek, CMCC |
R5-233564 | Addition of new CADC TC 6.3B.3.4_1.1 | Intertek, CMCC |
TDoc | Title | Source |
---|---|---|
R5-232609 | Update Ref sense for DC_7A_n66A DC_7A_n71A DC_7A_n77A and DC_66A_n25A | Qualcomm India Pvt Ltd |
R5-233157 | Update 7.3B.3.3.1 for R16 DC combos | Qualcomm India Pvt Ltd |
R5-233216 | Corrections on test requirements for MSD due to dual uplink for EN-DC | ZTE Corporation |
R5-233576 | Corrections on test requirements for MSD due to dual uplink for EN-DC | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-233183 | Update to R16 Configuration for DC | Bureau Veritas ADT, KDDI |
TDoc | Title | Source |
---|---|---|
R5-233772 | Updates to PDSCH Performance Test cases for 102 | Qualcomm Europe Inc. S |
TDoc | Title | Source |
---|---|---|
R5-232789 | Update to R16 NR CADC configuration test cases applicability | CMCC, Intertek, Rohde&Schwarz |
R5-233736 | Update to R16 NR CADC configuration test cases applicability | CMCC, Intertek, Rohde&Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232114 | Introduction of MOP test point analysis for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232115 | Introduction of spurious emission TP analysis for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232412 | Update of spurious emission TP analysis for CA_n1A-n3A | China Unicom |
R5-232424 | Addition of spurious emission TP analysis for CA_n1A-n3A | China Unicom |
R5-232608 | Ref sensitivity TP selection for DC_7A_n66A DC_7A_n77A and DC_66A_n25A | Qualcomm India Pvt Ltd |
R5-232709 | Addition of reference sensitivity test point analysis for n28A-n77A | KDDI Corporation |
R5-232876 | Editorial in Table 4.1.3.1-2 | Ericsson |
R5-232878 | Addition of CA_n41A-n66A-n71A in sensitivity test case config table. | Ericsson |
R5-233167 | Correction of test point analysis for CA_n66A-n71A | ROHDE & SCHWARZ |
R5-233530 | Correction of test point analysis for CA_n66A-n71A | ROHDE & SCHWARZ |
TDoc | Title | Source |
---|---|---|
R5-233205 | Discussion on simplification for inter-band 2UL co-existence test | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-233091 | Adding uplink CA test frequencies for CA_n77(2A) | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-233092 | Correction to test frequency description for intra-band UL non-contiguous CA | Huawei, HiSilicon |
R5-233093 | Updating Transmit ON/OFF time mask for CA for intra-band non-contiguous CA | Huawei, HiSilicon |
R5-233236 | Clarification of UL Tx Switching in SA RF test case | Apple Inc |
R5-233515 | Updating Transmit ON/OFF time mask for CA for intra-band non-contiguous CA | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-233235 | Clarification of UL Tx Switching in EN-DC RF test case | Apple Inc |
R5-233738 | Clarification of UL Tx Switching in EN-DC RF test case | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-233094 | Updating TP analysis for Transmit ON/OFF time mask for CA | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232379 | Correction of Spurious emissions for UE co-existence requirement in 6.5E.3.2 | CAICT |
R5-232825 | Correction to Sidelink configuration for PSSCH/PSCCH | CMCC |
TDoc | Title | Source |
---|---|---|
R5-233207 | Corrections on blocking characteristics requirements for V2X | ZTE Corporation |
R5-233210 | Corrections on intermodulation characteristics requirements for V2X | ZTE Corporation |
R5-233211 | Corrections on NR V2X reference sensitivity test requirements | ZTE Corporation |
R5-233212 | Corrections on NR V2X spurious response requirements | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-232700 | Addition of 6.5E.4 Transmit intermodulation for V2X | TTA |
TDoc | Title | Source |
---|---|---|
R5-232861 | Addition of PICS for CLI test case | Qualcomm Europe Inc. Sweden |
R5-233505 | Addition of PICS for CLI test case | Qualcomm Europe Inc. Sweden |
TDoc | Title | Source |
---|---|---|
R5-232860 | Applicability update for CLI test cases | Qualcomm Europe Inc. Sweden |
R5-233731 | Applicability update for CLI test cases | Qualcomm Europe Inc. Sweden |
TDoc | Title | Source |
---|---|---|
R5-232656 | Update to CLI tests 4.6.5.1 and 6.6.6.1 with TTs | Qualcomm France |
R5-232658 | Update to CLI tests 4.7.6.1 and 6.7.8.1 with TTs | Qualcomm France |
R5-232678 | Annex E and F updates for CLI-based test cases including TTs | Qualcomm France |
R5-233648 | Update to CLI tests 4.6.5.1 and 6.6.6.1 with TTs | Qualcomm France |
R5-233649 | Update to CLI tests 4.7.6.1 and 6.7.8.1 with TTs | Qualcomm France |
R5-233650 | Annex E and F updates for CLI-based test cases including TTs | Qualcomm France |
TDoc | Title | Source |
---|---|---|
R5-232657 | Addition of TT analysis for 4.6.5.1 and 6.6.6.1 | Qualcomm France |
R5-232659 | Addition of TT analysis for 4.7.6.1 and 6.7.8.1 | Qualcomm France |
R5-233646 | Addition of TT analysis for 4.7.6.1 and 6.7.8.1 | Qualcomm France |
TDoc | Title | Source |
---|---|---|
R5-232852 | Updates to 10^-5 BLER PDSCH Demodulation test cases | Qualcomm Europe Inc. Sweden |
R5-233268 | Correction to reportQuantity value for 1Tx URLLC CQI test cases | Qualcomm Europe Inc. Sweden |
R5-233732 | Updates to 10^-5 BLER PDSCH Demodulation test cases | Qualcomm Europe Inc. Sweden |
R5-233770 | Correction to reportQuantity value for 1Tx URLLC CQI test cases | Qualcomm Europe Inc. Sweden |
TDoc | Title | Source |
---|---|---|
R5-232239 | Update inter-band NR CA 3DL configurations of CA_n2A-n5A-n77A, CA_n2A-n66A-n77A, and CA_n5A-n66A-n77A | Verizon |
R5-232748 | Update of physical layer baseline capabilities for CA_n28A-n78A | Huawei, HiSilicon |
R5-232798 | Addition of R17 new CA PC3 config RF Baseline Implementation Capabilities | CMCC |
R5-233504 | Update of physical layer baseline capabilities for CA_n28A-n78A | Huawei, HiSilicon |
R5-233529 | Update of physical layer baseline capabilities for CA_n28A-n78A | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232611 | General SE for CA_n5A-n48A | Qualcomm India Pvt Ltd |
R5-232612 | TX SE_Co_exist for CA_n5A-n48A | Qualcomm India Pvt Ltd |
R5-232614 | Update 6.2A.1.1 for CA_n5A-n48A | Qualcomm India Pvt Ltd |
R5-232616 | Update 6.2A.4.0.2.3 for CA_n5A-n48A | Qualcomm India Pvt Ltd |
R5-232796 | Update of delta TIB,c for CA_n28A-n41A-n79A | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232277 | Addition of refsence sensitivity for n41A-n77A | KDDI Corporation |
R5-232613 | Update 7.3A.1 for CA_n5A-n48A | Qualcomm India Pvt Ltd |
R5-232797 | Update of delta RIB,c for CA_n28A-n41A-n79A | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232409 | General updates of clause 5 for R17 CADC configurations | CU Digital Technology, Qualcomm |
R5-232749 | Update of applicability of simultaneous RxTx capability for CA_n28-n79 | Huawei, HiSilicon |
R5-232897 | Update of applicability of simultaneous RxTx capability for CA_n28-n79 | Huawei, HiSilicon |
R5-233213 | Corrections on supported channel bandwidths for SUL configurations | ZTE Corporation |
R5-233536 | Corrections on supported channel bandwidths for SUL configurations | ZTE Corporation |
R5-233556 | General updates of clause 5 for R17 CA configurations | CU Digital Technology, Qualcomm |
TDoc | Title | Source |
---|---|---|
R5-232349 | Editorial update Tx spurious co-existence for DC_71A_n2A | Keysight Technologies UK Ltd |
R5-232365 | Correction to spurious emissions test cases for 21A_n28A | DOCOMO Communications Lab. |
TDoc | Title | Source |
---|---|---|
R5-232772 | Addition of reference sensitivity for 21A_n28A | DOCOMO Communications Lab. |
TDoc | Title | Source |
---|---|---|
R5-233184 | Update to R17 Configuration for DC | Bureau Veritas ADT |
TDoc | Title | Source |
---|---|---|
R5-232799 | Update to R17 NR CADC configuration test cases applicability | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232364 | Correction to spurious emissions TP analysis for 21A_n28A | DOCOMO Communications Lab. |
R5-232610 | Spur_TpAnalysis for CA_n5A_n48A | Qualcomm India Pvt Ltd |
R5-232718 | Addition of reference sensitivity test point analysis for DC_21A_n28A | NTT DOCOMO INC. |
R5-233512 | Correction to spurious emissions TP analysis for 21A_n28A | DOCOMO Communications Lab. |
R5-233513 | Spur_TpAnalysis for CA_n5A_n48A | Qualcomm India Pvt Ltd |
TDoc | Title | Source |
---|---|---|
R5-232079 | Correction to PRS-RSRP test cases 16.3.2 | CATT |
R5-232080 | Addition of NR PRS-based measurement requirements for PRS-RSRP accuracy test case | CATT |
R5-232430 | Completion 16.2.1 with TT analysis results | Rohde & Schwarz |
R5-232431 | Completion 16.2.2 with TT analysis results | Rohde & Schwarz |
R5-232432 | Completion 16.3.1 with TT analysis results | ROHDE & SCHWARZ |
R5-232438 | Annex C updated for PRS-RSRP TT results | Rohde & Schwarz |
R5-232710 | Completion 16.3.1 with TT analysis results | ROHDE & SCHWARZ |
R5-233651 | Completion 16.2.1 with TT analysis results | Rohde & Schwarz |
R5-233652 | Completion 16.2.2 with TT analysis results | Rohde & Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232439 | Test applicability for PRS-RSRP test cases | Rohde & Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232078 | TT analysis for positioning test case 16.3.2 | CATT |
R5-232427 | TT analysis for TC 16.2.1 | Rohde & Schwarz |
R5-232428 | TT analysis for TC 16.2.2 | Rohde & Schwarz |
R5-232429 | TT analysis for TC 16.3.1 | Rohde & Schwarz |
TDoc | Title | Source |
---|---|---|
R5-233031 | Adding PICS for enhanced beam correspondence | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-233030 | Update to test applicability and side condition of beam correspondence | Huawei, HiSilicon |
R5-233192 | Update to connection diagram of Spurious Emissions with Power Boost test cases | Bureau Veritas ADT, Qualcomm |
R5-233717 | Update to test applicability and side condition of beam correspondence | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-233260 | Updates to FR2 CA Refsens tests | Apple Inc |
R5-233261 | Updates to FR2 CA EIS Sph Cov tests | Apple Inc |
R5-233262 | Updates to FR2 CA Max Input Level tests | Apple Inc |
R5-233559 | Updates to FR2 CA EIS Sph Cov tests | Apple Inc |
R5-233560 | Updates to FR2 CA Refsens tests | Apple Inc |
R5-233561 | Updates to FR2 CA Max Input Level tests | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-233190 | Additional editors note to Power Boost relevant test cases | Bureau Veritas ADT |
TDoc | Title | Source |
---|---|---|
R5-233032 | Update to test applicability of beam correspondence | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-233263 | Discussion paper on Rel16 FR2 RF CA tests | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232105 | Introduction of DC_1A_n79A PC2 MOP test requirements | NTT DOCOMO INC. |
R5-232257 | Introduction of DC_3A_n79A PC2 MOP test requirements | NTT DOCOMO INC. |
R5-232259 | Introduction of DC_19A_n79A PC2 MOP test requirements | NTT DOCOMO INC. |
R5-232260 | Introduction of DC_21A_n79A PC2 MOP test requirements | NTT DOCOMO INC. |
R5-232383 | Correction of the DC_28A_n78A PC2 MOP test requirements | ETSI MCC (NTT DOCOMO INC.) |
TDoc | Title | Source |
---|---|---|
R5-232226 | Update PC2 MSD minimum requirements and test requirements for DC_2A_n77A, DC_13A_n77A, and DC_66A_n77A | Verizon Switzerland AG |
R5-233703 | Update PC2 MSD minimum requirements and test requirements for DC_2A_n77A, DC_13A_n77A, and DC_66A_n77A | Verizon Switzerland AG |
TDoc | Title | Source |
---|---|---|
R5-232343 | TT and editor note update in NR-U Tx test cases for FR1 bands above 6GHz | Keysight Technologies UK Ltd |
R5-232579 | Addition of test case 6.5F.2.4.2, Shared spectrum channel access ACLR with additional requirement for NS_29 | Ericsson |
R5-232695 | Update 6.5F.3.1 General SE for NR-U | Qualcomm India Pvt Ltd |
R5-232697 | Update 6.5F.2.4.1 ACLR for NR-U | Qualcomm India Pvt Ltd |
TDoc | Title | Source |
---|---|---|
R5-232344 | TT and editor note update in NR-U Rx test cases for FR1 bands above 6GHz | Keysight Technologies UK Ltd |
R5-232636 | Update 7.1 for NR-U | Qualcomm India Pvt Ltd |
TDoc | Title | Source |
---|---|---|
R5-232345 | MU and TT definition for FR1 bands above 6GHz - Annex F update | Keysight Technologies UK Ltd |
R5-232637 | Update 5.2 note 14 for NR-U | Qualcomm India Pvt Ltd |
R5-233531 | MU and TT definition for FR1 bands above 6GHz - Annex F update | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232865 | Addition of TDD FR1 single carrier CQI reporting test cases on band with shared spectrum access | Qualcomm Europe Inc. Sweden |
R5-232866 | Addition of TDD FR1 carrier aggregation CQI reporting test cases on band with shared spectrum access | Qualcomm Europe Inc. Sweden |
R5-233600 | Addition of TDD FR1 single carrier CQI reporting test cases on band with shared spectrum access | Qualcomm Europe Inc. Sweden |
TDoc | Title | Source |
---|---|---|
R5-232580 | Addition of applicability for test case 6.5F.2.4.2 | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232663 | Addition of NR-U EN-DC SS-RSRP measurement performance test cases | Qualcomm France |
R5-232664 | Update to NR-U frequency bands | Qualcomm France |
R5-232665 | Addition of NR-U SA SS-RSRP measurement performance test cases | Qualcomm France |
R5-233621 | Addition of NR-U EN-DC SS-RSRP measurement performance test cases | Qualcomm France |
R5-233622 | Update to NR-U frequency bands | Qualcomm France |
R5-233623 | Addition of NR-U SA SS-RSRP measurement performance test cases | Qualcomm France |
TDoc | Title | Source |
---|---|---|
R5-232342 | Derive MU for FR1 bands above 6GHz - AP97.21 | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232273 | Completion of applicability for DC_CA test cases | Nokia, Nokia Shanghai Bell |
R5-233686 | Completion of applicability for DC_CA test cases | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232227 | Completion of EN-DC FR1 direct SCell activation test case | Nokia, Nokia Shanghai Bell |
R5-232228 | Completion of SA FR1 direct SCell activation test case | Nokia, Nokia Shanghai Bell |
R5-232229 | Completion of SA FR2 direct SCell activation at handover test case | Nokia, Nokia Shanghai Bell, Anritsu |
R5-232230 | Completition SA FR1 direct SCell activation at handover test case | Nokia, Nokia Shanghai Bell |
R5-232231 | Completion of SA FR2 direct SCell activation test case | Nokia, Nokia Shanghai Bell |
R5-232232 | Completion of ENDC FR2 direct SCell activation test case | Nokia, Nokia Shanghai Bell |
R5-233604 | Completion of SA FR2 direct SCell activation at handover test case | Nokia, Nokia Shanghai Bell, Anritsu |
R5-233605 | Completion of SA FR2 direct SCell activation test case | Nokia, Nokia Shanghai Bell |
R5-233606 | Completion of ENDC FR2 direct SCell activation test case | Nokia, Nokia Shanghai Bell |
R5-233747 | Completion of EN-DC FR1 direct SCell activation test case | Nokia, Nokia Shanghai Bell |
R5-233748 | Completion of SA FR1 direct SCell activation test case | Nokia, Nokia Shanghai Bell |
R5-233749 | Completition SA FR1 direct SCell activation at handover test case | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232271 | Addition of test tolerance analysis for test Case of 4.5.3.5 EN-DC FR1 direct SCell activation and test Case of 6.5.3.4 NR SA FR1 direct SCell activation | Nokia, Nokia Shanghai Bell |
R5-232272 | Grouping of test tolerance analysis for test Case 5.5.3.7 with 5.5.3.1 | Nokia, Nokia Shanghai Bell |
R5-233653 | Grouping of test tolerance analysis for test Case 5.5.3.7 with 5.5.3.1 | Nokia, Nokia Shanghai Bell |
R5-233750 | Addition of test tolerance analysis for test Case of 4.5.3.5 EN-DC FR1 direct SCell activation and test Case of 6.5.3.4 NR SA FR1 direct SCell activation | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232240 | Update inter-band NR CA PC2 configurations of CA_n2A-n77A, CA_n5A-n77A, and CA_n66A-n77A | Verizon Switzerland AG |
R5-232795 | Addition of R17 new CA PC2 configs RF Baseline Implementation Capabilities | CMCC |
R5-233508 | Update inter-band NR CA PC2 configurations of CA_n2A-n77A, CA_n5A-n77A, and CA_n66A-n77A | Verizon Switzerland AG |
R5-233509 | Addition of R17 new CA PC2 configs RF Baseline Implementation Capabilities | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232244 | Update inter-band NR CA PC2 MOP configurations for 2UL CA_n2A-n77A, CA_n5A-n77A, and CA_n66A-n77A | Verizon |
R5-233102 | Updating MOP for PC2 configuration CA_n78C | Huawei, HiSilicon |
R5-233103 | Updating MPR for PC2 configuration CA_n78C | Huawei, HiSilicon |
R5-233538 | Update inter-band NR CA PC2 MOP configurations for 2UL CA_n2A-n77A, CA_n5A-n77A, and CA_n66A-n77A | Verizon |
TDoc | Title | Source |
---|---|---|
R5-232245 | Update inter-band NR CA PC2 reference sensitivity minimum requirements for a few 2DL band configurations | Verizon Switzerland AG, Qualcomm, Ericsson |
R5-232246 | Update PC2 information for 2DL test configuration exception table and test requirement table for a few NR CA 2DL 2UL combos | Verizon, Qualcomm, Ericsson |
R5-232794 | Addition of R17 new CA PC2 configs for Ref sens exceptions TC 7.3A.0 | CMCC, Verizon |
R5-233539 | Addition of R17 new CA PC2 configs for Ref sens exceptions TC 7.3A.0 | CMCC, Verizon |
R5-233711 | Update inter-band NR CA PC2 reference sensitivity minimum requirements for a few 2DL band configurations | Verizon Switzerland AG, Qualcomm, Ericsson |
R5-233712 | Update PC2 information for 2DL test configuration exception table and test requirement table for a few NR CA 2DL 2UL combos | Verizon, Qualcomm, Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232247 | Update inter-band NR CA reference sensitivity exception cases due to UL PC2 | Verizon Switzerland AG, Qualcomm, Ericsson |
R5-233713 | Update inter-band NR CA reference sensitivity exception cases due to UL PC2 | Verizon Switzerland AG, Qualcomm, Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232802 | Update for PC2 PC3 n39 A-MPR | CMCC, Huawei |
R5-232804 | Update for PC2 n39 A-SE | CMCC |
R5-233721 | Update for PC2 PC3 n39 A-MPR | CMCC, Huawei |
TDoc | Title | Source |
---|---|---|
R5-232731 | Addition of NR FR1 bands with UL MIMO capabilities | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232732 | Addition of new test case 6.2D.2_1 UE MPR for SUL with UL MIMO | Huawei, HiSilicon |
R5-232733 | Addition of new test case 6.2D.3_1 UE A-MPR for SUL with UL MIMO | Huawei, HiSilicon |
R5-232734 | Addition of new test case 6.4D.2.2_1 Carrier leakage for SUL with UL MIMO | Huawei, HiSilicon |
R5-232735 | Addition of new test case 6.4D.2.3_1 In-band emissions for SUL with UL MIMO | Huawei, HiSilicon |
R5-232736 | Addition of new test case 6.5D.2.4.1_1 NR ACLR for SUL with UL MIMO | Huawei, HiSilicon |
R5-232737 | Addition of new test case 6.5D.2.4.2_1 UTRA ACLR for SUL with UL MIMO | Huawei, HiSilicon |
R5-232738 | Addition of new test case 6.5D.3_2.1 General spurious emissions | Huawei, HiSilicon |
R5-232739 | Addition of new test case 6.5D.3_2.2 Spurious emissions for UE co-existence | Huawei, HiSilicon |
R5-232740 | Addition of new test case 6.5D.3_2.3 Additional spurious emissions | Huawei, HiSilicon |
R5-233100 | Updating test case AMPR for UL MIMO | Huawei, HiSilicon |
R5-233101 | Updating PUCCH configuration in Aggregate power tolerance for SUL with UL MIMO | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232741 | Addition of Annex F for new test cases for SUL with UL MIMO | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232742 | Addition of test applicability for SUL test cases with UL MIMO | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232803 | TP analysis for PC2 PC3 n39 A-MPR and A-SE | CMCC |
R5-232805 | TP analysis for PC2 n39 A-SE | CMCC |
R5-233516 | TP analysis for PC2 PC3 n39 A-MPR and A-SE | CMCC |
R5-233528 | TP analysis for PC2 PC3 n39 A-MPR and A-SE | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232723 | Correction to default P-Max value for Power Class 1.5 UEs | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232378 | Correction of Spurious emissions for UE co-existence requirement in 6.5G.3.2 | CAICT |
R5-232724 | Update of 6.4G.2.4 EVM equalizer spectrum flatness for Tx Diversity | Huawei, HiSilicon |
R5-232725 | Update of 6.5G.2.3.1 NR ACLR for checking TxD capability | Huawei, HiSilicon |
R5-233173 | Correction of ON/OFF time mask for Tx Diversity | ROHDE & SCHWARZ |
R5-233540 | Correction of ON/OFF time mask for Tx Diversity | ROHDE & SCHWARZ |
R5-233720 | Update of 6.4G.2.4 EVM equalizer spectrum flatness for Tx Diversity | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232726 | Addition of abbreviation and clause 4 general description for Tx diversity | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232159 | PC5 - MOP test cases update in 38.521-2 | Keysight Technologies UK Ltd |
R5-233631 | PC5 - MOP test cases update in 38.521-2 | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232160 | PC5 MU - definition for MOP test cases in 38.903 | Keysight Technologies UK Ltd |
R5-233632 | PC5 MU - definition for MOP test cases in 38.903 | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232158 | On FR2 PC5 MU analysis | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-233251 | Addition of new FR1 phase continuity test | Apple Inc |
R5-233537 | Addition of new FR1 phase continuity test | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-233252 | Update to FR2 RF phase continuity test | Apple Inc |
R5-233551 | Update to FR2 RF phase continuity test | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-233250 | Addition of applicability for FR2 RF phase continuity test | Apple Inc |
R5-233687 | Addition of applicability for FR2 RF phase continuity test | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232929 | Capability of REL17 Relaxed measurements in IDLE for RedCap | Ericsson |
R5-233034 | Adding PICS of PC7 | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232124 | Adding RedCap UE FR2 PC7 Carrier leakage requirement | Nokia, Nokia Shanghai Bell |
R5-232125 | Adding RedCap UE FR2 PC7 In-band emissions requirement | Nokia, Nokia Shanghai Bell |
R5-232622 | Adding FR2 Redcap PC7 to Tx Test Config Tables | Qualcomm Tech. Netherlands B.V |
R5-233033 | Adding side condition of beam correspondence for PC7 | Huawei, HiSilicon |
R5-233552 | Adding RedCap UE FR2 PC7 Carrier leakage requirement | Nokia, Nokia Shanghai Bell |
R5-233553 | Adding RedCap UE FR2 PC7 In-band emissions requirement | Nokia, Nokia Shanghai Bell |
R5-233554 | Adding side condition of beam correspondence for PC7 | Huawei, HiSilicon |
R5-233557 | Adding FR2 Redcap PC7 to Tx Test Config Tables | Qualcomm Tech. Netherlands B.V |
R5-233718 | Adding FR2 Redcap PC7 to Tx Test Config Tables | Qualcomm Tech. Netherlands B.V |
TDoc | Title | Source |
---|---|---|
R5-232615 | Adding FR2 Redcap Rx EIS test case | Qualcomm Tech. Netherlands B.V |
R5-232617 | Adding FR2 Redcap Rx RefSens test case | Qualcomm Tech. Netherlands B.V |
R5-232618 | Adding FR2 Redcap PC7 to Rx Test Config Tables | Qualcomm Tech. Netherlands B.V |
R5-233558 | Adding FR2 Redcap Rx EIS test case | Qualcomm Tech. Netherlands B.V |
R5-233719 | Adding FR2 Redcap Rx EIS test case | Qualcomm Tech. Netherlands B.V |
TDoc | Title | Source |
---|---|---|
R5-233206 | Addition to the abbreviations on RedCap for FR2 UE | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-232457 | Correction to RedCap Demod TC 5.2.2.2.18 PDSCH 2Rx TDD | Huawei, HiSilicon |
R5-232567 | Addition of test case 5.3.2.1.4, 2Rx FDD FR1 PDCCH performance for RedCap | Ericsson |
R5-232568 | Addition of test case 5.3.2.2.4, 2Rx TDD FR1 PDCCH performance for RedCap | Ericsson |
R5-232569 | Adding SNR value for test 1-4 in test case 5.2.1.1.1 | Ericsson |
R5-232570 | Core spec alignment for applicability of requirements | Ericsson |
R5-232571 | Updates to test case 6.2.1.1.1.1, 1Rx FDD FR1 periodic CQI reporting under AWGN conditions for RedCap | Ericsson |
R5-232572 | Addition of test case 6.2.1.2.1.1, 1Rx TDD FR1 periodic CQI reporting under AWGN conditions for RedCap | Ericsson |
R5-232573 | Addition of test case 6.2.1.2.2.1, 1Rx TDD FR1 periodic wideband CQI reporting under fading conditions for RedCap | Ericsson |
R5-233010 | Editorial correction to chapter 5 with move of 5.2.2.2.18 | Anritsu, Huawei, HiSilicon |
R5-233224 | Update to RedCap PDSCH test cases | Qualcomm Europe Inc. Sweden |
R5-233598 | Addition of test case 5.3.2.1.4, 2Rx FDD FR1 PDCCH performance for RedCap | Ericsson |
R5-233743 | Editorial correction to chapter 5 with move of 5.2.2.2.18 | Anritsu, Huawei, HiSilicon |
R5-233745 | Addition of test case 5.3.2.2.4, 2Rx TDD FR1 PDCCH performance for RedCap | Ericsson |
R5-233746 | Adding SNR value for test 1-4 in test case 5.2.1.1.1 | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232574 | Addition on MU and TT for newly introduced RedCap Demod test cases | Ericsson |
R5-232575 | Addition on MU and TT for newly introduced RedCap CQI test cases | Ericsson |
R5-232577 | Missing minimum test time for reference channel for RedCap | Ericsson |
R5-233599 | Addition on MU and TT for newly introduced RedCap CQI test cases | Ericsson |
R5-233714 | Addition on MU and TT for newly introduced RedCap Demod test cases | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232458 | Correction to applicability of RedCap RRM TCs | Huawei, HiSilicon |
R5-232578 | Addition of applicability for RedCap demod test cases | Ericsson |
R5-232928 | Applicability of FR2 RedCap reselection test cases | Ericsson |
R5-233035 | Update to test applicability of SUL test cases | Huawei, HiSilicon |
R5-233715 | Update to test applicability of SUL test cases | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232171 | Core spec alignment for RedCap TCs 16.6.1.8 and 16.6.1.12 | Rohde & Schwarz |
R5-232172 | Correction to Test frequencies reference for RedCap TCs in chapter 16 | Rohde & Schwarz |
R5-232173 | Core spec alignment for SMTC value for RedCap TC 16.1.1.1 | Rohde & Schwarz |
R5-232459 | Correction to RedCap RRM TC 16.3.1.x NCDSSB HO | Huawei, HiSilicon, Starpoint |
R5-232460 | Correction to RedCap RRM TC 16.5.2.x SSB BFR | Huawei, HiSilicon, Starpoint |
R5-232461 | Correction to RedCap RRM TC 16.6.1.x CDSSB intraFreq | Huawei, HiSilicon, Starpoint |
R5-232462 | Correction to RedCap RRM TC 16.6.1.x NCDSSB intraFreq | Huawei, HiSilicon, Starpoint |
R5-232463 | Correction to RedCap RRM TC 17.5.1.2 SSB InSync noDRX | Huawei, HiSilicon |
R5-232464 | Correction to RedCap RRM TC 17.5.2.3 CSIRS BFR noDRX with TT | Huawei, HiSilicon |
R5-232465 | Correction to RedCap RRM TC 17.5.2.4 CSIRS BFR DRX with TT | Huawei, HiSilicon |
R5-232466 | Correction to RedCap RRM TC 17.5.2.5 BFR restriction with TT | Huawei, HiSilicon |
R5-232467 | Correction to RedCap RRM TC 17.6.1.1 intraFreq noDRX | Huawei, HiSilicon |
R5-232468 | Addition of RedCap RRM TC 17.6.1.2 intraFreq DRX with TT | Huawei, HiSilicon |
R5-232469 | Correction to RedCap RRM TC 17.6.1.3 gap intraFreq noDRX with TT | Huawei, HiSilicon |
R5-232470 | Correction to RedCap RRM TC 17.6.1.4 gap intraFreq DRX with TT | Huawei, HiSilicon |
R5-232471 | Correction to RedCap RRM TC 17.6.3.1 SSB L1RSRP noDRX with TT | Huawei, HiSilicon |
R5-232472 | Correction to RedCap RRM TC 17.6.3.2 SSB L1RSRP DRX with TT | Huawei, HiSilicon |
R5-232473 | Correction to RedCap RRM TC 17.6.3.3 CSIRS L1RSRP noDRX with TT | Huawei, HiSilicon |
R5-232474 | Correction to RedCap RRM TC 17.6.3.4 CSIRS L1RSRP DRX with TT | Huawei, HiSilicon |
R5-232475 | Correction to RedCap RRM TC 18.2.2.1 L2N Redirection | Huawei, HiSilicon |
R5-232476 | Correction to RedCap RRM TC 18.3.1.5 interRAT noDRX with TT | Huawei, HiSilicon |
R5-232477 | Correction to RedCap RRM TC 18.3.1.6 interRAT DRX with TT | Huawei, HiSilicon |
R5-232478 | Correction to RedCap RRM TC 18.3.1.7 interRAT noDRX SBI with TT | Huawei, HiSilicon |
R5-232479 | Correction to RedCap RRM TC 18.3.1.8 interRAT DRX SBI with TT | Huawei, Hisilicon |
R5-232480 | Correction to Annex A for RedCap RRM TCs | Huawei, HiSilicon |
R5-232481 | Correction to Annex E for RedCap RRM TCs | Huawei, HiSilicon |
R5-232482 | Correction to Annex F for RedCap RRM TCs | Huawei, HiSilicon |
R5-232669 | Addition of RedCap RLM OOS test cases 16.5.1.5 and 16.5.1.6 | Qualcomm France |
R5-232670 | Addition of RedCap SSB-based BFD and LR in DRX mode test cases 16.5.2.3 and 16.5.2.4 | Qualcomm France |
R5-232671 | Addition of RedCap DCI-based DL active BWP switch test cases 16.5.3.1.1 and 16.5.3.1.2 | Qualcomm France |
R5-232672 | Addition of RedCap RRC-based DL active BWP switch test cases 16.5.3.2.1 and 16.5.3.2.2 | Qualcomm France |
R5-232922 | Correction of RedCap NR SA FR1 - E-UTRA Cell reselection test cases in clause 16.1.2 | Ericsson |
R5-232923 | Correction of RedCap test case 17.1.1.1 | Ericsson |
R5-232924 | Correction of RedCap test case 17.1.1.2 | Ericsson |
R5-232925 | Correction of RedCap test case 17.1.1.3 | Ericsson |
R5-232926 | Correction of RedCap test case 17.1.1.4 | Ericsson |
R5-232927 | Annex E correction for Redcap FR2 reselection cases | Ericsson |
R5-233016 | Removal of square brackets from test paramters of RedCap test cases | Anritsu |
R5-233298 | Addition of NR SA FR2 BFD and LR TT for RedCap | Anritsu, Huawei, HiSilicon |
R5-233610 | Core spec alignment for SMTC value for RedCap TC 16.1.1.1 | Rohde & Schwarz |
R5-233611 | Correction to Annex E for RedCap RRM TCs | Huawei, HiSilicon |
R5-233612 | Addition of RedCap RLM OOS test cases 16.5.1.5 and 16.5.1.6 | Qualcomm France |
R5-233613 | Addition of RedCap SSB-based BFD and LR in DRX mode test cases 16.5.2.3 and 16.5.2.4 | Qualcomm France |
R5-233614 | Addition of RedCap DCI-based DL active BWP switch test cases 16.5.3.1.1 and 16.5.3.1.2 | Qualcomm France |
R5-233615 | Addition of RedCap RRC-based DL active BWP switch test cases 16.5.3.2.1 and 16.5.3.2.2 | Qualcomm France |
R5-233616 | Correction of RedCap NR SA FR1 - E-UTRA Cell reselection test cases in clause 16.1.2 | Ericsson |
R5-233617 | Annex E correction for Redcap FR2 reselection cases | Ericsson |
R5-233647 | Correction to RedCap RRM TC 17.6.3.1 SSB L1RSRP noDRX with TT | Huawei, HiSilicon |
R5-233654 | Correction to RedCap RRM TC 17.5.2.3 CSIRS BFR noDRX with TT | Huawei, HiSilicon |
R5-233655 | Correction to RedCap RRM TC 17.5.2.4 CSIRS BFR DRX with TT | Huawei, HiSilicon |
R5-233656 | Correction to RedCap RRM TC 17.5.2.5 BFR restriction with TT | Huawei, HiSilicon |
R5-233657 | Addition of RedCap RRM TC 17.6.1.2 intraFreq DRX with TT | Huawei, HiSilicon |
R5-233744 | Removal of square brackets from test paramters of RedCap test cases | Anritsu |
R5-233752 | Correction to RedCap RRM TC 18.3.1.5 interRAT noDRX with TT | Huawei, HiSilicon |
R5-233753 | Correction to RedCap RRM TC 18.3.1.6 interRAT DRX with TT | Huawei, HiSilicon |
R5-233754 | Correction to RedCap RRM TC 18.3.1.7 interRAT noDRX SBI with TT | Huawei, HiSilicon |
R5-233755 | Correction to RedCap RRM TC 18.3.1.8 interRAT DRX SBI with TT | Huawei, Hisilicon |
R5-233771 | Correction to RedCap RRM TC 16.3.1.x NCDSSB HO | Huawei, HiSilicon, Starpoint |
TDoc | Title | Source |
---|---|---|
R5-232483 | TT analysis for RedCap RRM TC 17.6.1.2 and 17.6.1.4 intraFreq one AoA | Huawei, HiSilicon |
R5-232484 | TT analysis for RedCap RRM TC 17.6.1.3 intraFreq two AoAs | Huawei, HiSilicon |
R5-232485 | TT analysis for RedCap RRM TC 17.6.3.1 and 17.6.3.2 SSB L1RSRP | Huawei, HiSilicon |
R5-232486 | TT analysis for RedCap RRM TC 17.6.3.3 and 17.6.3.4 CSIRS L1RSRP | Huawei, HiSilicon |
R5-232487 | TT analysis for RedCap RRM TC 18.3.1.5 interRAT nonPeak | Huawei, HiSilicon |
R5-232488 | TT analysis for RedCap RRM TC 18.3.1.x interRAT peak | Huawei, HiSilicon |
R5-233299 | Addition of TT analysis for NR SA FR2 BFD and BFR for RedCap | Anritsu, Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232626 | PC7 Antenna Assumptions for measurement grid | Qualcomm Tech. Netherlands B.V |
TDoc | Title | Source |
---|---|---|
R5-232130 | Addition to CG-SDT RRM test case for FR2 | Nokia, Nokia Shanghai Bell |
R5-233265 | Update to FR1 CG-SDT test case | Qualcomm France |
R5-233739 | Update to FR1 CG-SDT test case | Qualcomm France |
TDoc | Title | Source |
---|---|---|
R5-232862 | Updates to PDSCH Performance Test cases for 1024QAM | Qualcomm Europe Inc. Sweden |
R5-233751 | Updates to PDSCH Performance Test cases for 1024QAM | Qualcomm Europe Inc. Sweden |
TDoc | Title | Source |
---|---|---|
R5-232346 | Definition of NTN maximum input level test case 7.4 | Keysight Technologies UK Ltd |
R5-232371 | Introduction of new test case 7.5 Adjacent channel selectivity | CAICT |
R5-232372 | Correction of referenced Annexes for test case 7.9 Spurious emissions | CAICT |
R5-232373 | Introduction of new Annexes | CAICT |
R5-232517 | Introduction of NTN AMPR tests | Google Inc. |
R5-232519 | Introduction of NTN configured transmission power tests | Google Inc. |
R5-232869 | TP to add clause 8.1 to TS 38.521-5 | Qualcomm Europe Inc. Sweden |
R5-232870 | TP to add 2Rx PDSCH mapping type A test case for NTN UE | Qualcomm Europe Inc. Sweden |
R5-232871 | TP to add Annex for satellite access | Qualcomm Europe Inc. Sweden |
R5-233158 | Update General SE for NTN | Qualcomm Europe Inc. Sweden |
R5-233247 | Updates to NTN TC 6.3.3 on Tx on-off time mask | Apple Inc |
R5-233248 | Updates to NTN TC 6.5.2.2 on Spectrum emission mask | Apple Inc |
R5-233249 | Updates to NTN TC 6.5.2.4 on ACLR | Apple Inc |
R5-233567 | Introduction of new test case 7.5 Adjacent channel selectivity | CAICT |
R5-233568 | Introduction of new Annexes | CAICT |
R5-233569 | Introduction of NTN AMPR tests | Google Inc. |
R5-233570 | TP to add 2Rx PDSCH mapping type A test case for NTN UE | Qualcomm Europe Inc. Sweden |
R5-233571 | Updates to NTN TC 6.3.3 on Tx on-off time mask | Apple Inc |
R5-233572 | Updates to NTN TC 6.5.2.2 on Spectrum emission mask | Apple Inc |
R5-233573 | Updates to NTN TC 6.5.2.4 on ACLR | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232347 | TP analysis updated for NTN maximum input level test case 7.4 | Keysight Technologies UK Ltd |
R5-232518 | TP analysis for NR NTN configured transmission power tests | |
R5-233514 | TP analysis for NR NTN configured transmission power tests |
TDoc | Title | Source |
---|---|---|
R5-232513 | Considerations of NTN UE frequency pre-compensation testing | Google Inc. |
R5-232868 | NTN discussion open topics | Qualcomm Europe Inc. Sweden |
R5-233226 | Frequency Doppler in NR NTN communications | Keysight Technologies UK Ltd |
R5-233227 | Delays in NR NTN communications | Keysight Technologies UK Ltd |
R5-233231 | NR NTN discussion on satellite type coverage in testing | Keysight Technologies UK Ltd |
R5-233292 | NTN UE test cases methodology and configuration for SAN NTN assistance information parameters | THALES |
R5-233565 | NTN UE test cases methodology and configuration for SAN NTN assistance information parameters | THALES |
R5-233758 | Frequency Doppler in NR NTN communications | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232837 | Adding ICS for UE MMSE-IRC receiver capability | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232835 | Add applicability rule for PDSCH with inter cell interference and CRS-IM demodulation requirements | China Telecom |
R5-232838 | Add PDSCH demodulation test case with inter-cell intereference 2Rx FDD | China Telecom |
R5-232839 | Add PDSCH demodulation test case with inter-cell intereference 4Rx FDD | China Telecom |
R5-232854 | Addition of Demodulation performance testcases for PDSCH with inter-cell interference | Qualcomm Europe Inc. Sweden |
R5-232855 | Addition of Demodulation performance testcases for PDSCH with intra-cell inter user interference | Qualcomm Europe Inc. Sweden |
R5-232856 | Addition of Demodulation performance testcases for PDSCH CRS interference mitigation under NR-LTE coexistense | Qualcomm Europe Inc. Sweden |
R5-232857 | Addition of Demodulation performance testcases for PDSCH with inter-cell CRS interference | Qualcomm Europe Inc. Sweden |
R5-233580 | Addition of Demodulation performance testcases for PDSCH with inter-cell interference | Qualcomm Europe Inc. Sweden |
R5-233581 | Addition of Demodulation performance testcases for PDSCH with intra-cell inter user interference | Qualcomm Europe Inc. Sweden |
R5-233582 | Addition of Demodulation performance testcases for PDSCH CRS interference mitigation under NR-LTE coexistense | Qualcomm Europe Inc. Sweden |
R5-233583 | Addition of Demodulation performance testcases for PDSCH with inter-cell CRS interference | Qualcomm Europe Inc. Sweden |
R5-233707 | Add PDSCH demodulation test case with inter-cell intereference 2Rx FDD | China Telecom |
R5-233708 | Add PDSCH demodulation test case with inter-cell intereference 4Rx FDD | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232836 | Adding FRC for R17 demodulation enhancement WI | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232834 | Adding applicability for MMSE-IRC test cases | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232809 | Addition of Applicability of different requirements for HST | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232810 | Update of Reference measurement channels for SCS 15 kHz FR1 | CMCC |
R5-232811 | Update of Reference measurement channels for SCS 30 kHz FR1 | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232812 | Update to R17 NR HST FR1 enh test cases applicability | CMCC, Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232916 | Correction of EN-DC event reporting with highSpeedMeasCA-Scell-r17 test case 4.6.1.8 including Test Tolerance | Ericsson |
R5-232917 | Correction of EN-DC event reporting with highSpeedMeasCA-Scell-r17 test case 4.6.2.9 including Test Tolerance | Ericsson |
R5-232918 | Correction of SA FR1 HST reselection test case 6.1.1.8 including Test Tolerance | Ericsson |
R5-232919 | Correction of SA event reporting with highSpeedMeasCA-Scell-r17 test case 6.6.1.8 including Test Tolerance | Ericsson |
R5-232920 | Correction of SA event reporting with highSpeedMeasCA-Scell-r17 test case 6.6.2.12 including Test Tolerance | Ericsson |
R5-232921 | Correction of Annex F for HST test cases including Test Tolerance | Ericsson |
R5-233658 | Correction of SA event reporting with highSpeedMeasCA-Scell-r17 test case 6.6.1.8 including Test Tolerance | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232915 | Test Tolerance analysis for HST event triggered test cases | Ericsson |
R5-233659 | Test Tolerance analysis for HST event triggered test cases | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-233054 | Addition of PICS for NR feMIMO test cases | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232888 | Additional test case 5.3.2.1.5 2RX FDD Minimum requirements for PDCCH with intra-slot repetition | Samsung |
R5-232889 | Additional test case 5.3.2.2.5 2RX TDD Minimum requirements for PDCCH with intra-slot repetition | Samsung |
R5-232890 | Additional test case 5.3.3.1.4 4RX FDD Minimum requirements for PDCCH with intra-slot repetition | Samsung |
R5-232891 | Additional test case 5.3.3.2.4 4RX TDD Minimum requirements for PDCCH with intra-slot repetition | Samsung |
R5-233041 | Addition of test applicability of HST-SFN Scheme A and B | Huawei, HiSilicon |
R5-233042 | Addition of 5.2.2.1.20 2Rx FDD HST-SFN Scheme A | Huawei, HiSilicon |
R5-233043 | Addition of 5.2.2.1.21 2Rx FDD HST-SFN Scheme B | Huawei, HiSilicon |
R5-233044 | Addition of 5.2.2.2.21 2Rx TDD HST-SFN Scheme A | Huawei, HiSilicon |
R5-233045 | Addition of 5.2.2.2.22 2Rx TDD HST-SFN Scheme B | Huawei, HiSilicon |
R5-233046 | Addition of 5.2.3.1.19 4Rx FDD HST-SFN Scheme A | Huawei, HiSilicon |
R5-233047 | Addition of 5.2.3.1.20 4Rx FDD HST-SFN Scheme B | Huawei, HiSilicon |
R5-233048 | Addition of 5.2.3.2.20 4Rx TDD HST-SFN Scheme A | Huawei, HiSilicon |
R5-233049 | Addition of 5.2.3.2.21 4Rx TDD HST-SFN Scheme B | Huawei, HiSilicon |
R5-233584 | Additional test case 5.3.2.1.5 2RX FDD Minimum requirements for PDCCH with intra-slot repetition | Samsung |
R5-233585 | Additional test case 5.3.2.2.5 2RX TDD Minimum requirements for PDCCH with intra-slot repetition | Samsung |
R5-233586 | Additional test case 5.3.3.1.4 4RX FDD Minimum requirements for PDCCH with intra-slot repetition | Samsung |
R5-233587 | Additional test case 5.3.3.2.4 4RX TDD Minimum requirements for PDCCH with intra-slot repetition | Samsung |
R5-233588 | Addition of 5.2.2.1.20 2Rx FDD HST-SFN Scheme A | Huawei, HiSilicon |
R5-233589 | Addition of 5.2.2.1.21 2Rx FDD HST-SFN Scheme B | Huawei, HiSilicon |
R5-233590 | Addition of 5.2.2.2.21 2Rx TDD HST-SFN Scheme A | Huawei, HiSilicon |
R5-233591 | Addition of 5.2.2.2.22 2Rx TDD HST-SFN Scheme B | Huawei, HiSilicon |
R5-233592 | Addition of 5.2.3.1.19 4Rx FDD HST-SFN Scheme A | Huawei, HiSilicon |
R5-233593 | Addition of 5.2.3.1.20 4Rx FDD HST-SFN Scheme B | Huawei, HiSilicon |
R5-233594 | Addition of 5.2.3.2.20 4Rx TDD HST-SFN Scheme A | Huawei, HiSilicon |
R5-233595 | Addition of 5.2.3.2.21 4Rx TDD HST-SFN Scheme B | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-233050 | Addition of RMC for HST-SFN scheme A and B | Huawei, HiSilicon |
R5-233051 | Addition of propagation information of HST scheme A and B | Huawei, HiSilicon |
R5-233052 | Addition of MU and TT for HST scheme A and B | Huawei, HiSilicon |
R5-233053 | Addition of minimum test time for HST scheme A and B | Huawei, HiSilicon |
R5-233596 | Addition of RMC for HST-SFN scheme A and B | Huawei, HiSilicon |
R5-233597 | Addition of MU and TT for HST scheme A and B | Huawei, HiSilicon |
R5-233688 | Addition of minimum test time for HST scheme A and B | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232892 | Adding applicability statements for NR FeMIMO | Samsung |
R5-233055 | Addition of applicabiltiy for NR feMIMO test cases | Huawei, HiSilicon |
R5-233689 | Addition of applicabiltiy for NR feMIMO test cases | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232237 | Addition and updation of tables for HST FR2 scenario | Nokia, Nokia Shanghai Bell |
R5-233674 | Addition and updation of tables for HST FR2 scenario | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232238 | Addition and support of power class 6 UEs for HST FR2 | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232515 | HST FR2 6.2D.1.2 UE maximum output power - Spherical coverage for UL MIMO | SGS Wireless |
R5-232516 | HST FR2 6.3D.1 Minimum output power for UL MIMO | SGS Wireless |
TDoc | Title | Source |
---|---|---|
R5-232236 | Addition of applicability for 5GS HST FR2 test case | Nokia, Nokia Shanghai Bell |
R5-233506 | Addition of applicability for 5GS HST FR2 test case | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232279 | Addition of MAC-CE based active TCI state switch test case for HST FR2 | Nokia, Nokia Shanghai Bell |
R5-233507 | Addition of MAC-CE based active TCI state switch test case for HST FR2 | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232907 | Updating for PC6 measurement error contribution descriptions for IFF | Samsung Electronics Nordic AB |
R5-232932 | Updating for PC6 measurement error contribution descriptions for IFF | Samsung |
R5-233633 | Updating for PC6 measurement error contribution descriptions for IFF | Samsung |
TDoc | Title | Source |
---|---|---|
R5-232274 | Adding applicability UE Rx-Tx time difference measurement for propagation delay compensation using TRS in FR2 | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232233 | Update to PRS based UE Rx-Tx measurement FR1 SA test case | Nokia, Nokia Shanghai Bell |
R5-232234 | Update to PRS based UE Rx-Tx measurement FR2 SA test case | Nokia, Nokia Shanghai Bell |
R5-232235 | Update to TRS based UE Rx-Tx measurement FR1 SA test case | Nokia, Nokia Shanghai Bell |
R5-232275 | Addition of UE Rx-Tx time difference measurement for propagation delay compensation using TRS in FR2 test case | Nokia, Nokia Shanghai Bell |
R5-233607 | Addition of UE Rx-Tx time difference measurement for propagation delay compensation using TRS in FR2 test case | Nokia, Nokia Shanghai Bell |
R5-233660 | Update to PRS based UE Rx-Tx measurement FR1 SA test case | Nokia, Nokia Shanghai Bell |
R5-233661 | Update to PRS based UE Rx-Tx measurement FR2 SA test case | Nokia, Nokia Shanghai Bell |
R5-233662 | Update to TRS based UE Rx-Tx measurement FR1 SA test case | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232561 | Test Tolerance analysis of FR1 PDC test cases | Nokia, Nokia Shanghai Bell |
R5-232566 | Test Tolerance analysis of FR2 PDC test cases | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232674 | Addition of power savings RLM OOS test case 4.5.1.9 | Qualcomm France |
R5-232675 | Addition of power savings RLM OOS test case 5.5.1.10 | Qualcomm France |
R5-233020 | Introduction of 6.5.1.9 power saving enhancement test case | Keysight Technologies UK Ltd |
R5-233619 | Addition of power savings RLM OOS test case 4.5.1.9 | Qualcomm France |
R5-233620 | Addition of power savings RLM OOS test case 5.5.1.10 | Qualcomm France |
TDoc | Title | Source |
---|---|---|
R5-232587 | MU values for NR FR1 TRP-TRS | ROHDE & SCHWARZ |
R5-233039 | Correction of TRS minimum requirement | Huawei, HiSilicon |
R5-233040 | Update to TRP and TRS test applicability | Huawei, HiSilicon |
R5-233242 | Clarification of test parameters for FR1 TRP TRS testing | Apple Inc |
R5-233243 | Introduction of SA FR1 Talk Mode TRP TC 6.2.1.2.1 | Apple Inc |
R5-233244 | Introduction of SA FR1 Talk Mode TRS TC 7.2.1.2.1 | Apple Inc |
R5-233245 | Update of SA FR1 Browsing Mode TRP TC 6.2.1.1.1 | Apple Inc |
R5-233246 | Update of SA FR1 Browsing Mode TRS TC 7.2.1.1.1 | Apple Inc |
R5-233677 | MU values for NR FR1 TRP-TRS | ROHDE & SCHWARZ |
R5-233709 | Correction of TRS minimum requirement | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232586 | AC MU Analysis for NR FR1 TRP-TRS (Rel.17) | ROHDE & SCHWARZ |
R5-232588 | RAN4 progress update and MU impact analysis for Enhanced NR FR1 TRP-TRS test methods (Rel-18) | ROHDE & SCHWARZ |
R5-232589 | Text proposal for TR 38.870 Annex B on MU for BHH | ROHDE & SCHWARZ |
R5-232635 | Test Time Reduction using Coarser TRP/TRS Measurement Grids for above and below 3 GHz | Keysight Technologies UK Ltd, CAICT |
R5-233233 | RC MU Analysis for NR FR1 TRP-TRS Enhancement | Bluetest AB |
R5-233678 | Test Time Reduction using Coarser TRP/TRS Measurement Grids for above and below 3 GHz | Keysight Technologies UK Ltd, CAICT |
R5-233679 | RC MU Analysis for NR FR1 TRP-TRS Enhancement | Bluetest AB |
TDoc | Title | Source |
---|---|---|
R5-232930 | 38.522 correction for RRM enh cases | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232489 | Correction to RRM enh TC 6.5.8.1 CBW change | Huawei, HiSilicon |
R5-232490 | Correction to Annex A for RRM enh TCs | Huawei, HiSilicon |
R5-232931 | RRM enh cases EN regarding applicability removal | Ericsson |
R5-233773 | Correction to Annex A for RRM enh TCs | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232348 | p-Max conditions corrections in 6.5A.3.1.1 | Keysight Technologies UK Ltd, Huawei, HiSilicon |
R5-233036 | Correction of P-max in AMPR for CA | Huawei, HiSilicon, Keysight |
R5-233037 | Adding PC2 intra-band contiguous testing to 6.5A.3.2.1 | Huawei, HiSilicon, Keysight |
TDoc | Title | Source |
---|---|---|
R5-233257 | Update to TS 38.508-1 clause 4.6.3-200BB for FR2 UL Gaps IE | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-233254 | Updates to FR2 RF test case 6.2.5 for EIRP with UL-Gaps | Apple Inc |
R5-233716 | Updates to FR2 RF test case 6.2.5 for EIRP with UL-Gaps | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-233255 | Update of EIRP with UL-Gaps test for EN-DC with FR2 | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232129 | Adding applicability statement for SCell Activation and deactivation for SCell in FR2 inter-band in non-DRX | Nokia, Nokia Shanghai Bell |
R5-233253 | Applicability updates to FR2 RF tests | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232127 | UE UL carrier RRC reconfiguration delay test tolerances for FR2 | Nokia, Nokia Shanghai Bell |
R5-232128 | Adding test case 7.5.3.3 for SCell Activation and deactivation for SCell in FR2 inter-band in non-DRX | Nokia, Nokia Shanghai Bell |
R5-233618 | Adding test case 7.5.3.3 for SCell Activation and deactivation for SCell in FR2 inter-band in non-DRX | Nokia, Nokia Shanghai Bell |
R5-233663 | UE UL carrier RRC reconfiguration delay test tolerances for FR2 | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232126 | TT analysis for FR2 UE UL carrier RRC reconfiguration delay test case | Nokia, Nokia Shanghai Bell |
R5-233664 | TT analysis for FR2 UE UL carrier RRC reconfiguration delay test case | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-233256 | TP Analysis for FR2 RF test case involving EIRP with UL-Gaps | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232699 | Updates on TS 38.551 Annex B | Apple Electronics |
R5-232701 | Updates on TS 38.551 Annex C | Apple Electronics |
R5-232702 | Updates on TS 38.551 Foreword, scope and references | Apple Electronics |
R5-232703 | Updates on TS 38.551 FR1 MIMO OTA frequency bands | Apple Electronics |
R5-232704 | Updates on TS 38.551 FR1 MIMO OTA Performance | Apple Electronics |
TDoc | Title | Source |
---|---|---|
R5-233038 | Adding PICS for DL interruption | Huawei, HiSilicon, China Telecom |
R5-233502 | Adding PICS for DL interruption | Huawei, HiSilicon, China Telecom |
TDoc | Title | Source |
---|---|---|
R5-233230 | Updates for IoT NTN | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232367 | Introduction of new test case 7.6A.2 In-band blocking for category M1 | CAICT |
R5-232368 | Introduction of new test case 7.6B.2 In-band blocking for category NB1 and NB2 | CAICT |
R5-232369 | Introduction of new test case 7.9A Spurious emissions for category M1 | CAICT |
R5-232370 | Correction of title of TS 36.521-1 in clause 2 References | CAICT |
R5-232382 | Introduction of new test case 7.9B Spurious emissions for category NB1 and NB2 | CAICT |
R5-232521 | Editorial correction for some type error in 6.2A | MediaTek Beijing Inc. |
R5-232522 | Adding test case 6.2B.3 for UE A-MPR for category NB1 and NB2 UE | MediaTek Beijing Inc. |
R5-232523 | Adding test case 6.3A.1 for UE Minimum output power for category M1 | MediaTek Beijing Inc. |
R5-232524 | Adding test case 6.3A.2 for Transmit OFF power for category M1 | MediaTek Beijing Inc. |
R5-232525 | Adding test case 6.3A.3.1 for General ON/OFF time mask | MediaTek Beijing Inc. |
R5-232526 | Adding test case 6.3A.3.2.1 for PRACH time mask | MediaTek Beijing Inc. |
R5-232527 | Adding test case 6.3A.3.2.2 for SRS time mask | MediaTek Beijing Inc. |
R5-232549 | Adding test case 6.3A.4.1 for Power Control Absolute power tolerance | MediaTek Beijing Inc. |
R5-232550 | Adding test case 6.3A.4.2 Power Control Relative power tolerance | MediaTek Beijing Inc. |
R5-232551 | Adding test case 6.3A.4.3 for Aggregate power control tolerance | MediaTek Beijing Inc. |
R5-232552 | Adding test case 6.3B.1 for UE Minimum output power | MediaTek Beijing Inc. |
R5-232553 | Adding test case 6.3B.2 for Transmit OFF power | MediaTek Beijing Inc. |
R5-232554 | Adding test case 6.3B.3.1 General ON/OFF time mask | MediaTek Beijing Inc. |
R5-232555 | Adding test case 6.3B.3.2 NPRACH time mask | MediaTek Beijing Inc. |
R5-232556 | Adding test case 6.3B.4.1 Power Control Absolute power tolerance | MediaTek Beijing Inc. |
R5-232557 | Adding test case 6.3B.4.2 Power Control Relative power tolerance | MediaTek Beijing Inc. |
R5-232558 | Adding test case 6.3B.4.3 Aggregate power control tolerance | MediaTek Beijing Inc. |
R5-232815 | Introduction of eMTC/NB-IoT NTN Output RF spectrum emissions TC 6.5 | CMCC |
R5-232816 | Introduction of eMTC NTN Output RF spectrum emissions TC 6.5A | CMCC |
R5-232817 | Introduction of NB-IoT NTN Output RF spectrum emissions TC 6.5B | CMCC |
R5-232818 | Update of editor notes for IoT NTN TCs | CMCC |
R5-233574 | Introduction of eMTC NTN Output RF spectrum emissions TC 6.5A | CMCC |
R5-233575 | Update of editor notes for IoT NTN TCs | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232820 | IoT NTN test point analysis | CMCC, MTK, Sporton |
TDoc | Title | Source |
---|---|---|
R5-232254 | LS to RAN4 on A-MPR Network Signaling value (NS_02N) | MediaTek Beijing Inc. |
R5-232819 | Disc on handling of R18 IoT NTN TCs in 36521-4 | CMCC, MTK, Sporton, CAICT |
R5-233228 | Frequency Doppler in IoT NTN communications | Keysight Technologies UK Ltd |
R5-233229 | Delays in IoT NTN communications | Keysight Technologies UK Ltd |
R5-233232 | IoT NTN discussion on satellite type coverage in testing | Keysight Technologies UK Ltd |
R5-233566 | Disc on handling of R18 IoT NTN TCs in 36521-4 | CMCC, MTK, Sporton, CAICT |
R5-233673 | LS to RAN4 on A-MPR Network Signaling value (NS_02N) | MediaTek Beijing Inc. |
R5-233757 | Delays in IoT NTN communications | Keysight Technologies UK Ltd |
R5-233759 | Frequency Doppler in IoT NTN communications | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232081 | Addition of Pre-MG RRM test case 6.6.17.1 | MediaTek Inc. |
R5-232082 | Addition of Pre-MG RRM test case 6.6.17.2 | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232103 | Add applicability of new test cases for gap enhancement- Pre-MG and NCSG | MediaTek Inc. |
R5-232529 | Update of eMG case applicabilities | MediaTek Inc. |
R5-233690 | Add applicability of new test cases for gap enhancement- Pre-MG and NCSG | MediaTek Inc. |
R5-233710 | Update of eMG case applicabilities | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232083 | Addition of Pre-MG RRM test case 6.6.17.1 | MediaTek Inc. |
R5-232084 | Addition of Pre-MG RRM test case 6.6.17.2 | MediaTek Inc. |
R5-232097 | Addition of minimum requirements for 6.6.19.0 - FR1 NCSG | MediaTek Inc. |
R5-232098 | Addition of NCSG RRM test case 6.6.19.1 | MediaTek Inc. |
R5-232099 | Addition of NCSG RRM test case 6.6.19.2 | MediaTek Inc. |
R5-232100 | Addition of NCSG RRM test case 6.6.19.3 | MediaTek Inc. |
R5-232101 | Addition of NCSG RRM test case 6.6.19.4 | MediaTek Inc. |
R5-232102 | Correction to table E.4-1 and E.4-2 for NCSG TCs | MediaTek Inc. |
R5-232104 | Addition of minimum requirements for 6.6.17.0 | MediaTek Inc. |
R5-232336 | Update concurrent gap test cases 6.6.18.1 and 6.6.18.2 | MediaTek Beijing Inc. |
R5-232426 | Correction to table E.4-1 for Pre-MG TCs | MediaTek Inc. |
R5-232530 | Update of eMG TC 6.6.18.3 | MediaTek Inc. |
R5-232531 | Update of eMG TC 6.6.18.4 | MediaTek Inc. |
R5-232532 | Update of E.4 for MG enhancements | MediaTek Inc. |
R5-232533 | Update of H.3.1 for MG enhancements | MediaTek Inc. |
R5-233608 | Addition of Pre-MG RRM test case 6.6.17.2 | MediaTek Inc. |
R5-233609 | Addition of Pre-MG RRM test case 6.6.17.1 | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232747 | Update of PC2 UE maximum output power for inter-band CA configurations | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-233209 | Corrections on higher power class indication for EN-DC configuration | ZTE Corporation |
R5-233577 | Corrections on higher power class indication for EN-DC configuration | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-232840 | Update of PC2 UE configured output power for inter-band EN-DC configurations | China Telecom, Huawei, HiSilicon, Qualcomm |
R5-232841 | Update of PC2 UE maximum output power for inter-band EN-DC configurations | China Telecom, Huawei, HiSilicon, Qualcomm |
TDoc | Title | Source |
---|---|---|
R5-232311 | Addition of test frequencies for LTE Band 54 | Ligado Networks |
R5-233694 | Addition of test frequencies for LTE Band 54 | Ligado Networks |
TDoc | Title | Source |
---|---|---|
R5-232313 | Introduction of LTE Band 54 to common clauses (section 5) | Ligado Networks |
R5-232314 | Updates to MOP and MPR test cases as part of introduction of LTE Band 54 | Ligado Networks |
R5-232315 | Updates to A-MPR test cases as part of introduction of LTE Band 54 | Ligado Networks |
R5-232316 | Updates to spurious emissions and additional spurious emissions test cases as part of introduction of LTE Band 54 | Ligado Networks |
R5-232321 | Updates to receiver reference sensitivity test cases as part of introduction of LTE Band 54 | Ligado Networks |
R5-232322 | Updates to receiver blocking test cases as part of introduction of LTE Band 54 | Ligado Networks |
R5-233704 | Updates to spurious emissions and additional spurious emissions test cases as part of introduction of LTE Band 54 | Ligado Networks |
TDoc | Title | Source |
---|---|---|
R5-232323 | Updates to test case applicability as part of introduction of LTE Band 54 | Ligado Networks |
TDoc | Title | Source |
---|---|---|
R5-232324 | Updates to groups of band as part of introduction of LTE Band 54 | Ligado Networks |
TDoc | Title | Source |
---|---|---|
R5-232986 | Analysis on improvement of relaxation in existing IFF test systems | Anritsu |
R5-233258 | On FR2 RF Enhanced Test Methods work plan updates | Apple Inc |
R5-233259 | Work Plan for Rel17 FR2 RF Enhanced Test Methods | Apple Inc |
R5-233550 | On FR2 RF Enhanced Test Methods work plan updates | Apple Inc |
R5-233733 | Work Plan for Rel17 FR2 RF Enhanced Test Methods | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232337 | Addition of test frequencies for new 3CC EN-DC comb within FR2 | KDDI Corporation |
R5-232359 | Correction of test frequency parameters for n79 | Keysight Technologies UK Ltd, Huawei,Hisilicon |
R5-232441 | Introduction of test channel bandwidths for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-232442 | Introduction of test frequencies for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-233096 | Updating lowest testing channel bandwidth for n79 | Huawei, HiSilicon |
R5-233097 | Updating n79 test frequencies for 10MHz channel bandwidth | Huawei, HiSilicon |
R5-233099 | Updating test frequency for n79 10MHz CBW with 30kHz SCS | Huawei, HiSilicon |
R5-233699 | Correction of test frequency parameters for n79 | Keysight Technologies UK Ltd, Huawei,Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232350 | RF message exceptions for K1 and number of HARQ processes in CA | Keysight Technologies UK Ltd, Anritsu Limited, Rohde & Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232440 | Correction NZP-CSI-RS-ResourceSet for FR1 | ROHDE & SCHWARZ |
R5-232712 | Correction NZP-CSI-RS-ResourceSet for FR1 | ROHDE & SCHWARZ |
R5-232934 | Update CSI-ReportConfig IE content for RRM testing | Keysight Technologies UK Ltd |
R5-232991 | Correction to RRM PDCCH TCI-State | Anritsu |
R5-232992 | Correction to RRM TRS CSI-ResourceConfig | Anritsu |
TDoc | Title | Source |
---|---|---|
R5-233098 | Updating frequency calculation in Annex C.3.2 | Huawei, HiSilicon, Keysight |
R5-233135 | Correction to RF or RRM condition for default messages | Rohde & Schwarz |
R5-233269 | Correction of 38.508-1 4.1.1 on lower humidity limit in temperature test environment | Samsung R&D Institute UK, ZTE Corporation |
R5-233500 | Correction of 38.508-1 4.1.1 on lower humidity limit in temperature test environment | Samsung R&D Institute UK, ZTE Corporation |
R5-233676 | Correction to frequency range for ssb-PositionsInBurst and SSB-ToMeasure | Anritsu |
R5-233700 | Updating frequency calculation in Annex C.3.2 | Huawei, HiSilicon, Keysight |
TDoc | Title | Source |
---|---|---|
R5-232362 | Addition of UE capability for new 2CC and 3CC EN-DC comb within FR2 | KDDI Corporation |
R5-232822 | Update NR band and CADC configs status in ICS Annex B | CMCC |
R5-233188 | Editorial correction to Table A.4.3.2A.2.1-4 | Bureau Veritas ADT |
R5-233189 | Additional support value to maxNumberSRS-Ports-PerResource element | Bureau Veritas ADT |
TDoc | Title | Source |
---|---|---|
R5-232353 | Test configuration table update for NS 46 in A-MPR test | Keysight Technologies UK Ltd |
R5-232354 | NS_27 - corrections for 30MHz RBStart for condition A1 | Keysight Technologies UK Ltd |
R5-232376 | Correction of Spurious emissions for UE co-existence requirement in 6.5D.3_1.2 | CAICT |
R5-232377 | Correction of Spurious emissions for UE co-existence requirement of NR FR1 | CAICT |
R5-232444 | Adding UE maximum output power for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-232445 | Adding UE maximum output power reduction for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-232744 | Update of UL MIMO aggregate power TC | Rohde & Schwarz |
R5-232750 | Addition of UL MIMO SEM and NR ACLR test cases for Power Class 1.5 | Huawei, HiSilicon |
R5-232751 | Editorial correction of reference table numbers for SUL test cases | Huawei, HiSilicon |
R5-232752 | Editorial Update of PC2 fallback PC3 test requirements | Huawei, HiSilicon |
R5-232977 | Adding UE additional maximum output power reduction for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-232978 | Adding additional spectrum emission mask requirement for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-232979 | Adding spurious emissions for UE co-existence for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-232980 | Adding additional spurious emissions for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-232997 | Addition of BW condition to 6.5D.2.3 A-SEM for UL MIMO | Anritsu |
R5-233023 | Removing redundant parameter setting from time mask testing | Huawei, HiSilicon |
R5-233026 | Clarification of spurious emsission testing configuration - Part 1 | Huawei, HiSilicon |
R5-233082 | Updating FR1 test case Additional spectrum emission mask for UL MIMO | Huawei, HiSilicon |
R5-233083 | Updating test case UTRA ACLR for UL MIMO | Huawei, HiSilicon |
R5-233084 | Updating test case AMPR for UL MIMO | Huawei, HiSilicon |
R5-233085 | Updating test requirement of test case AMPR for UL MIMO | Huawei, HiSilicon |
R5-233086 | Updating PUCCH aggregated power tolerance test case for SUL and for MIMO | Huawei, HiSilicon, Rohde&Schwarz |
R5-233186 | Correction to clauses using void table 5.5A.3-x | Bureau Veritas ADT |
R5-233193 | Editorial correction to TC6.2.3 configuration table for NS_06 | Bureau Veritas ADT |
R5-233524 | Adding UE additional maximum output power reduction for new NR band n13 | Nokia, Nokia Shanghai Bell |
R5-233541 | NS_27 - corrections for 30MHz RBStart for condition A1 | Keysight Technologies UK Ltd |
R5-233542 | Addition of BW condition to 6.5D.2.3 A-SEM for UL MIMO | Anritsu |
R5-233543 | Clarification of spurious emsission testing configuration - Part 1 | Huawei, HiSilicon |
R5-233547 | Updating FR1 test case Additional spectrum emission mask for UL MIMO | Huawei, HiSilicon |
R5-233548 | Updating PUCCH aggregated power tolerance test case for SUL and for MIMO | Huawei, HiSilicon, Rohde&Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232117 | Adding Reference sensitivity exceptions due to UL harmonic interference for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232119 | Add Reference sensitivity power level test requirements for CA_n28A-n78A | Nokia, Nokia Shanghai Bell, Apple |
R5-232278 | Addition of refsence sensitivity for n3A-n77A | KDDI Corporation |
R5-232993 | Correction to inter-band test frequencies exceptions in Rx CA test cases | Anritsu |
R5-232994 | Correction to transmission power in 7.6.3 Out-of-band blocking | Anritsu |
R5-233088 | Correction to REFSENS exceptions testing for CA_n7A-n78A | Huawei, HiSilicon |
R5-233090 | Correction to NS_04 test configuration for Additional spurious emissions for UL MIMO | Huawei, HiSilicon |
R5-233517 | Adding Reference sensitivity exceptions due to UL harmonic interference for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-233525 | Correction to REFSENS exceptions testing for CA_n7A-n78A | Huawei, HiSilicon |
R5-233722 | Correction to transmission power in 7.6.3 Out-of-band blocking | Anritsu |
TDoc | Title | Source |
---|---|---|
R5-232355 | K1 and number of HARQ processes for CA exceptions updates | Keysight Technologies UK Ltd, Anritsu Limited, Rohde & Schwarz |
R5-232410 | General updates of clause 5 for R17 new CBW configurations | CU Digital Technology, Nokia |
R5-232995 | Correction to K1 and PdschNumOfHarqProcess for DL CA | Anritsu |
R5-232996 | Update of Annex D.2 for interference signals lower than 2700 MHz | Anritsu |
R5-233087 | Updating MU values for NR FR1 Relative power tolerance for UL MIMO | Huawei, HiSilicon |
R5-233172 | Editorial correction in clause 5.5A.3.2 | ROHDE & SCHWARZ |
R5-233218 | Corrections on the minimum guardband calculation for FR1 | ZTE Corporation |
R5-233549 | Updating MU values for NR FR1 Relative power tolerance for UL MIMO | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232165 | PC1 - SEM test case update in 38.521-2 | Keysight Technologies UK Ltd |
R5-232170 | FR2 PC3 - Network Analyzer MU and TT update in 38.521-2 | Keysight Technologies UK Ltd |
R5-232356 | FR2 OBW CA - Test requirements misaligned with minimum requirements | Keysight Technologies UK Ltd |
R5-232357 | 1RB allocation increased to accommodate PHR in 2UL CA tests | Keysight Technologies UK Ltd, Ericsson |
R5-232628 | Update of SE TRP Offsets | Keysight Technologies UK Ltd |
R5-232984 | Definition of MU and requirements for FR2c | Anritsu |
R5-232998 | Correction to test procedure in Minimum output power test cases | Anritsu |
R5-233027 | Clarification of spurious emsission testing configuration - Part 2 | Huawei, HiSilicon |
R5-233169 | Update of Additional Spurious Emissions CA test cases | ROHDE & SCHWARZ |
R5-233170 | Update of Additional MPR CA test cases | ROHDE & SCHWARZ |
R5-233191 | Update to connection diagram of Spurious Emissions test cases | Bureau Veritas ADT, Qualcomm |
R5-233223 | Update to test case 6.3.4.3 Relative power tolerance | Ericsson |
R5-233225 | FR2 Spectrum Emission Mask test procedure update | Keysight Technologies UK Ltd, Apple |
R5-233527 | Update of Additional Spurious Emissions CA test cases | ROHDE & SCHWARZ |
R5-233544 | Clarification of spurious emsission testing configuration - Part 2 | Huawei, HiSilicon |
R5-233562 | Update of Additional MPR CA test cases | ROHDE & SCHWARZ |
R5-233635 | Definition of MU and requirements for FR2c | Anritsu |
R5-233702 | Update of SE TRP Offsets | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232166 | PC1 - ACS Case 1 and IBB test cases update in 38.521-2 | Keysight Technologies UK Ltd |
R5-232629 | Update of SE TRP Offsets | Keysight Technologies UK Ltd |
R5-232999 | Correction to F_Interferer_offset in ACS and In-band blocking test cases | Anritsu |
R5-233214 | Corrections on test parameters for adjacent channel selectivity for FR2 | ZTE Corporation, Anritsu |
R5-233215 | Corrections on test parameters for blocking characteristics for FR2 | ZTE Corporation |
R5-233578 | Corrections on test parameters for adjacent channel selectivity for FR2 | ZTE Corporation, Anritsu |
R5-233579 | Corrections on test parameters for blocking characteristics for FR2 | ZTE Corporation |
R5-233636 | PC1 - ACS Case 1 and IBB test cases update in 38.521-2 | Keysight Technologies UK Ltd |
R5-233637 | Update of SE TRP Offsets | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232630 | Update of Fine SE TRP Grids | Keysight Technologies UK Ltd |
R5-232632 | Clarification of QoQZ TRP Grids | Keysight Technologies UK Ltd |
R5-232634 | Clarification of Example DUT Coordinate System | Keysight Technologies UK Ltd |
R5-233000 | Addition of Annex Q.2 for Relative Phase Error Measurement | Anritsu |
R5-233024 | Adding noise impact of PC1 minimum output power in Annex F | Huawei, HiSilicon |
R5-233219 | Corrections on the minimum guardband calculation for FR2 | ZTE Corporation |
R5-233641 | Update of Fine SE TRP Grids | Keysight Technologies UK Ltd |
R5-233723 | Addition of Annex Q.2 for Relative Phase Error Measurement | Anritsu |
TDoc | Title | Source |
---|---|---|
R5-232358 | NSA beam correspondence test applicability inconsistent with SA test | Keysight Technologies UK Ltd |
R5-232380 | Correction of Spurious emissions for UE co-existence requirement of ENDC | CAICT |
R5-232514 | Update the Initial Conditions of four 6.2B.x TCs | SGS Wireless |
R5-232623 | Adding SE Coex Inter band ENDC FR2 UL-MIMO test case | Qualcomm Tech. Netherlands B.V |
R5-232753 | Correction to 6.2B.4.1.3 configured output power for EN-DC | Huawei, HiSilicon |
R5-232754 | Correction to test ID for PC2 fallback PC3 testing | Huawei, HiSilicon |
R5-233001 | Correction to reference of RMC for E-UTRA TDD in FR1 EN-DC test cases | Anritsu |
R5-233002 | Correction to 6.2B.4.1.3 and editorial correction to Tx test cases | Anritsu |
R5-233003 | Correction to test procedure in FR2 EN-DC Minimum output power test cases | Anritsu |
R5-233025 | Adding time delay to intra-band EN-DC test cases | Huawei, HiSilicon |
R5-233028 | Clarification of spurious emsission testing configuration - Part 3 | Huawei, HiSilicon |
R5-233168 | Addition of Additional Spurious Emissions FR2 CA test cases | ROHDE & SCHWARZ |
R5-233545 | Clarification of spurious emsission testing configuration - Part 3 | Huawei, HiSilicon |
R5-233724 | NSA beam correspondence test applicability inconsistent with SA test | Keysight Technologies UK Ltd |
R5-233725 | Correction to 6.2B.4.1.3 configured output power for EN-DC | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232607 | Update Ref sense for DC_38A_n78A, DC_18A_n77A and DC_19A_n77A | Qualcomm India Pvt Ltd |
R5-232773 | Addition of reference sensitivity for 19A_n77A | DOCOMO Communications Lab. |
R5-233175 | Update of in-band blocking for CA test cases | ROHDE & SCHWARZ |
R5-233520 | Update Ref sense for DC_38A_n78A, DC_18A_n77A and DC_19A_n77A | Qualcomm India Pvt Ltd |
TDoc | Title | Source |
---|---|---|
R5-232167 | FR2 MUs - Editor notes updates in 38.521-3 | Keysight Technologies UK Ltd |
R5-233182 | Update to R15 Configuration for DC | Bureau Veritas ADT, KDDI |
R5-233638 | FR2 MUs - Editor notes updates in 38.521-3 | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232528 | Correction to Rel-16 NR HST DPS cases | MediaTek Inc. |
R5-232853 | Updates to Power Saving test cases | Qualcomm Europe Inc. Sweden |
R5-232858 | Addition of PDSCH TC's for 3DLCA and 4DLCA with power imbalance | Qualcomm Europe Inc. Sweden |
R5-232859 | Addition of NR-DC SDR test case | Qualcomm Europe Inc. Sweden |
R5-232863 | Corrections to clause 5.5 SDR test cases | Qualcomm Europe Inc. Sweden |
R5-232864 | Corrections to Annex A.3.2_1.2 | Qualcomm Europe Inc. Sweden |
R5-232867 | Correction to reportQuantity value for 1Tx CQI CA test cases | Qualcomm Europe Inc. Sweden |
R5-233005 | Correction to Candidate CCEs in 5.5A.1.1 | Anritsu |
R5-233006 | Correction to K1 settings in 5.5A.1.1 | Anritsu |
R5-233007 | Correction to message exception in 6.2A.3.1.1 | Anritsu |
R5-233008 | Correction to K1 settings in 6.2A.3.1.1 | Anritsu |
R5-233009 | Correction to message exception in 6.2A.3.1.2 and 6.2A.3.1.3 | Anritsu |
R5-233217 | Corrections on the applicability of demodulation performance requirements | ZTE Corporation |
R5-233603 | Corrections on the applicability of demodulation performance requirements | ZTE Corporation |
R5-233726 | Correction to Rel-16 NR HST DPS cases | MediaTek Inc. |
R5-233737 | Updates to Power Saving test cases | Qualcomm Europe Inc. Sweden |
R5-233774 | Correction to reportQuantity value for 1Tx CQI CA test cases | Qualcomm Europe Inc. Sweden |
TDoc | Title | Source |
---|---|---|
R5-232384 | Correction of Table F.1.1.3 additional 4Tx uncertainty | Ericsson |
R5-232653 | Correction to Annex B.2 for TDLD Delay profile | MediaTek Inc. |
R5-233004 | Update of Noc levels for n259 or PC2 | Anritsu |
R5-233208 | Corrections on general sections for RF performance requirements | ZTE Corporation, Anritsu |
R5-233601 | Corrections on general sections for RF performance requirements | ZTE Corporation, Anritsu |
R5-233602 | Update of Noc levels for n259 or PC2 | Anritsu |
TDoc | Title | Source |
---|---|---|
R5-232667 | Update to RRM applicability rules and test optimization - 38.522 | Qualcomm France |
R5-232756 | Correction to test applicability for UL MIMO test cases | Huawei, HiSilicon |
R5-232771 | Correction to applicability for performance test cases | TTA |
R5-233159 | Update 38.522 for 6.2.1 and 6.2G.1 | Qualcomm India Pvt Ltd |
R5-233176 | Update of applicability for FR2 CA test cases | ROHDE & SCHWARZ |
R5-233177 | Update applicability for in-band blocking FR2 CA test cases | ROHDE & SCHWARZ |
R5-233180 | Correction to applicability of 5G test cases | Bureau Veritas ADT, SGS Wireless, Sporton, TTA |
R5-233181 | Update to handle the test case applicability with different branches | Bureau Veritas ADT, CMCC, Sporton |
R5-233264 | Applicability update for FR2 TCI state switch tests | Qualcomm France |
R5-233685 | Update to handle the test case applicability with different branches | Bureau Veritas ADT, CMCC, Sporton |
R5-233691 | Update to RRM applicability rules and test optimization - 38.522 | Qualcomm France |
R5-233692 | Correction to applicability for performance test cases | TTA |
R5-233693 | Applicability update for FR2 TCI state switch tests | Qualcomm France |
R5-233727 | Update of applicability for FR2 CA test cases | ROHDE & SCHWARZ |
R5-233728 | Correction to applicability of 5G test cases | Bureau Veritas ADT, SGS Wireless, Sporton, TTA |
R5-233778 | Update applicability for in-band blocking FR2 CA test cases | ROHDE & SCHWARZ |
TDoc | Title | Source |
---|---|---|
R5-232914 | Correction of FR2 Inter-freq measurement accuracy test cases including Test Tolerance | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232175 | Correction to Test frequencies reference for active BWP switch TCs: 4.5.6.1.1, 4.5.6.1.2, 4.5.6.2.1 | Rohde & Schwarz |
R5-232176 | Clarification to test procedure for EN-DC active BWP switch TCs: 4.5.6.1.1, 4.5.6.1.2, 4.5.6.2.1 | Rohde & Schwarz |
R5-232491 | Correction to EN DC RRM TC 4.6.2.x FR1 interFreq | Huawei, HiSilicon, Starpoint |
R5-232679 | Update to SCell activation and deactivation test cases | Qualcomm France |
R5-233011 | Correction to message exception in FR1 BWP Switching test cases | Anritsu |
R5-233134 | Correction in RRM TC 4.5.2.5 TC Procedure | Rohde & Schwarz |
R5-233136 | Removal of duplicated table in A.1.4.2-3 | Rohde & Schwarz |
R5-233138 | Core spec alignment for antenna configuration for 4.5.3 TCs | Rohde & Schwarz |
R5-233141 | T3 correction of SSB_RP for TC 5.5.5.1 | Rohde & Schwarz |
R5-233624 | Clarification to test procedure for EN-DC active BWP switch TCs: 4.5.6.1.1, 4.5.6.1.2, 4.5.6.2.1 | Rohde & Schwarz |
R5-233625 | Update to SCell activation and deactivation test cases | Qualcomm France |
R5-233626 | T3 correction of SSB_RP for TC 5.5.5.1 | Rohde & Schwarz |
R5-233729 | Core spec alignment for antenna configuration for 4.5.3 TCs | Rohde & Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232305 | Correction to FR2 BFD and LR including TT | Anritsu, Huawei, HiSilicon |
R5-232307 | Correction to EN-DC FR2 RLM tests for PSCell configured with CSI-RS-based RLM RS including TT | Anritsu |
R5-232450 | Update of RRM Test Case 5.5.3.1 EN-DC FR2 SCell activation and deactivation intra-band in non-DRX including Test Tolerance | Sporton |
R5-232982 | Correction to CSI RS based L1-RSRP measurement test 5.6.3.4 | Keysight Technologies UK Ltd |
R5-233012 | Correction to ssb-ToMeasure setting in 5.6.1.1 and 5.6.1.3 | Anritsu |
R5-233013 | Correction to CellGroupConfig in 5.5.6.2.1 | Anritsu |
R5-233014 | Editorial correction to reference of AoA setup | Anritsu |
R5-233137 | Core spec alignment for TC 5.5.1.7 | Rohde & Schwarz |
R5-233140 | PDCCH Config correction for FR2 beam failure detection and link recovery TCs | Rohde & Schwarz |
R5-233288 | Update of RRM Test Case 5.5.3.1 EN-DC FR2 SCell activation and deactivation intra-band in non-DRX | Sporton |
R5-233297 | Correction to FR2 BFD and LR | Anritsu |
R5-233627 | Editorial correction to reference of AoA setup | Anritsu |
R5-233628 | Update of RRM Test Case 5.5.3.1 EN-DC FR2 SCell activation and deactivation intra-band in non-DRX | Sporton |
R5-233665 | Correction to FR2 BFD and LR including TT | Anritsu, Huawei, HiSilicon |
R5-233666 | Correction to FR2 BFD and LR | Anritsu |
TDoc | Title | Source |
---|---|---|
R5-232174 | Core spec alignment for SMTC value for TC 6.1.1.1 | Rohde & Schwarz |
R5-232177 | Clarification to test procedure for SA active BWP switch TCs: 6.5.6.1.1, 6.5.6.1.2, 6.5.6.2.1 | Rohde & Schwarz |
R5-232492 | Correction to NR SA RRM TC 6.6.2.x FR1 interFreq | Huawei, HiSilicon, Starpoint |
R5-232666 | Update to RRM idle mode HST test cases | Qualcomm France |
R5-232677 | TT update for test cases 6.6.3.1 and 6.6.3.2 | Qualcomm France |
R5-233019 | Corrections to RRM HST 6.1.1.7 test case | Keysight Technologies UK Ltd |
R5-233139 | Core spec alignment for antenna configuration for 6.5.3 TCs | Rohde & Schwarz |
R5-233629 | Clarification to test procedure for SA active BWP switch TCs: 6.5.6.1.1, 6.5.6.1.2, 6.5.6.2.1 | Rohde & Schwarz |
R5-233667 | TT update for test cases 6.6.3.1 and 6.6.3.2 | Qualcomm France |
R5-233730 | Core spec alignment for antenna configuration for 6.5.3 TCs | Rohde & Schwarz |
R5-233740 | Update to RRM idle mode HST test cases | Qualcomm France |
TDoc | Title | Source |
---|---|---|
R5-232661 | Addition of NR SA FR2 active TCI state switch test cases 7.5.8.1.1 and 7.5.8.2.1 with TT | Qualcomm France |
R5-232680 | Correction to test applicability for SA FR2 test cases | Qualcomm France |
R5-233266 | Correction for multi-TRP test case 7.5.5.9 | Qualcomm France |
R5-233630 | Correction to test applicability for SA FR2 test cases | Qualcomm France |
R5-233645 | Addition of NR SA FR2 active TCI state switch test cases 7.5.8.1.1 and 7.5.8.2.1 with TT | Qualcomm France |
R5-233741 | Correction for multi-TRP test case 7.5.5.9 | Qualcomm France |
TDoc | Title | Source |
---|---|---|
R5-232493 | Correction to NR SA RRM TC 8.4.2.x FR2 interRAT | Huawei, HiSilicon |
R5-233267 | Update to L2N latency test cases | Qualcomm France |
R5-233742 | Update to L2N latency test cases | Qualcomm France |
R5-233756 | Correction to NR SA RRM TC 8.4.2.x FR2 interRAT | Huawei, HiSilicon |
R5-233775 | Correction to NR SA RRM TC 8.4.2.x FR2 interRAT | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232494 | Correction to Annex H for NR RRM TCs | Huawei, HiSilicon, Starpoint |
R5-233015 | Correction to entries of FR2 RLM config in Annex H | Anritsu |
R5-233018 | 2AoA Relative angular offset between active probes for PC1 devices | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-232161 | FR2 MUs - General Update in 38.903 section B.2.2 | Keysight Technologies UK Ltd |
R5-232163 | PC1 MU - definition for SEM test case in 38.903 | Keysight Technologies UK Ltd |
R5-232164 | PC1 MU - definition for ACS Case 1 and IBB test cases in 38.903 | Keysight Technologies UK Ltd |
R5-232169 | FR2 PC3 - Network Analyzer MU update in 38.903 | Keysight Technologies UK Ltd |
R5-232306 | Replacement of TT analysis for FR2 BFD and BFR | Anritsu, Huawei, HiSilicon |
R5-232308 | Update of Test Tolerance analyses for EN-DC FR2 RLM tests for PSCell configured with CSI-RS-based RLM RS | Anritsu |
R5-232631 | Removal of Offsets in B.18 | Keysight Technologies UK Ltd |
R5-232662 | Addition of TT analysis for TCI state switch test cases 7.5.8.1.1 and 7.5.8.2.1 | Qualcomm France |
R5-232676 | Addition of TT analysis for test cases 6.6.3.1 and 6.6.3.2 | Qualcomm France |
R5-232757 | Correction to test tolerance analysis for 5.6.6.1 and 7.6.6.1 | Huawei, HiSilicon |
R5-232912 | Correction of UE gain parameters | Ericsson |
R5-232913 | Correction of Test Tolerance analysis for Inter-frequency SS-RSRP measurement accuracy tests in FR2 | Ericsson |
R5-232985 | Definition of MU for FR2c | Anritsu |
R5-233017 | Editorial correction to Annex B | Anritsu |
R5-233639 | FR2 MUs - General Update in 38.903 section B.2.2 | Keysight Technologies UK Ltd |
R5-233640 | FR2 PC3 - Network Analyzer MU update in 38.903 | Keysight Technologies UK Ltd |
R5-233643 | Correction of Test Tolerance analysis for Inter-frequency SS-RSRP measurement accuracy tests in FR2 | Ericsson |
R5-233644 | Replacement of TT analysis for FR2 BFD and BFR | Anritsu, Huawei, HiSilicon |
R5-233695 | Editorial correction to Annex B | Anritsu |
TDoc | Title | Source |
---|---|---|
R5-232116 | Introduction of reference sensitivity test point analysis for CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232351 | TP analysis update for FR2 2 UL CA Tx tests to support PHR method | Keysight Technologies UK Ltd, Ericsson |
R5-232352 | FR1 MPR - ACLR - SEM - TP analysis update for almost contiguous RB allocation | Keysight Technologies UK Ltd |
R5-232606 | Ref sensitivity TP selection for DC_38A_n78A DC_18A_n77A and DC_19A_n77A | Qualcomm India Pvt Ltd, DOCOMO Communications Lab |
R5-232707 | Addition of reference sensitivity test point analysis for n3A-n77A | KDDI Corporation |
R5-232720 | Addition of reference sensitivity test point analysis for 19A_n77A | NTT DOCOMO INC. |
R5-232755 | Correction to test point analysis for FR1 test cases | Huawei, HiSilicon |
R5-232881 | Clarification/improvement of clause B9. | Ericsson |
R5-232976 | Introduction of TP analysis for A-MPR - New NR band n13 | Nokia, Nokia Shanghai Bell |
R5-233089 | Updating REFSENS exception test frequency selection for CA_n7A-n78A | Huawei, HiSilicon |
R5-233171 | Addition of Test Point Analysis for CA_NS_202 | ROHDE & SCHWARZ |
R5-233518 | TP analysis update for FR2 2 UL CA Tx tests to support PHR method | Keysight Technologies UK Ltd, Ericsson |
R5-233519 | Ref sensitivity TP selection for DC_38A_n78A DC_18A_n77A and DC_19A_n77A | Qualcomm India Pvt Ltd, DOCOMO Communications Lab |
R5-233521 | FR1 MPR - ACLR - SEM - TP analysis update for almost contiguous RB allocation | Keysight Technologies UK Ltd |
R5-233522 | Correction to test point analysis for FR1 test cases | Huawei, HiSilicon |
R5-233523 | Clarification/improvement of clause B9. | Ericsson |
R5-233526 | Updating REFSENS exception test frequency selection for CA_n7A-n78A | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232162 | On FR2 PC1 Priority 1 test cases pending for FR2b | Keysight Technologies UK Ltd |
R5-232168 | On the network analyzer uncertainty for PC3 in FR2 | Keysight Technologies UK Ltd |
R5-232374 | Discussion on spurious emission for UE co-existence requirement | CAICT |
R5-232627 | Spurious Emissions TRP Measurement Grids using Offset Approach | Keysight Technologies UK Ltd |
R5-232633 | On MU Threshold for RRM FR2 PC1 | Keysight Technologies UK Ltd |
R5-232660 | Discussion on affected list of RRM test cases with testability issues | Qualcomm France |
R5-232668 | Discussion on RRM test grouping | Qualcomm France |
R5-232673 | Discussion on signal variation and balancing in FR2 multiple AoA setups | Qualcomm France |
R5-232823 | Discussion on handling of test case applicability with different branches | CMCC, BV ADT, Sporton |
R5-232910 | FR2 RRM test cases: Known Issue List | Ericsson |
R5-232911 | Discussion on additional UE gain parameters in FR2 RRM testing | Ericsson |
R5-232983 | MU discussion on FR2c | Anritsu |
R5-232987 | Discussion on power settings in FR1 EVM including symbols with transient period | Anritsu, Apple Inc |
R5-233095 | Discussion on handling of test frequencies for band n79 10MHz channel bandwidth | Huawei, HiSilicon, Keysight |
R5-233174 | On the MU for n259 | ROHDE & SCHWARZ |
R5-233222 | Testability issue in FR2 Relative Power Control test case | Ericsson India Private Limited |
R5-233634 | FR2 RRM test cases: Known Issue List | Ericsson |
R5-233642 | Discussion on additional UE gain parameters in FR2 RRM testing | Ericsson |
R5-233696 | Discussion on affected list of RRM test cases with testability issues | Qualcomm France |
R5-233697 | Discussion on power settings in FR1 EVM including symbols with transient period | Anritsu, Apple Inc |
R5-233698 | Discussion on handling of test frequencies for band n79 10MHz channel bandwidth | Huawei, HiSilicon, Keysight |
R5-233701 | Testability issue in FR2 Relative Power Control test case | Ericsson India Private Limited |
R5-233760 | Discussion on power settings in FR1 EVM including symbols with transient period | Anritsu, Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-233270 | Correction of 36.508 4.1.1 on lower humidity limit in temperature test environment | Samsung R&D Institute UK, ZTE Corporation |
R5-233272 | Correction of 36.508 4.1.1 on lower humidity limit in temperature test environment | Samsung R&D Institute UK, ZTE Corporation |
R5-233763 | Correction of 36.508 4.1.1 on lower humidity limit in temperature test environment | Samsung R&D Institute UK, ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-232375 | Correction of Spurious emissions for UE co-existence requirement of LTE | CAICT |
R5-232392 | CR for 36.521-1 on p-Max corrections for Power Class 1 Band 14 | AT&T, Apple Inc |
R5-232988 | Correction to upper and lower limit of NS_23 in 6.2.4 | Anritsu |
R5-232989 | Correction to lower limit of NS_05 in 6.2.4A.2_1 | Anritsu |
R5-233029 | Clarification of spurious emsission testing configuration - LTE | Huawei, HiSilicon |
R5-233546 | Clarification of spurious emsission testing configuration - LTE | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-233165 | Update of UE category in test case 7.4 | ROHDE & SCHWARZ |
TDoc | Title | Source |
---|---|---|
R5-232449 | Correct of condition for intra-band contiguous DL CA and UL CA | Sporton |
R5-233187 | Editorial correction to table ID reference in Table A.4.5-1 | Bureau Veritas ADT |
TDoc | Title | Source |
---|---|---|
R5-232433 | Corrections to A-GNSS minimum performance test scenarios | Rohde & Schwarz |
R5-232434 | Corrections to A-GNSS minimum performance test scenarios chapter 13 | Rohde & Schwarz |
R5-232435 | Corrections to A-Galileo relative signal power | Rohde & Schwarz |
R5-233680 | Corrections to A-GNSS minimum performance test scenarios | Rohde & Schwarz |
R5-233681 | Corrections to A-GNSS minimum performance test scenarios chapter 13 | Rohde & Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232436 | Addition A-GNSS minimum performance test scenarios for RNSS | ROHDE & SCHWARZ |
R5-232437 | Corrections to A-GPS + A-GLO test scenario | Rohde & Schwarz |
R5-232711 | Addition A-GNSS mininimum performance test scenarios for RNSS | ROHDE & SCHWARZ |
R5-233682 | Addition A-GNSS mininimum performance test scenarios for RNSS | ROHDE & SCHWARZ |
TDoc | Title | Source |
---|---|---|
R5-233021 | Correction in A.3.1.1.2 and default message content | Keysight Technologies UK Ltd |
R5-233149 | Correction in A.12.1.1 test | Keysight Technologies UK Ltd |
R5-233151 | Correction in A.12.1.1 test scenario | Keysight Technologies UK Ltd |
R5-233221 | Updates to Initial Conditions for Conducted Mode Fading Tests | Qualcomm Europe Inc. Sweden |
R5-233683 | Correction in A.3.1.1.2 and default message content | Keysight Technologies UK Ltd |
R5-233684 | Correction in A.12.1.1 test scenario | Keysight Technologies UK Ltd |
TDoc | Title | Source |
---|---|---|
R5-233668 | LS response on CA/DC MSD requirements | TSG WG RAN5 |
R5-233669 | LS on additional UE gain parameters | TSG WG RAN5 |
R5-233670 | LS on RRM test cases with testability issues | TSG WG RAN5 |
R5-233671 | LS on signal variance in FR2 multiple AoA tests | TSG WG RAN5 |
R5-233672 | LS on clarifications for Non-Terrestrial Networks | TSG WG RAN5 |
TDoc | Title | Source |
---|---|---|
R5-232495 | Correction to RRC IEs for NR sidelink test | Huawei, Hisilicon |
R5-232576 | Correction to RRC IEs for NR sidelink test | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232716 | Correction to NR SL SIG TC 12.2.8.3 - PC5 RLF | TDIA, CATT |
TDoc | Title | Source |
---|---|---|
R5-232194 | 5G V2X: Test Model updates | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232496 | Discussion on frequencyInfo for NR SL RSRP measurements | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232590 | Add test case 8.2.5.7.1 | Ericsson |
R5-232591 | Add test case 8.2.5.7.2 | Ericsson |
R5-232592 | Update test case 8.2.5.7.1 | Ericsson |
R5-232593 | Update test case 8.2.5.7.2 | Ericsson |
R5-233061 | Addition of NR unlicensed test case 6.6.2.2 | Qualcomm Incorporated |
R5-233068 | Addition of NR unlicensed test case 6.6.2.4 | Qualcomm Incorporated |
R5-233080 | Addition of NR unlicensed test case 6.6.2.2 | Qualcomm Incorporated |
R5-233081 | Addition of NR unlicensed test case 6.6.2.4 | Qualcomm Incorporated |
R5-233359 | Update test case 8.2.5.7.1 | Ericsson |
R5-233360 | Update test case 8.2.5.7.2 | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-233069 | Applicability updates to NR unlicensed test cases | Qualcomm Incorporated |
R5-233079 | Applicability updates to NR unlicensed test cases | Qualcomm Incorporated |
TDoc | Title | Source |
---|---|---|
R5-232320 | Update of MAC implementation capabilities | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232197 | Corrections to EN-DC test case 8.2.6.3.1 | MCC TF160 |
R5-232198 | Corrections to EN-DC test case 8.2.6.3.2 | MCC TF160 |
R5-232258 | Update test case 8.1.1.4.7 | Ericsson |
R5-232317 | Update test case 8.1.1.4.8 | Ericsson |
R5-232318 | Update test case 8.1.1.4.9 | Ericsson |
R5-232729 | Update of TC 8.1.5.11.3- Idle/Inactive measurements / Inactive mode / SIB11 configuration / Measurement of NR cells | TDIA, CATT |
R5-232730 | Update of TC 8.1.5.11.4-Idle/Inactive measurements / Inactive mode / RRCRelease configuration / Measurement of NR cells | TDIA, CATT |
R5-233455 | Corrections to EN-DC test case 8.2.6.3.2 | MCC TF160 |
R5-233482 | Update test case 8.1.1.4.7 | Ericsson |
R5-233483 | Update test case 8.1.1.4.9 | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232319 | Update titles for test cases 8.1.1.4.7-9 | Ericsson |
R5-233484 | Update titles for test cases 8.1.1.4.7-9 | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-233142 | Update to test procedure for registration of a MUSIM UE | Qualcomm Incorporated |
TDoc | Title | Source |
---|---|---|
R5-232036 | Addition of MUSIM UAI test function | China Telecom |
R5-233380 | Addition of MUSIM UAI test function | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232037 | Add new NR Multi-SIM test case 8.1.5.10.2 | China Telecom |
R5-232714 | Correction to NR MUSIM TC 8.1.5.10.3 | TDIA, CATT |
R5-233143 | Update to NR MUSIM test case 9.1.5.1.16 | Qualcomm Incorporated |
R5-233144 | Update to NR MUSIM test case 9.1.7.4 | Qualcomm Incorporated |
R5-233145 | Update to NR MUSIM test case 9.1.7.3 | Qualcomm Incorporated, ROHDE & SCHWARZ |
R5-233469 | Add new NR Multi-SIM test case 8.1.5.10.2 | China Telecom |
R5-233470 | Correction to NR MUSIM TC 8.1.5.10.3 | TDIA, CATT |
TDoc | Title | Source |
---|---|---|
R5-232038 | Add applicability for NR multi-SIM test case 8.1.5.10.2 | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232199 | Multi-SIM: Addition of NR MUSIM Test Model | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232055 | Correction to generic procedure 4.5.2E | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232719 | Update of MUSIM test case 9.2.1.1.33 | TDIA, CATT |
R5-233487 | Update of MUSIM test case 9.2.1.1.33 | TDIA, CATT |
TDoc | Title | Source |
---|---|---|
R5-232944 | Addition of Procedure to check TMGI and associated MRB reception in a multicast MBS session | Huawei, Hisilicon |
R5-232945 | Update PDCCH-Config for MSS condtion | Huawei, Hisilicon |
R5-232946 | Delete NR-19 for MBS in the Common configurations of system information blocks | Huawei, Hisilicon |
R5-233382 | Addition of Procedure to check TMGI and associated MRB reception in a multicast MBS session | Huawei, Hisilicon |
R5-233383 | Update PDCCH-Config for MSS condtion | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232947 | Addition of PICS for MBS TC | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232948 | Correction of MBS Broadcast TCs 14.1.x | Huawei, Hisilicon |
R5-232949 | Correction of MBS Multicast TC 14.2.4.1.x-group paging | Huawei, Hisilicon |
R5-232950 | Addition of MBS Broadcast TC 14.1.1.2-becoming interested to receive MBS broadcast services | Huawei, Hisilicon |
R5-232951 | Addition of MBS Broadcast TC 14.1.1.3-MCCH Information change notification | Huawei, Hisilicon |
R5-232952 | Addition of MBS Broadcast TC 14.1.1.4-receiving SIB20 of an SCell via dedicated signalling | Huawei, Hisilicon |
R5-232953 | Addition of MBS Multicast TC 14.2.1.1.2-DCI format 4_2 | Huawei, Hisilicon |
R5-232954 | Addition of MBS Multicast TC 14.2.1.1.6-DCI-based ACK-NACK HARQ feedback for Multicast | Huawei, Hisilicon |
R5-232955 | Addition of MBS Multicast TC 14.2.1.1.9-DCI-based NACK-only HARQ feedback for Multicast | Huawei, Hisilicon |
R5-232956 | Addition of MBS Multicast TC 14.2.1.2.2-DRX-PTM retransmission for multicast | Huawei, Hisilicon |
R5-232957 | Addition of MBS Multicast TC 14.2.1.2.3-DRX-PTP retransmission for multicast | Huawei, Hisilicon |
R5-232958 | Addition of MBS Multicast TC 14.2.4.3.1-Handover between multicast supporting cell | Huawei, Hisilicon |
R5-232959 | Addition of MBS Multicast TC 14.2.4.3.2-Re-establishment | Huawei, Hisilicon |
R5-232960 | Addition of MBS Multicast TC 14.2.4.3.3-Handover between Multicast-supporting cell and Multicast non-supporting cell | Huawei, Hisilicon |
R5-232961 | Addition of MBS Multicast TC 14.2.5.1.1-Network-requested PDU session modification to remove UE from MBS session | Huawei, Hisilicon |
R5-232962 | Addition of MBS Multicast TC 14.2.5.1.2-Network-requested PDU session modification to update MBS service area | Huawei, Hisilicon |
R5-232963 | Addition of MBS Multicast TC 14.2.5.2.1-UE-requested to join MBS multicast session-accept | Huawei, Hisilicon |
R5-233384 | Addition of MBS Broadcast TC 14.1.1.2-becoming interested to receive MBS broadcast services | Huawei, Hisilicon |
R5-233385 | Addition of MBS Multicast TC 14.2.4.3.1-Handover between multicast supporting cell | Huawei, Hisilicon |
R5-233386 | Addition of MBS Multicast TC 14.2.4.3.2-Re-establishment | Huawei, Hisilicon |
R5-233387 | Addition of MBS Multicast TC 14.2.5.1.1-Network-requested PDU session modification to remove UE from MBS session | Huawei, Hisilicon |
R5-233388 | Addition of MBS Multicast TC 14.2.5.1.2-Network-requested PDU session modification to update MBS service area | Huawei, Hisilicon |
R5-233389 | Addition of MBS Multicast TC 14.2.5.2.1-UE-requested to join MBS multicast session-accept | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232964 | Addition of test applicablity for MBS TC | Huawei, Hisilicon |
R5-233390 | Addition of test applicablity for MBS TC | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232497 | Correction to default configuration of RRC IEs for NR cov enh test | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232498 | Addition of PICS for NR cov enh SIG TCs | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232499 | Addition of NR cov enh SIG TC 7.1.1.2.6 dynamic PUCCH repetition | Huawei, HiSilicon |
R5-232500 | Addition of NR cov enh SIG TC 7.1.1.3.14.1 DG PUSCH repetition 32 | Huawei, HiSilicon |
R5-232501 | Addition of NR cov enh SIG TC 7.1.1.3.14.2 CG PUSCH repetition 32 | Huawei, HiSilicon |
R5-232502 | Addition of NR cov enh SIG TC 7.1.1.3.14.3 DG PUSCH availableSlotCouting | Huawei, HiSilicon |
R5-232503 | Addition of NR cov enh SIG TC 7.1.1.3.14.4 CG PUSCH availableSlotCouting | Huawei, HiSilicon |
R5-232504 | Addition of NR cov enh SIG TC 7.1.1.3.15.1 TBoMS | Huawei, HiSilicon |
R5-232505 | Addition of NR cov enh SIG TC 7.1.1.3.15.2 TBoMS repetition | Huawei, HiSilicon |
R5-232506 | Addition of NR cov enh SIG TC 7.1.1.4.2.7 TBoMS TBS selection | Huawei, HiSilicon |
R5-232507 | Correction to NR SA SIG TC 8.1.5.8.1 UE capability transfer | Huawei, HiSilicon |
R5-233295 | Correction to NR SA SIG TC 8.1.5.1.1 UE capability transfer | Huawei, HiSilicon |
TDoc | Title | Source |
---|---|---|
R5-232508 | Addition of applicability for NR cov enh SIG TCs | Huawei, Hisilicon |
R5-233394 | Addition of applicability for NR cov enh SIG TCs | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232189 | Addition of new PICS for Enhancement of data collection for SON/MDT in NR standalone | Lenovo |
TDoc | Title | Source |
---|---|---|
R5-232185 | Addition of new MAC test case for Logging and reporting of on-Demand SI | Lenovo |
R5-232186 | Addition of new MAC test case for Logging and reporting of 2-step RACH report | Lenovo |
R5-232187 | Addition of new MAC test case for Logging and reporting fallback to 4-step RA | Lenovo |
R5-232682 | Corrections to MDT test case 8.1.6.1.4.9 | Qualcomm CDMA Technologies |
R5-232781 | Update of test case 8.1.6.1.2.15 for SON_MDT | CMCC |
R5-233278 | Addition of new RRC test case for Logging and reporting of on-Demand SI | Lenovo |
R5-233279 | Addition of new RRC test case for Logging and reporting of 2-step RACH report | Lenovo |
R5-233280 | Addition of new RRC test case for Logging and reporting fallback to 4-step RA | Lenovo |
R5-233377 | Update of test case 8.1.6.1.2.15 for SON_MDT | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232188 | Addition of applicability of new MAC test cases Enhancement of data collection for SON/MDT in NR standalone | Lenovo |
R5-233281 | Addition of applicability of new RRC test cases Enhancement of data collection for SON/MDT in NR standalone | Lenovo |
R5-233381 | Addition of applicability of new RRC test cases Enhancement of data collection for SON/MDT in NR standalone | Lenovo |
TDoc | Title | Source |
---|---|---|
R5-232289 | Update eNS test case 9.1.13.2 | ZTE Corporation |
R5-232290 | Update eNS test case 9.3.1.4 | ZTE Corporation |
R5-232291 | Update eNS test case 10.1.8.4 | ZTE Corporation |
R5-232292 | Update eNS test case10.1.8.5 | ZTE Corporation |
R5-232717 | Update of TC 10.1.8.3- NSAC / PDU session establishment reject / Maximum number of PDU sessions reached / Back-off timer is zero or not included | TDIA, CATT |
R5-232777 | Update to eNS_Ph2 test case 9.1.12.1 | CMCC |
R5-232778 | Update to eNS_Ph2 test case 9.1.12.2 | CMCC |
R5-232973 | Correction of NR TC 10.1.8.1-NSAC | Huawei, Hisilicon, Datang LinkTester, CATT |
R5-232974 | Correction of NR TC 10.1.8.2-NSAC | Huawei, Hisilicon, Datang LinkTester, CATT |
R5-233378 | Update to eNS_Ph2 test case 9.1.12.1 | CMCC |
R5-233400 | Update eNS test case 9.1.13.2 | ZTE Corporation |
R5-233401 | Update eNS test case 10.1.8.4 | ZTE Corporation |
R5-233402 | Update eNS test case10.1.8.5 | ZTE Corporation |
R5-233403 | Update of TC 10.1.8.3- NSAC / PDU session establishment reject / Maximum number of PDU sessions reached / Back-off timer is zero or not included | TDIA, CATT |
R5-233404 | Correction of NR TC 10.1.8.1-NSAC | Huawei, Hisilicon, Datang LinkTester, CATT |
R5-233405 | Correction of NR TC 10.1.8.2-NSAC | Huawei, Hisilicon, Datang LinkTester, CATT |
R5-233468 | Update eNS test case 9.3.1.4 | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-232937 | Update general configuration parameter for HD-FDD UE | Huawei, Hisilicon, MCC TF160 |
R5-233406 | Update general configuration parameter for HD-FDD UE | Huawei, Hisilicon, MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232088 | Correction to RedCap TC 6.1.2.26 | MediaTek Inc. |
R5-232089 | Correction to RedCap test case 11.7.1 | MediaTek Inc., Huawei, Hisilicon, MCC TF160 |
R5-232090 | Correction to RedCap test case 11.7.2 | MediaTek Inc., Huawei, Hisilicon, MCC TF160 |
R5-232938 | Update NR MAC TC 7.1.1.1.1-7.1.1.1.1a-7.1.1.1.8 for HD-FDD UE-PRACH | Huawei, Hisilicon, MCC TF160 |
R5-232939 | Update NR MAC TC 7.1.1.1.2 and RRC TC 8.1.5.2.2 for HD-FDD UE-PRACH | Huawei, Hisilicon, MCC TF160 |
R5-232940 | Addition of new RedCap TC 7.1.1.1.15-SI request | Huawei, Hisilicon |
R5-232941 | Update URLLC TC 7.1.1.3.12 for HD-FDD UE-PUSCH repetition Type B | Huawei, Hisilicon, MCC TF160 |
R5-232942 | Correction of NR TC 7.1.2.3.6-Polling for status | Huawei, Hisilicon, Datang LinkTester, CATT |
R5-232981 | Correction to RedCap testcase 6.1.2.26 | ROHDE & SCHWARZ, Anritsu Ltd |
R5-233070 | Updates for NR RRC test case 8.1.5.1.1 for RedCap | MCC TF160 |
R5-233071 | Updates for NR RRC test case 8.1.5.8.1 for RedCap | MCC TF160 |
R5-233407 | Update NR MAC TC 7.1.1.1.1-7.1.1.1.1a-7.1.1.1.8 for HD-FDD UE-PRACH | Huawei, Hisilicon, MCC TF160 |
R5-233408 | Update NR MAC TC 7.1.1.1.2 and RRC TC 8.1.5.2.2 for HD-FDD UE-PRACH | Huawei, Hisilicon, MCC TF160 |
R5-233409 | Update URLLC TC 7.1.1.3.12 for HD-FDD UE-PUSCH repetition Type B | Huawei, Hisilicon, MCC TF160 |
R5-233410 | Correction of NR TC 7.1.2.3.6-Polling for status | Huawei, Hisilicon, Datang LinkTester, CATT |
R5-233411 | Correction to RedCap test case 11.7.1 | MediaTek Inc., Huawei, Hisilicon, MCC TF160 |
R5-233412 | Correction to RedCap test case 11.7.2 | MediaTek Inc., Huawei, Hisilicon, MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232943 | Addition of test applicablity for RedCap TC | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232191 | RedCap: Test Model updates | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232091 | Correction to SDT TC 7.1.1.13.1 | MediaTek Inc. |
R5-232092 | Correction to SDT TC 7.1.1.13.2 | MediaTek Inc. |
R5-232093 | Correction to SDT TC 7.1.1.13.3 | MediaTek Inc. |
R5-232095 | Correction to SDT TC 7.1.1.13.4 | MediaTek Inc. |
R5-232096 | Editorial corrections to SDT TC 8.1.5.13.1 | MediaTek Inc. |
R5-232183 | Update to MAC test case for RA Based SDT / 2-step RACH | Lenovo |
R5-232184 | Update to MAC test case for RA Based SDT / 4-step RACH | Lenovo |
R5-232899 | Addition to testcase 8.1.5.13.3 SDT-SRB2-Indication | Nokia, Nokia Shanghai Bell |
R5-232969 | Correction of SDT TC 7.1.1.13.5-cg-SDT-TATimer | Huawei, Hisilicon |
R5-233413 | Correction to SDT TC 7.1.1.13.1 | MediaTek Inc. |
R5-233415 | Update to MAC test case for RA Based SDT / 2-step RACH | Lenovo |
R5-233416 | Update to MAC test case for RA Based SDT / 4-step RACH | Lenovo |
TDoc | Title | Source |
---|---|---|
R5-232690 | Updates to SIB19 for NR NTN | Qualcomm CDMA Technologies |
R5-232691 | Update IE ServingCellConfigCommon for NR NTN | Qualcomm CDMA Technologies |
R5-232692 | Update to clause 4.4.3 Common parameters for NR NTN | Qualcomm CDMA Technologies |
R5-232693 | Addition of NTN freq bands to clause 6.2.3 for Default test frequencies | Qualcomm CDMA Technologies |
R5-232694 | Addition of new clause for UE Position Requirements for NR NTN testing | Qualcomm CDMA Technologies |
R5-233369 | Addition of new clause for UE Position Requirements for NR NTN testing | Qualcomm CDMA Technologies |
R5-233434 | Updates to SIB19 for NR NTN | Qualcomm CDMA Technologies |
R5-233435 | Update IE ServingCellConfigCommon for NR NTN | Qualcomm CDMA Technologies |
R5-233436 | Update to clause 4.4.3 Common parameters for NR NTN | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-233163 | Addition of new RRC TC for NR NTN | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-233164 | Addition of applicability for NR NTN test case | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-232416 | Addition of PICS for Rel-17 eNPN | China Telecom |
R5-233471 | Addition of PICS for Rel-17 eNPN | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232417 | Addition of Rel-17 eNPN TC 6.5.3.1 | China Telecom |
R5-232418 | Addition of Rel-17 eNPN TC 6.5.3.2 | China Telecom |
R5-232419 | Addition of Rel-17 eNPN TC 6.5.3.3 | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232420 | Addition of applicability for NPN test cases | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232784 | Addition of a new combination of system information block for SIB16 | CMCC |
R5-233379 | Addition of a new combination of system information block for SIB16 | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232179 | Update to MAC test case for 4 step RACH with Slice specific RACH configuration | Lenovo |
R5-232180 | Update to MAC test case for 4 step RACH with Slice specific RACH configuration with ra-PrioritizationForSlicing | Lenovo |
R5-232181 | Update to MAC test case for 2 step RACH with Slice specific RACH configuration | Lenovo |
R5-232182 | Update to MAC test case for 2 step RACH with Slice specific RACH configuration with ra-PrioritizationForSlicing | Lenovo |
R5-232252 | Addition of Enhancement of RAN slicing for NR test case 6.1.2.25 | CATT, TDIA |
R5-232785 | Update of test case 6.1.2.24 for NR slice | CMCC |
R5-232786 | Update of test case 6.4.2.3 for NR slice | CMCC |
R5-233420 | Addition of Enhancement of RAN slicing for NR test case 6.1.2.25 | CATT, TDIA |
R5-233421 | Update of test case 6.1.2.24 for NR slice | CMCC |
R5-233422 | Update of test case 6.4.2.3 for NR slice | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232253 | Addition of applicability of test case 6.1.2.25 | CATT, TDIA |
R5-233472 | Addition of applicability of test case 6.1.2.25 | CATT, TDIA |
TDoc | Title | Source |
---|---|---|
R5-232713 | Addition of PC5 RRC message uuMessageTransferSidelink | TDIA, CATT |
R5-232715 | Addition of PC5 RRC RemoteUEInformationSidelink message | TDIA, CATT |
R5-232721 | Update of PC5 RRC message SL-L2RelayUE-Config | TDIA, CATT |
R5-232722 | Update of PC5 RRC message Uu-RelayRLC-ChannelConfig | TDIA,CATT |
R5-232743 | Update of the contents of RRC messages for L2 U2N relay related operation | TDIA, CATT |
R5-232746 | Update of the contents of Sidelink information elements | TDIA, CATT |
R5-233423 | Addition of PC5 RRC message uuMessageTransferSidelink | TDIA, CATT |
R5-233424 | Addition of PC5 RRC RemoteUEInformationSidelink message | TDIA, CATT |
R5-233425 | Update of PC5 RRC message Uu-RelayRLC-ChannelConfig | TDIA,CATT |
R5-233426 | Update of PC5 RRC message SL-L2RelayUE-Config | TDIA, CATT |
TDoc | Title | Source |
---|---|---|
R5-232267 | Addition of new test case 7.1.3.6.8 for PDCP UDC | CATT |
R5-232268 | Addition of new test case 7.1.3.6.9 for PDCP UDC | CATT |
R5-233362 | Addition of new test case 7.1.3.6.8 for PDCP UDC | CATT |
R5-233363 | Addition of new test case 7.1.3.6.9 for PDCP UDC | CATT |
TDoc | Title | Source |
---|---|---|
R5-232269 | Addition of applicability for PDCP UDC test cases | CATT |
TDoc | Title | Source |
---|---|---|
R5-232192 | NR UDC: Addition of Test Model | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232050 | Correction to power saving enhancements TC 8.1.1.1a.1 | MediaTek Inc. |
R5-232051 | Correction to power saving enhancements TC 8.1.1.1a.2 | MediaTek Inc. |
R5-232052 | Correction to power saving enhancements TC 8.1.1.1a.3 | MediaTek Inc. |
R5-232053 | Correction to power saving enhancements TC 9.1.14.1 | MediaTek Inc. |
R5-232054 | Correction to power saving enhancements TC 11.4.1a | MediaTek Inc. |
R5-233427 | Correction to power saving enhancements TC 8.1.1.1a.1 | MediaTek Inc. |
R5-233428 | Correction to power saving enhancements TC 11.4.1a | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232534 | Update of default configuration for IoT NTN | MediaTek Inc. |
R5-232560 | Update of default configuration for IoT NTN | MediaTek Inc. |
R5-233156 | Addition of system information combination for NBIOT GSO NTN | Qualcomm Incorporated |
R5-233365 | Addition of system information combination for NBIOT GSO NTN | Qualcomm Incorporated |
R5-233437 | Update of default configuration for IoT NTN | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232535 | Correction to IoT NTN TC 6.1.1.11 | MediaTek Inc. |
R5-232536 | Correction to IoT NTN TC 7.1.6.6 | MediaTek Inc. |
R5-232537 | Correction to IoT NTN TC 9.2.1.1.34 | MediaTek Inc. |
R5-232538 | Correction to IoT NTN TC 22.2.13 | MediaTek Inc. |
R5-232539 | Correction to IoT NTN TC 22.3.1.5a | MediaTek Inc., Qualcomm Incorporated |
R5-232540 | Correction to IoT NTN TC 22.5.23 | MediaTek Inc. |
R5-232541 | Correction to Idle Mode Test Case to enable IoT NTN test | MediaTek Inc. |
R5-232542 | Correction to RRC Test Case to enable IoT NTN test | MediaTek Inc. |
R5-232543 | Correction to NAS Test Case to enable IoT NTN test | MediaTek Inc. |
R5-232544 | Correction to NB-IoT Test Case to enable IoT NTN test | MediaTek Inc. |
R5-233155 | Update to NBIOT NTN test case 22.3.1.5a | Qualcomm Incorporated |
R5-233160 | Update to NBIOT NTN multi-TAC test case 22.2.13 | Qualcomm Incorporated |
R5-233364 | Correction to NAS Test Case to enable IoT NTN test | MediaTek Inc. |
R5-233367 | Update to NBIOT NTN multi-TAC test case 22.2.13 | Qualcomm Incorporated |
R5-233438 | Correction to IoT NTN TC 6.1.1.11 | MediaTek Inc. |
R5-233439 | Correction to IoT NTN TC 7.1.6.6 | MediaTek Inc. |
R5-233440 | Correction to IoT NTN TC 22.2.13 | MediaTek Inc. |
R5-233441 | Correction to IoT NTN TC 22.3.1.5a | MediaTek Inc., Qualcomm Incorporated |
R5-233451 | Correction to Idle Mode Test Case to enable IoT NTN test | MediaTek Inc. |
R5-233452 | Correction to RRC Test Case to enable IoT NTN test | MediaTek Inc. |
R5-233453 | Correction to NB-IoT Test Case to enable IoT NTN test | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232545 | Update of applicability for IoT NTN | MediaTek Inc. |
R5-232546 | Applicable eMTC cases for IoT NTN | MediaTek Inc. |
R5-232547 | Applicable NB-IoT cases for IoT NTN | MediaTek Inc. |
R5-233366 | Update of applicability for IoT NTN | MediaTek Inc. |
R5-233442 | Update to NTN PICS parameters | Qualcomm |
R5-233443 | RAT specific PICS parameter update to applicability of NTN test cases | Qualcomm |
R5-233444 | Applicability of legacy NB-IoT test cases to NTN GSO only UEs | Qualcomm |
R5-233479 | RAT specific PICS parameter update to applicability of NTN test cases | Qualcomm |
R5-233480 | Applicability of legacy NB-IoT test cases to NTN GSO only UEs | Qualcomm |
TDoc | Title | Source |
---|---|---|
R5-232193 | NTN-IoT: NB-IoT Test Model updates | MCC TF160 |
R5-233454 | NTN-IoT: NB-IoT Test Model updates | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232548 | Discussion paper of handling legacy test case for IoT NTN UE | MediaTek Inc. |
R5-233161 | Applicability of legacy NB-IOT testcases to NTN GSO capable UE | Qualcomm Incorporated |
R5-233478 | Discussion paper of handling legacy test case for IoT NTN UE | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232965 | Add PICS for EPS UPIP | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232966 | Addition of UPIP TC 8.2.6.4.2-RRC re-establishment | Huawei, Hisilicon |
R5-232967 | Addition of UPIP TC 8.2.6.4.3-HO | Huawei, Hisilicon |
R5-233391 | Addition of UPIP TC 8.2.6.4.2-RRC re-establishment | Huawei, Hisilicon |
R5-233392 | Addition of UPIP TC 8.2.6.4.3-HO | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232262 | Introduction of R17 Positioning Enhancements default test conditions in TS 37.571-2 | CATT |
R5-232263 | Addition of new positioning test case for pre-configured measurement gap procedures | CATT |
R5-232264 | Addition of new positioning test case for pre-configured PRS processing window procedures | CATT |
R5-232265 | Addition of new positioning test case for UE positioning assistance information procedures | CATT |
R5-233395 | Introduction of R17 Positioning Enhancements default test conditions in TS 37.571-2 | CATT |
R5-233396 | Addition of new positioning test case for pre-configured measurement gap procedures | CATT |
R5-233397 | Addition of new positioning test case for pre-configured PRS processing window procedures | CATT |
R5-233398 | Addition of new positioning test case for UE positioning assistance information procedures | CATT |
TDoc | Title | Source |
---|---|---|
R5-232266 | Addition of test applicabilities for Release-17 NR positioning enhancement signaling test cases | CATT |
R5-233399 | Addition of test applicabilities for Release-17 NR positioning enhancement signaling test cases | CATT |
TDoc | Title | Source |
---|---|---|
R5-232288 | Add generic procedure for Switch off / Power off procedure in MA PDU session Established on NR and WLAN | ZTE Corporation |
R5-233429 | Add generic procedure for Switch off / Power off procedure in MA PDU session Established on NR and WLAN | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-232039 | Addition of ATSSS new TC 10.4.2.2 | China Telecom |
R5-232085 | Correction to ATSSS TC 10.4.1.1 | MediaTek Inc. |
R5-232086 | Correction to ATSSS TC 10.4.1.2 | MediaTek Inc. |
R5-232087 | Correction to ATSSS TC 10.4.1.4 | MediaTek Inc. |
R5-232705 | Addition of ATSSS TC 10.4.1.5 - UE-requested MA PDU session modification / ATSSS / Success | CATT, TDIA |
R5-232706 | Addition of new ATSSS test case 10.4.1.6 | CATT, TDIA |
R5-233430 | Addition of ATSSS new TC 10.4.2.2 | China Telecom |
R5-233431 | Correction to ATSSS TC 10.4.1.2 | MediaTek Inc. |
R5-233432 | Correction to ATSSS TC 10.4.1.4 | MediaTek Inc. |
R5-233433 | Addition of new ATSSS test case 10.4.1.6 | CATT, TDIA |
TDoc | Title | Source |
---|---|---|
R5-232270 | Add applicability for ATSSS TC 10.4.2.2 | China Telecom |
R5-232708 | Addition of applicability for new ATSSS test case 10.4.1.5 and 10.4.1.6 | CATT, TDIA |
TDoc | Title | Source |
---|---|---|
R5-232597 | Updates to MCData UE Configuration and User Profile | NIST |
R5-232598 | Addition of MCData Functional Alias Generic Procedures | NIST |
R5-232599 | Updates to MCData PIDF for functional alias | NIST |
R5-232600 | Updates to 5.3.3 Pre-Established Session Establishment Generic TC | NIST |
R5-232601 | Updates to MCData-Info from the UE | NIST |
R5-232602 | Updates to SDP Message from the SS for MCData | NIST |
R5-232603 | Updates to SDP Message from the UE for MCData | NIST |
R5-233293 | Addition of generic Functional Alias Generic Procedures | NIST |
R5-233294 | Updates to SDP Message from the SS for MCData | NIST |
R5-233488 | Updates to MCData UE Configuration and User Profile | NIST |
R5-233489 | Updates to MCData PIDF for functional alias | NIST |
R5-233490 | Updates to 5.3.3 Pre-Established Session Establishment Generic TC | NIST |
R5-233491 | Updates to MCData-Info from the UE | NIST |
R5-233492 | Updates to SDP Message from the UE for MCData | NIST |
TDoc | Title | Source |
---|---|---|
R5-232195 | Correction of test case 5.9 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232605 | Updates to Applicability | NIST |
TDoc | Title | Source |
---|---|---|
R5-232604 | Update to MCX PIXITs for MCData Functional Alias | NIST |
TDoc | Title | Source |
---|---|---|
R5-232196 | Correction of test case 6.4.2 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232594 | Addition of new test case 5.5 for Pre-established Session Configuration | NIST |
R5-232595 | Addition of new test case 5.6 for CSK Download | NIST |
R5-232596 | Addition of new test case 5.7 for Functional Alias | NIST |
R5-233493 | Addition of new test case 5.7 for Functional Alias | NIST |
TDoc | Title | Source |
---|---|---|
R5-232312 | Addition of signalling test frequencies for LTE Band 54 | Ligado Networks |
TDoc | Title | Source |
---|---|---|
R5-232325 | Updates to test case applicability as part of Introduction of LTE Band 54 | Ligado Networks |
TDoc | Title | Source |
---|---|---|
R5-232326 | Updates to guidelines on test execution for LTE Band 54 | Ligado Networks |
R5-233414 | Updates to guidelines on test execution for LTE Band 54 | Ligado Networks |
TDoc | Title | Source |
---|---|---|
R5-233202 | Addition of PICS for UE support of Uncrewed Aerial Systems | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-233195 | Corrections to Test frequencies for NR CA configurations for signalling testing | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-232056 | Correction to test procedure 4.9.9 | MediaTek Inc. |
R5-232638 | Correction to switch off test procedure | Keysight Technologies UK, MediaTek Inc. |
R5-233474 | Correction to switch off test procedure | Keysight Technologies UK, MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232057 | Correction to PDCCH-Config for DCI_2-6 | MediaTek Inc. |
R5-232639 | Correction to introduce search space configuration changes for DCI_2-6 transmission | Keysight Technologies UK |
R5-233317 | Correction to introduce search space configuration changes for DCI_2-6 transmission | Keysight Technologies UK |
TDoc | Title | Source |
---|---|---|
R5-232770 | Updates to default 5GMM messages | Ericsson |
R5-232970 | Update Service accept NAS message | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232396 | Corrections to Clause 6.2.3.7 Test frequencies for NR sidelink configurations for signalling testing | Qualcomm Technologies Ireland |
R5-232443 | Introduction of test frequencies for signalling testing for new NR band n13 | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232971 | Update RadioBearerConfig-SRB2-DRB message | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232058 | Correction to DAPS PICS | MediaTek Inc. |
R5-232684 | Addition of PICS for support of mpsPriorityIndication on RRC release with redirect | Qualcomm CDMA Technologies |
R5-233320 | Addition of PICS for support of mpsPriorityIndication on RRC release with redirect | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-232059 | Correction to Idle mode TC 6.1.1.4a and 6.1.2.15a | MediaTek Inc. |
R5-232060 | Correction to CAG TC 6.5.2.1 | MediaTek Inc. |
R5-232061 | Correction to CAG TC 6.5.2.2 | MediaTek Inc. |
R5-232062 | Correction to CAG TC 6.5.2.3 | MediaTek Inc. |
R5-232063 | Correction to CAG TC 6.5.2.4 | MediaTek Inc. |
R5-232064 | Correction to CAG TC 6.5.2.6 | MediaTek Inc. |
R5-232131 | Correction to NR Inter-RAT test case 6.2.3.4 | Anritsu EMEA Ltd |
R5-232330 | Correction to FR2 Power level tables for NR Idle mode test cases | Anritsu EMEA Ltd |
R5-232395 | Editorial updates to Table 6.1.2.7.3.2-1 from Cell reselection/Equivalent PLMN test cases | Qualcomm Technologies Ireland |
R5-232451 | Correction of test procedure on TC 6.3.2.1 | NTT DOCOMO, INC., MCC TF160 |
R5-232452 | Correction of test procedure on TC 6.3.2.2 | NTT DOCOMO, INC., MCC TF160 |
R5-232453 | Correction of test procedure on TC 6.3.2.3 | NTT DOCOMO, INC., MCC TF160 |
R5-232454 | Correction of test procedure on TC 6.3.2.4 | NTT DOCOMO, INC., MCC TF160 |
R5-232455 | Correction of test procedure on TC 6.3.2.5 | NTT DOCOMO, INC., MCC TF160 |
R5-232456 | Correction of test procedure on TC 6.3.2.6 | NTT DOCOMO, INC., MCC TF160 |
R5-232509 | Correction to NR SA SIG TC 6.1.2.2 Squal based | Huawei, HiSilicon |
R5-232644 | Addition of FR2 cell power levels for Idle mode test cases | Keysight Technologies UK |
R5-232645 | Addition of FR2 cell power levels for SNPN test cases | Keysight Technologies UK |
R5-232681 | Editorial updates to Table 6.1.2.7.3.2-1 from Cell reselection/Equivalent PLMN test case | Qualcomm CDMA Technologies |
R5-232688 | Addition of new Idle mode TC to test the intraFreqReselection in MIB message is set to not allowed | Qualcomm CDMA Technologies |
R5-232893 | Add new test case for 38.523-1 6.1.2 | Samsung |
R5-233313 | Update of NR TC 6.1.2.3-Cell selection | Huawei, Hisilicon |
R5-233321 | Correction to CAG TC 6.5.2.2 | MediaTek Inc. |
R5-233322 | Correction to NR SA SIG TC 6.1.2.2 Squal based | Huawei, HiSilicon |
R5-233323 | Addition of FR2 cell power levels for SNPN test cases | Keysight Technologies UK |
R5-233445 | Correction to FR2 Power level tables for NR Idle mode test cases | Anritsu EMEA Ltd |
R5-233456 | Correction of test procedure on TC 6.3.2.1 | NTT DOCOMO, INC., MCC TF160 |
R5-233457 | Correction of test procedure on TC 6.3.2.2 | NTT DOCOMO, INC., MCC TF160 |
R5-233458 | Correction of test procedure on TC 6.3.2.3 | NTT DOCOMO, INC., MCC TF160 |
R5-233459 | Correction of test procedure on TC 6.3.2.4 | NTT DOCOMO, INC., MCC TF160 |
R5-233460 | Correction of test procedure on TC 6.3.2.5 | NTT DOCOMO, INC., MCC TF160 |
R5-233461 | Correction of test procedure on TC 6.3.2.6 | NTT DOCOMO, INC., MCC TF160 |
R5-233462 | Addition of FR2 cell power levels for Idle mode test cases | Keysight Technologies UK |
R5-233463 | Addition of new Idle mode TC to test the intraFreqReselection in MIB message is set to not allowed | Qualcomm CDMA Technologies |
R5-233464 | Update of NR TC 6.1.2.3-Cell selection | Huawei, Hisilicon |
R5-233465 | Add new test case for 38.523-1 6.1.2 | Samsung |
R5-233776 | Update of NR TC 6.1.2.3-Cell selection | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232065 | Correction to MAC TC 7.1.1.12.3 | MediaTek Inc. |
R5-232200 | Corrections to NR MAC test cases 7.1.1.12.4.x | MCC TF160 |
R5-232284 | Update NR 2 step RACH test case 7.1.1.7 | ZTE Corporation |
R5-232285 | Update NR 2 step RACH test case 7.1.1.8 | ZTE Corporation |
R5-232286 | Addition of new NR 2 step RACH test case 7.1.1.19 | ZTE Corporation |
R5-232287 | Addition of new NR 2 step RACH test case 7.1.1.20 | ZTE Corporation |
R5-232366 | Correction to NR testcase 7.1.1.6.2 | ROHDE & SCHWARZ |
R5-232391 | Correction to NR testcase 7.1.1.12.3 | ROHDE & SCHWARZ |
R5-232397 | Correction to NR MAC test case 7.1.1.12.3 | Keysight Technologies UK, Qualcomm |
R5-232640 | Correction to NR MAC test cases 7.1.1.7.1.x | Keysight Technologies UK, Qualcomm |
R5-232641 | Correction to NR MAC test case 7.1.1.9.1 | Keysight Technologies UK, Qualcomm |
R5-232872 | Correction to NR testcase 7.1.1.3.2b | ROHDE & SCHWARZ |
R5-233072 | Updates to MAC TC 7.1.1.5.3 | MCC TF160 |
R5-233282 | Update NR 2 step RACH test case 7.1.1.1.7 | ZTE Corporation |
R5-233283 | Update NR 2 step RACH test case 7.1.1.1.8 | ZTE Corporation |
R5-233284 | Addition of new NR 2 step RACH test case 7.1.1.1.19 | ZTE Corporation |
R5-233285 | Addition of new NR 2 step RACH test case 7.1.1.1.20 | ZTE Corporation |
R5-233324 | Correction to NR MAC test cases 7.1.1.7.1.x | Keysight Technologies UK, Qualcomm |
R5-233325 | Update NR 2 step RACH test case 7.1.1.1.8 | ZTE Corporation |
R5-233326 | Addition of new NR 2 step RACH test case 7.1.1.1.9a | ZTE Corporation |
R5-233328 | Addition of new NR 2 step RACH test case 7.1.1.1.10a | ZTE Corporation |
R5-233447 | Correction to NR testcase 7.1.1.12.3 | ROHDE & SCHWARZ |
R5-233467 | Correction to NR testcase 7.1.1.12.3 | ROHDE & SCHWARZ |
TDoc | Title | Source |
---|---|---|
R5-232385 | Correction to RLC UM test case 7.1.2.2.5 | MCC TF160 |
R5-232972 | Correction of NR TC 7.1.2.3.11-RLC re-establishment | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232201 | Update to NR PDCP test case 7.1.3.5.2 | MCC TF160 |
R5-232381 | Correction to NR testcase 7.1.3.5.3 | ROHDE & SCHWARZ, Anritsu Ltd, Qualcomm, Keysight |
R5-232642 | Correction to NR PDCP test case 7.1.3.5.3 | Keysight Technologies UK |
R5-233073 | Updates to MAC TC 7.1.3.3.1 | MCC TF160 |
R5-233449 | Correction to NR testcase 7.1.3.5.3 | ROHDE & SCHWARZ, Anritsu Ltd, Qualcomm, Keysight |
TDoc | Title | Source |
---|---|---|
R5-232066 | Correction to NR RRC TC 8.1.1.3.7a | MediaTek Inc., Keysight, Rohde&Schwarz |
R5-233074 | Updates to RRC TC 8.1.1.1.2 | MCC TF160 |
R5-233358 | Correction to NR RRC TC 8.1.1.3.7a | MediaTek Inc., Keysight, Rohde&Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232155 | Correction to FR2 Power level tables for NR RRC test cases | Anritsu EMEA Ltd |
R5-232510 | Correction to NR SA SIG TC 8.1.3.1.18.x additional reporting | Huawei, HiSilicon |
R5-233075 | Updates to RRC TCs 8.1.3.1.17 and 8.1.3.1.18 | MCC TF160 |
R5-233327 | Updates to RRC TCs 8.1.3.1.17 and 8.1.3.1.18 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232331 | Correction to NR RRC IRAT HO test case 8.1.4.2.1.2 | Anritsu EMEA Ltd |
TDoc | Title | Source |
---|---|---|
R5-232202 | Updates for NR RRC test case 8.1.5.1.1 | MCC TF160 |
R5-232683 | Addition of new RRC TC for RRCRelease with redirection with mpsPriorityIndication-r16 | Qualcomm CDMA Technologies |
R5-233289 | Update of test case 8.1.5.9.2 | MediaTek Inc |
R5-233777 | Addition of new RRC TC for RRCRelease with redirection with mpsPriorityIndication-r16 | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-232067 | Correction to MDT TC 8.1.6.2.4 | MediaTek Inc., Anritsu |
R5-232333 | Correction to Rel-16 MDT Test Case 8.1.6.2.2 | Anritsu EMEA Ltd |
R5-232393 | Correction to FR2 Power level tables for NR MDT test cases | Anritsu EMEA Ltd |
R5-232643 | Addition of FR2 cell power levels for SON-MDT test cases | Keysight Technologies UK |
TDoc | Title | Source |
---|---|---|
R5-233162 | Correction to the applicability of TC 8.1.7.1.1 | Qualcomm CDMA Technologies |
R5-233271 | Correction to the applicability of TC 8.1.7.1.1 | Qualcomm Korea |
TDoc | Title | Source |
---|---|---|
R5-232203 | Updates for EN-DC RRC test case 8.2.1.1.1 | MCC TF160 |
R5-232204 | Updates for NE-DC RRC test case 8.2.1.1.2 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232280 | Update NE-DC RRC Radio Bearer test case 8.2.2.7.3 | ZTE Corporation, Ericsson |
R5-233076 | Updates to RRC TCs 8.2.2.4.1 and 8.2.2.5.1 | MCC TF160 |
R5-233116 | Update to test case 8.2.2.5.1 | Ericsson |
R5-233117 | Update to test case 8.2.2.5.2 | Ericsson |
R5-233118 | Update to test case 8.2.2.5.3 | Ericsson |
R5-233119 | Update to test case 8.2.2.6.1 | Ericsson |
R5-233120 | Update to test case 8.2.2.7.1 | Ericsson |
R5-233121 | Update to test case 8.2.2.7.2 | Ericsson |
R5-233122 | Update to test case 8.2.2.7.3 | Ericsson |
R5-233123 | Update to test case 8.2.2.8.1 | Ericsson |
R5-233124 | Update to test case 8.2.2.8.2 | Ericsson |
R5-233125 | Update to test case 8.2.2.8.3 | Ericsson |
R5-233126 | Update to test case 8.2.2.9.1 | Ericsson |
R5-233127 | Update to test case 8.2.2.9.2 | Ericsson |
R5-233128 | Update to test case 8.2.2.9.3 | Ericsson |
R5-233329 | Update NE-DC RRC Radio Bearer test case 8.2.2.7.3 | ZTE Corporation, Ericsson |
R5-233330 | Update to test case 8.2.2.5.1 | Ericsson |
R5-233331 | Update to test case 8.2.2.5.2 | Ericsson |
R5-233332 | Update to test case 8.2.2.5.3 | Ericsson |
R5-233333 | Update to test case 8.2.2.6.1 | Ericsson |
R5-233334 | Update to test case 8.2.2.7.1 | Ericsson |
R5-233335 | Update to test case 8.2.2.7.2 | Ericsson |
R5-233336 | Update to test case 8.2.2.8.1 | Ericsson |
R5-233337 | Update to test case 8.2.2.8.2 | Ericsson |
R5-233338 | Update to test case 8.2.2.8.3 | Ericsson |
R5-233339 | Update to test case 8.2.2.9.1 | Ericsson |
R5-233340 | Update to test case 8.2.2.9.2 | Ericsson |
R5-233341 | Update to test case 8.2.2.9.3 | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232281 | Update NE-DC Handover test case 8.2.3.13.2 | ZTE Corporation |
R5-232282 | Update NE-DC Measurement Configuration Control and Reporting test case 8.2.3.7.2a | ZTE Corporation |
R5-232283 | Update NE-DC Measurement Configuration Control and Reporting test case 8.2.3.8.2a | ZTE Corporation |
R5-233077 | Updates to RRC TCs 8.2.3.13.1 and 8.2.3.14.x | MCC TF160 |
R5-233129 | Update to test case 8.2.3.13.1 | Ericsson |
R5-233130 | Update to test case 8.2.3.13.2 | Ericsson |
R5-233131 | Update to test case 8.2.3.14.1 | Ericsson |
R5-233132 | Update to test case 8.2.3.14.2 | Ericsson |
R5-233133 | Update to test case 8.2.3.14.3 | Ericsson |
R5-233342 | Update to test case 8.2.3.13.1 | Ericsson |
R5-233343 | Update to test case 8.2.3.13.2 | Ericsson |
R5-233344 | Update to test case 8.2.3.14.1 | Ericsson |
R5-233345 | Update to test case 8.2.3.14.2 | Ericsson |
R5-233346 | Update to test case 8.2.3.14.3 | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-233078 | Updates to RRC TCs 8.2.4.1.1.1 and 8.2.4.2.1.1 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232068 | Correction to 5GC TC 9.1.1.2 | MediaTek Inc. |
R5-233347 | Correction to 5GC TC 9.1.1.2 | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232425 | Corrections to NAS TC 9.1.2.1 | Qualcomm Korea, Keysight Technologies, Rhode and Schwarz |
TDoc | Title | Source |
---|---|---|
R5-232069 | Correction to MICO TC 9.1.5.1.4 | MediaTek Inc. |
R5-232070 | Correction to 5GC TC 9.1.5.x | MediaTek Inc. |
R5-233348 | Correction to MICO TC 9.1.5.1.4 | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232071 | Correction to RACS TC 9.1.9.x | MediaTek Inc. |
R5-232332 | Correction to NR5GC RACS Test case 9.1.9.5 | Anritsu EMEA Ltd |
TDoc | Title | Source |
---|---|---|
R5-232072 | Correction to eNS TC 9.1.10.4 | MediaTek Inc. |
R5-232339 | Correction to NR5GC testcase 9.1.10.3 | ROHDE & SCHWARZ, Qualcomm |
TDoc | Title | Source |
---|---|---|
R5-232073 | Correction to 5GC TC 9.2.5.1.1 | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232074 | Correction to 5GC TC 9.3.1.3 | MediaTek Inc. |
R5-233349 | Correction to 5GC TC 9.3.1.3 | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-233146 | Correction of multi layer test case 11.1.5 | Qualcomm Incorporated |
TDoc | Title | Source |
---|---|---|
R5-232075 | Correction to UAC TC 11.3.10 | MediaTek Inc. |
R5-232361 | Correction to NR5GC testcase 11.3.5 | ROHDE & SCHWARZ, Qualcomm |
R5-232686 | Corrections to SNPN TC 11.3.9a | Qualcomm CDMA Technologies, Anritsu Ltd |
R5-232975 | Correction of NR TC 11.3.10-UAC | Huawei, Hisilicon |
R5-233350 | Correction to UAC TC 11.3.10 | MediaTek Inc. |
R5-233351 | Corrections to SNPN TC 11.3.9a | Qualcomm CDMA Technologies, Anritsu Ltd |
R5-233352 | Correction of NR TC 11.3.10-UAC | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232076 | Correction to emergency service TC 11.4.12 | MediaTek Inc. |
R5-232297 | Update 5GMM Emergency Service test case 11.4.13 | ZTE Corporation |
R5-232386 | Correction to Emergency Services test case 11.4.1 | Keysight Technologies UK, Qualcomm |
R5-233147 | Correction of emergency services test case 11.4.11 | Qualcomm Incorporated |
R5-233353 | Correction to emergency service TC 11.4.12 | MediaTek Inc. |
R5-233354 | Update 5GMM Emergency Service test case 11.4.13 | ZTE Corporation |
R5-233473 | Correction to Emergency Services test case 11.4.1 | Keysight Technologies UK, Qualcomm |
R5-233779 | Correction to Emergency Services test case 11.4.1 | Keysight Technologies UK, Qualcomm |
TDoc | Title | Source |
---|---|---|
R5-232293 | Addition of inter-system mobility test case 11.8.1 | ZTE Corporation |
R5-232294 | Addition of inter-system mobility test case 11.8.3 | ZTE Corporation |
R5-233355 | Addition of inter-system mobility test case 11.8.1 | ZTE Corporation |
R5-233356 | Addition of inter-system mobility test case 11.8.3 | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-232118 | Update of 5G-NR test cases applicability | Qualcomm Incorporated |
R5-232295 | Add applicabilities for new NR 2 step RACH test cases | ZTE Corporation |
R5-232296 | Add applicabilities for new inter-system mobility test cases | ZTE Corporation |
R5-232646 | Correction to applicability of NR MAC test cases 7.1.1.7.1.x | Keysight Technologies UK, Qualcomm |
R5-232647 | Correction to applicability of NR MAC test case 7.1.1.12.3 | Keysight Technologies UK |
R5-232685 | Addition of applicability of new RRC TC for RRCRelease with redirection with mpsPriorityIndication-r16 | Qualcomm CDMA Technologies |
R5-232689 | Addition of applicability of new Idle mode TC to test the intraFreqReselection in MIB message is set to not allowed | Qualcomm CDMA Technologies |
R5-233185 | Update to applicability of UAC TC11.3.1a | Bureau Veritas ADT, CATT |
R5-233194 | Editorial correction to specific ICS of test case 8.1.5.9.1 | Bureau Veritas ADT, CATT |
R5-233287 | CR for applicability for new test case 6.1.2 Inter frequency cell reselection | Samsung |
R5-233291 | Correction to the applicability of TC 8.1.7.1.1 | Qualcomm Korea |
R5-233357 | Add applicabilities for new inter-system mobility test cases | ZTE Corporation |
R5-233466 | Add applicabilities for new NR 2 step RACH test cases | ZTE Corporation |
R5-233476 | Addition of applicability of new Idle mode TC to test the intraFreqReselection in MIB message is set to not allowed | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-232205 | Routine maintenance for TS 38.523-3 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232298 | Proposing 2 new test cases for closed WI NR 2-step RACH | ZTE Corporation |
R5-232687 | Discussion to add coverage for the TEI15 feature - "intraFreqReselection” field in MIB message is set to "not allowed" | Qualcomm CDMA Technologies |
R5-233064 | TS 38.523-1 Tracker status before RAN5-99 | Huawei, Hisilicon |
R5-233201 | Discussion to add coverage for TEI16 feature - Redirection with MPS Indication | Qualcomm CDMA Technologies |
R5-233286 | Discussion for new test case for 6.1.2 Inter frequency cell reselection | Samsung |
R5-233318 | Proposing 2 new test cases for closed WI NR 2-step RACH | ZTE Corporation |
R5-233319 | Discussion to add coverage for the TEI15 feature - "intraFreqReselection” field in MIB message is set to "not allowed" | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-232360 | Updating sf20 value in SystemInformationBlockType24 | ROHDE & SCHWARZ |
R5-232900 | Addition of Ethernet configuration for EHC testing for EUTRA common config | Nokia, Nokia Shanghai Bell |
R5-233152 | Correction to generic procedure of EIEI test cases with ecall only support | Qualcomm Incorporated |
R5-233418 | Addition of Ethernet configuration for EHC testing for EUTRA common config | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232077 | Correction to MAC eDRX TC 7.1.6.x | MediaTek Inc. |
R5-233314 | Correction to MAC eDRX TC 7.1.6.x | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-232901 | Correction to EHC testcase 7.3.6.2 for EUTRA | Nokia, Nokia Shanghai Bell |
R5-233419 | Correction to EHC testcase 7.3.6.2 for EUTRA | Nokia, Nokia Shanghai Bell |
TDoc | Title | Source |
---|---|---|
R5-232906 | Correction to RRC downlink segmentation test case 8.5.5.2 | MediaTek Inc. |
R5-233315 | Correction to RRC downlink segmentation test case 8.5.5.2 | MediaTek Inc. |
TDoc | Title | Source |
---|---|---|
R5-233022 | Correction to LTE TC 8.2.1.5 for CAT-M1 | Anritsu EMEA Ltd |
TDoc | Title | Source |
---|---|---|
R5-233148 | Update to EIEI test case 11.3.2 | Qualcomm Incorporated, MCC TF160 |
R5-233150 | Update to EIEI test case 11.3.1 | Qualcomm Incorporated, MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232094 | Add new test case 13.6.2 Inter-system mobility between untrusted Non-3GPP and 3GPP system/Handover from ePDG/EPC to E-UTRAN/EPC | China Telecom |
R5-233274 | Add new test case 13.6.2 Inter-system mobility between untrusted Non-3GPP and 3GPP system/Handover from ePDG/EPC to E-UTRAN/EPC | China Telecom |
R5-233316 | Add new test case 13.6.2 Inter-system mobility between untrusted Non-3GPP and 3GPP system/Handover from ePDG/EPC to E-UTRAN/EPC | China Telecom |
TDoc | Title | Source |
---|---|---|
R5-232309 | Add applicability for Inter-system mobility between untrusted Non-3GPP and 3GPP system/Handover from ePDG/EPC to E-UTRAN/EPC | China Telecom |
R5-233290 | Test case title correction for 8.5.5.2 | MediaTek Inc |
TDoc | Title | Source |
---|---|---|
R5-232206 | Routine maintenance for TS 36.523-3 | MCC TF160, Anritsu EMEA Ltd. |
TDoc | Title | Source |
---|---|---|
R5-233065 | TS 36.523-1 Tracker status before RAN5-99 | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232207 | Correction of test case 15.25 | MCC TF160 |
R5-232208 | Correction of test case 17.2 | MCC TF160 |
R5-232585 | Updating IMS security profiles | ROHDE & SCHWARZ |
R5-232648 | Correction to IMS XCAP test case 15.10 | Keysight Technologies UK |
R5-233300 | Correction of test case 19.3.1 | MCC TF160 |
R5-233376 | Update to Annex A.2.9 | Qualcomm Incorporated |
R5-233486 | Updating IMS security profiles | ROHDE & SCHWARZ |
TDoc | Title | Source |
---|---|---|
R5-232388 | Remove test case 7.4 | Ericsson |
R5-232389 | Remove test case 7.6 | Ericsson |
R5-232390 | Update applicabilities for NG.114 default test cases | Ericsson |
R5-232649 | Update to applicability of test cases 15.10 and 8.9 based on new PICS for CFNL | Keysight Technologies UK |
R5-232769 | Updates to applicability for Supplementary Services test cases | Ericsson |
R5-233374 | Remove test case 7.4 | Ericsson |
R5-233375 | Remove test case 7.6 | Ericsson |
R5-233485 | Update applicabilities for NG.114 default test cases | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232209 | Routine maintenance for TS 34.229-3 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232106 | Remove test case 7.4 | Ericsson |
R5-232151 | Remove test case 7.6 | Ericsson |
R5-232152 | Update test case 7.13 | Ericsson |
R5-232153 | Update test case 7.16 | Ericsson |
R5-232154 | Update test case 7.22 | Ericsson |
R5-232178 | Correction to NR IMS test case 10.14 | Anritsu EMEA Ltd, MediaTek |
R5-232210 | Correction of test case 7.21 | MCC TF160 |
R5-232211 | Correction of test case 7.26 | MCC TF160, Qualcomm Incorporated |
R5-232212 | Correction of test cases 7.24a and 7.24b | MCC TF160, Qualcomm Incorporated |
R5-232213 | Correction of test cases 8.34, 8.35 and 8.36 | MCC TF160, Qualcomm Incorporated, Ericsson |
R5-232334 | Correction to NR IMS test case 7.32 | Anritsu EMEA Ltd |
R5-232387 | Add generic procedure for default MT video call | Ericsson |
R5-232650 | Correction to MT Voice Call Control test case 7.31 and 7.32 | Keysight Technologies UK |
R5-232761 | Updates to Annex A.25 | Ericsson |
R5-232762 | Updates to Annex A.19 | Ericsson |
R5-232763 | Updates to test case 8.6 | Ericsson |
R5-232764 | Updates to test case 8.34 | Ericsson |
R5-232765 | Updates to test case 8.35 | Ericsson |
R5-232766 | Updates to test case 8.36 | Ericsson |
R5-232767 | Updates to test case 8.37 | Ericsson |
R5-232768 | Updates to test case 8.38 | Ericsson |
R5-232933 | Correction to IMS testcase 10.4 | ROHDE & SCHWARZ, MCCTF160 |
R5-233153 | Update to test case 7.21 | Qualcomm Incorporated |
R5-233154 | Update to test case 10.14 | Qualcomm Incorporated |
R5-233370 | Remove test case 7.4 | Ericsson |
R5-233371 | Remove test case 7.6 | Ericsson |
R5-233372 | Correction of test cases 8.34, 8.35 and 8.36 | MCC TF160, Qualcomm Incorporated, Ericsson |
R5-233373 | Updates to test case 8.6 | Ericsson |
R5-233446 | Correction to NR IMS test case 10.14 | Anritsu EMEA Ltd, MediaTek |
R5-233448 | Correction to IMS testcase 10.4 | ROHDE & SCHWARZ, MCCTF160 |
TDoc | Title | Source |
---|---|---|
R5-233296 | Removal of mandatory status of GEA2 | Vodafone GmbH, Mediatek |
R5-233450 | Removal of mandatory status of GEA2 | Vodafone GmbH, Mediatek |
TDoc | Title | Source |
---|---|---|
R5-232214 | Correction of clause 5.5.11.3.5 | MCC TF160 |
R5-232215 | Correction of clause 5.5.4.10.1 | MCC TF160, UPV/EHU, Nemergent Solutions |
R5-232216 | Correction of clause 5.5.6.11 | MCC TF160 |
R5-232217 | Correction of clause 5.5.8.12 | MCC TF160 |
R5-232218 | Correction of clause 5.5.8.3 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232219 | Correction of clause 2 | MCC TF160 |
R5-232220 | Correction of test case 6.1.1.16 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232221 | Routine maintenance for TS 36.579-5 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-232222 | Correction of clause 2 | MCC TF160 |
R5-232223 | Correction of test case 6.3.2 | MCC TF160 |
TDoc | Title | Source |
---|---|---|
R5-233361 | Response LS on Non-Support of Ciphering Algorithm GEA2 | GCF SG |
TDoc | Title | Source |
---|---|---|
R5-232022 | Agenda - closing session | WG Chairman |
TDoc | Title | Source |
---|---|---|
R5-232132 | Removal of technical content in TS 36.508 v17.5.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232133 | Removal of technical content in TS 36.521-1 v17.6.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232134 | Removal of technical content in TS 36.521-2 v17.2.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232135 | Removal of technical content in TS 36.523-1 v17.5.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232136 | Removal of technical content in TS 36.523-2 v17.5.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232137 | Removal of technical content in TS 36.579-1 v15.9.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232138 | Removal of technical content in TS 36.579-2 v15.7.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232139 | Removal of technical content in TS 36.579-4 v15.5.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232140 | Removal of technical content in TS 36.579-6 v15.6.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232141 | Removal of technical content in TR 36.903 v16.1.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232142 | Removal of technical content in TR 36.903 v17.0.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232143 | Removal of technical content in TR 36.904 v14.0.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232144 | Removal of technical content in TR 36.904 v15.0.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232145 | Removal of technical content in TR 36.904 v16.0.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232146 | Removal of technical content in TR 36.904 v17.0.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232147 | Removal of technical content in TR 36.905 v17.0.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232148 | Removal of technical content in TS 37.571-1 v16.16.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232149 | Removal of technical content in TS 37.571-2 v16.15.0 and substitution with pointer to the next Release | ETSI Secretariat |
R5-232150 | Removal of technical content in TS 37.571-5 v16.10.0 and substitution with pointer to the next Release | ETSI Secretariat |
TDoc | Title | Source |
---|---|---|
R5-232898 | Addition to testcase 8.1.5.13.2 Data on non-SDT Radio Bearers | Nokia, Nokia Shanghai Bell |
R5-233417 | Addition to testcase 8.1.5.13.2 Data on non-SDT Radio Bearers | Nokia, Nokia Shanghai Bell |
R5-233477 | Applicability of legacy NB-IOT testcases to NTN GSO capable UE | Qualcomm Incorporated, Mediatek |
R5-233495 | Applicability of legacy NB-IOT testcases to NTN GSO capable UE | Qualcomm Incorporated, Mediatek |
TDoc | Title | Source |
---|---|---|
R5-233178 | PRD-17 on Guidance to Work Item Codes (post RAN#100 version) | Bureau Veritas ADT (Rapporteur) |
TDoc | Title | Source |
---|---|---|
R5-233204 | 3GPP RAN5 PRD20 v1.3.0 Correction to subclause number in Section 6.2 and 6.3 | ZTE Corporation |
TDoc | Title | Source |
---|---|---|
R5-232107 | PRD21 CDS: NR CA PC3 FR1 CA_n28A-n78A | Nokia, Nokia Shanghai Bell |
R5-232248 | PRD21 CDS: CA_n2A-n77A PC2 | Verizon Switzerland AG |
R5-232249 | PRD21 CDS: CA_n5A-n77A PC2 | Verizon Switzerland AG |
R5-232250 | PRD21 CDS: CA_n66A-n77A PC2 | Verizon Switzerland AG |
R5-232619 | PRD21 CDS: For PC3 CA_2A-n5A and CA_2A-n48A | Qualcomm India Pvt Ltd |
R5-232620 | PRD21 CDS: PC3 EN-DC DC_71A_n2A | Qualcomm India Pvt Ltd |
R5-232621 | PRD21 CDS: PC3 EN-DC DC_12A_n2A and DC_71A_n66A | Qualcomm India Pvt Ltd |
R5-232806 | CDS for PC2 n39 | CMCC |
R5-232824 | PRD21 on NR bands and 5G NR CADC config handling v1.5.0 | CMCC |
R5-232882 | PRD21 CDS: CA_n5A-n66A BCS0, no UL CA, PC3. | Ericsson |
R5-232883 | PRD21 CDS: CA_n5A-n66A, no UL CA, BCS1, PC3. | Ericsson |
R5-233368 | PRD21 CDS: CA_n41A-n66A-n71A, BCS0, no UL CA, PC3. | Ericsson |
TDoc | Title | Source |
---|---|---|
R5-232300 | New WID on UE Conformance - Additional NR bands for UL-MIMO in Rel-18 | China Unicom |
R5-233304 | New WID on UE Conformance - High-power UE operation for fixed-wireless/vehicle-mounted use cases in LTE bands and NR bands | Nokia, Nokia Shanghai Bell |
R5-233305 | New WID on UE Conformance - High power UE (power class 2) for NR FR1 FDD single band | China Unicom |
R5-233306 | New WID on UE Conformance - High power UE (power class 1.5) for NR FR1 TDD single band | CMCC, Huawei, HiSilicon |
R5-233307 | New WID on UE Conformance - Rel-18 NR CA and DC; and NR and LTE DC Configurations | Huawei, HiSilicon, CMCC |
R5-233308 | New WID on UE Conformance - New Rel-18 NR licensed bands and extension of existing NR bands | Huawei, HiSilicon, China Telecom |
R5-233309 | New WID on UE Conformance - Rel-18 High Power UE for NR CA and DC; and NR and LTE DC Configurations | China Telecom |
R5-233310 | New WID on UE Conformance - IMS voice service support and network usability guarantee for UE’s E-UTRA capability disabled scenario in 5GS | China Telecom |
R5-233311 | New WID on UE Conformance - Rel-17 Power Class 2 UE for NR inter-band CA/DC with or without SUL configurations with x (6>=x>2) bands DL and y (y=1, 2) bands UL | Huawei, HiSilicon |
R5-233312 | New WID for IMS Data Channel test | Huawei, Hisilicon |
TDoc | Title | Source |
---|---|---|
R5-232034 | WI Progress and Target Completion Date Review | WG Chairman |
R5-232120 | WP UE Conformance Test Aspects for NR RF Requirement Enhancements for FR2 | Nokia, Nokia Shanghai Bell, Apple |
R5-232121 | SR UE Conformance Test Aspects for NR RF Requirement Enhancements for FR2 | Nokia, Nokia Shanghai Bell, Apple |
R5-232122 | WP UE Conformance – Further enhancements of NR RF requirements for FR2 | Nokia, Nokia Shanghai Bell, Apple |
R5-232123 | SR UE Conformance – Further enhancements of NR RF requirements for FR2 | Nokia, Nokia Shanghai Bell, Apple |
R5-232156 | WP UE Conformance - Power_Limit_CA_DC-UEConTest | Qualcomm India Pvt Ltd |
R5-232157 | SR UE Conformance - Increasing UE power high limit for CA and DC | Qualcomm India Pvt Ltd |
R5-232224 | WP UE Conformance - User Plane Integrity Protection support for EPC connected architectures (incl. CT/SA aspects) | Vodafone GmbH |
R5-232225 | SR UE Conformance – User Plane Integrity Protection support for EPC connected architectures (incl. CT/SA aspects) | Vodafone GmbH |
R5-232255 | WP UE Conformance - NR QoE management and optimizations for diverse services | Ericsson |
R5-232256 | SR UE Conformance - NR QoE management and optimizations for diverse services | Ericsson |
R5-232301 | SR UE Conformance Test Aspects - Access Traffic Steering, Switch and Splitting support in 5G | China Telecom |
R5-232302 | WP UE Conformance Test Aspects - Access Traffic Steering, Switch and Splitting support in 5G | China Telecom |
R5-232303 | WP UE Conformance - Multi-SIM devices for LTE/NR | China Telecom |
R5-232304 | SR UE Conformance - Multi-SIM devices for LTE/NR | China Telecom |
R5-232327 | WP for LTE_TDD_1670_1675MHz-UEConTest | Ligado Networks |
R5-232328 | SR for LTE_TDD_1670_1675MHz-UEConTest | Ligado Networks |
R5-232329 | Revised WID: UE Conformance - Introduction of LTE TDD band in 1670-1675 MHz | Ligado Networks |
R5-232398 | Work plan: UE Conformance Test Aspects for NR Positioning Support | CATT |
R5-232399 | SR UE Conformance Test Aspects - NR Positioning Support | CATT |
R5-232400 | Work plan: UE Conformance Test Aspects - NR Positioning Enhancement | CATT |
R5-232401 | SR UE Conformance Test Aspects - NR Positioning Enhancement | CATT |
R5-232402 | Work plan: UE Conformance Test Aspects – NR Uplink Data Compression (UDC) | CATT |
R5-232403 | SR UE Conformance Test Aspects - NR Uplink Data Compression (UDC) | CATT |
R5-232404 | Work plan: UE Conformance - NR sidelink enhancement | CATT |
R5-232405 | SR UE Conformance - NR sidelink enhancement | CATT |
R5-232406 | Work plan: UE Conformance - NR Sidelink Relay | CATT |
R5-232407 | SR UE Conformance - NR Sidelink Relay | CATT |
R5-232421 | Revised WID on UE Conformance – R17 Enhancement of Private Network Support for NG-RAN including CT aspects | China Telecom |
R5-232422 | WP UE Conformance – Rel-17 Enhancement of Private Network Support for NG-RAN including CT aspects RAN5#99 | China Telecom |
R5-232423 | SR UE Conformance – Rel-17 Enhancement of Private Network Support for NG-RAN including CT aspects RAN5#99 | China Telecom |
R5-232511 | WP of Rel-16 NR V2X WI after RAN5 99 | Huawei, Hisilicon |
R5-232512 | SR of Rel-16 NR V2X WI after RAN5 99 | Huawei, Hisilicon |
R5-232562 | WP UE Conformance - NR and MR-DC measurement gap enhancements | MediaTek Inc. |
R5-232563 | SR UE Conformance - NR and MR-DC measurement gap enhancements | MediaTek Inc. |
R5-232564 | WP UE Conformance - NB-IoT/eMTC support for Non-Terrestrial Networks (NTN) including EPS aspects | MediaTek Inc. |
R5-232565 | SR UE Conformance - NB-IoT/eMTC support for Non-Terrestrial Networks (NTN) including EPS aspects | MediaTek Inc. |
R5-232581 | WP on UE Conformance - High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band | China Unicom |
R5-232582 | SR on UE Conformance - High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band | China Unicom |
R5-232583 | WP on UE Conformance – Support of reduced capability NR devices | China Unicom |
R5-232584 | SR on UE Conformance – Support of reduced capability NR devices | China Unicom |
R5-232651 | SR Protocol enhancements for Mission Critical Services for Rel-16 (MCPTT, MCVideo, MCData) | NIST |
R5-232652 | WP Protocol enhancements for Mission Critical Services for Rel-16 (MCPTT, MCVideo, MCData) | NIST |
R5-232696 | SR - UE Conformance - Multiple Input Multiple Output (MIMO) Over-the-Air (OTA) requirements for NR UEs | Apple Electronics |
R5-232698 | WP - UE Conformance - Multiple Input Multiple Output (MIMO) Over-the-Air (OTA) requirements for NR UEs | Apple Electronics |
R5-232727 | WP UE Conformance - UE RF requirements for Transparent Tx Diversity (TxD) for NR | Huawei, HiSilicon |
R5-232728 | SR UE Conformance - UE RF requirements for Transparent Tx Diversity (TxD) for NR | Huawei, HiSilicon |
R5-232758 | WP UE Conformance - Further Multi-RAT Dual-Connectivity enhancement | Huawei, HiSilicon |
R5-232759 | SR UE Conformance - Further Multi-RAT Dual-Connectivity enhancement | Huawei, HiSilicon |
R5-232775 | SR Rel-17 eNS_Ph2-UEConTest after RAN5#99 | CMCC |
R5-232776 | WP Rel-17 eNS_Ph2-UEConTest after RAN5#99 | CMCC |
R5-232779 | SR Rel-17 NR_ENDC_SON_MDT_enh-UEConTest after RAN5#99 | CMCC |
R5-232780 | WP Rel-17 NR_ENDC_SON_MDT_enh-UEConTest after RAN5#99 | CMCC |
R5-232782 | SR Rel-17 NR_slice-UEConTest after RAN5#99 | CMCC |
R5-232783 | WP Rel-17 NR_slice-UEConTest after RAN5#99 | CMCC |
R5-232787 | SR NR_Rel-16_CA_DC after RAN5#99 | CMCC |
R5-232788 | WP NR_Rel-16_CA_DC after RAN5#99 | CMCC |
R5-232800 | SR Rel-17 PC2 n39 after RAN5#99 | CMCC |
R5-232801 | WP Rel-17 PC2 n39 after RAN5#99 | CMCC |
R5-232807 | SR Rel-17 HST enh after RAN5#99 | CMCC |
R5-232808 | WP Rel-17 HST enh after RAN5#99 | CMCC |
R5-232813 | SR Rel-18 NB-IoT/eMTC NTN after RAN5#99 | CMCC |
R5-232814 | WP Rel-18 NB-IoT/eMTC NTN after RAN5#99 | CMCC |
R5-232827 | WP UE Conformance NR Coverage Enhancement RAN5#99 | China Telecom |
R5-232828 | SR UE Conformance NR Coverage Enhancement RAN5#99 | China Telecom |
R5-232829 | SR UE Conformance Rel-17 High power UE for NR inter-band Carrier Aggregation with 2 bands downlink and x bands uplink (x=1,2) RAN5#99 | China Telecom |
R5-232830 | WP UE Conformance Rel-17 High power UE for NR inter-band Carrier Aggregation with 2 bands downlink and x bands uplink (x=1,2) RAN5#99 | China Telecom |
R5-232831 | SR UE Conformance Further enhancement on NR demodulation performance RAN5#99 | China Telecom, Qualcomm |
R5-232832 | WP UE Conformance – Downlink interruption for NR and EN-DC band combinations to conduct dynamic Tx Switching in Uplink RAN5#99 | China Telecom |
R5-232833 | SR UE Conformance – Downlink interruption for NR and EN-DC band combinations to conduct dynamic Tx Switching in Uplink RAN5#99 | China Telecom |
R5-232842 | WP UE Conformance Test Aspects - Rel -16 for CLI handling for NR | Qualcomm Europe Inc. Sweden |
R5-232843 | SR UE Conformance Test Aspects - Rel -16 for CLI handling for NR | Qualcomm Europe Inc. Sweden |
R5-232844 | WP - UE Conformance Test Aspects for NR-based Access to Unlicensed Spectrum | Qualcomm Europe Inc. Sweden |
R5-232845 | SR - UE Conformance Test Aspects for NR-based Access to Unlicensed Spectrum | Qualcomm Europe Inc. Sweden |
R5-232846 | WP UE Conformance Test Aspects - Solutions for NR to support non-terrestrial networks (NTN) | Qualcomm Europe Inc. Sweden |
R5-232847 | SR UE Conformance Test Aspects - Solutions for NR to support non-terrestrial networks (NTN) | Qualcomm Europe Inc. Sweden |
R5-232848 | WP UE Conformance Test Aspects - Further enhancement on NR demodulation performance | Qualcomm Europe Inc. Sweden |
R5-232849 | WP UE Conformance Test Aspects - Introduction of DL 1024QAM for NR frequency range 1 (FR1) | Qualcomm Europe Inc. Sweden |
R5-232850 | SR UE Conformance Test Aspects - Introduction of DL 1024QAM for NR frequency range 1 (FR1) | Qualcomm Europe Inc. Sweden |
R5-232884 | WP - UE Conformance - Further enhancements on MIMO for NR | Samsung |
R5-232885 | SR - UE Conformance - Further enhancements on MIMO for NR | Samsung |
R5-232886 | WP - UE Conformance - NR support for high speed train scenario in frequency range 2 | Samsung |
R5-232887 | SR - UE Conformance - NR support for high speed train scenario in frequency range 2 | Samsung |
R5-232902 | SR UE Conformance Test Aspects - LTE-NR & NR-NR Dual Connectivity and NR CA enhancements | Nokia, Nokia Shanghai Bell |
R5-232903 | WP UE Conformance Test Aspects - LTE-NR & NR-NR Dual Connectivity and NR CA enhancements | Nokia, Nokia Shanghai Bell |
R5-232904 | SR UE Conformance Test Aspects - Enhanced Industrial Internet of Things (IoT) and ultra-reliable and low latency communication (URLLC) support for NR | Nokia, Nokia Shanghai Bell |
R5-232905 | WP UE Conformance Test Aspects - Enhanced Industrial Internet of Things (IoT) and ultra-reliable and low latency communication (URLLC) support for NR | Nokia, Nokia Shanghai Bell |
R5-232908 | WP UE Conformance - Power Class 2 for EN-DC with xLTE band + yNR DL with 1LTE+1(TDD) NR UL band (x= 2, 3, 4, y=1; x=1, 2, y=2) | Ericsson |
R5-232909 | SR UE Conformance - Power Class 2 for EN-DC with xLTE band + yNR DL with 1LTE+1(TDD) NR UL band (x= 2, 3, 4, y=1; x=1, 2, y=2) | Ericsson |
R5-232935 | SR of UE Conformance - NR Multicast and Broadcast Services including CT and SA aspects | Huawei, Hisilicon |
R5-232936 | WP of UE Conformance - NR Multicast and Broadcast Services including CT and SA aspects | Huawei, Hisilicon |
R5-233057 | WP - Physical Layer Enhancements for NR Ultra-Reliable and Low Latency Communication | Huawei, HiSilicon |
R5-233058 | SR - Physical Layer Enhancements for NR Ultra-Reliable and Low Latency Communication | Huawei, HiSilicon |
R5-233059 | WP - Rel-17 RF requirements enhancement for NR frequency range 1 (FR1) | Huawei, HiSilicon |
R5-233060 | SR - Rel-17 RF requirements enhancement for NR frequency range 1 (FR1) | Huawei, HiSilicon |
R5-233104 | Revised WID on UE Conformance - Rel-17 NR CA and DC; and NR and LTE DC Configurations | Huawei, HiSilicon |
R5-233108 | WP of Rel-17 NR CA and DC; and NR and LTE DC Configurations | Huawei, Hisilicon |
R5-233109 | SR of Rel-17 NR CA and DC; and NR and LTE DC Configurations | Huawei, Hisilicon |
R5-233110 | WP of Additional NR bands for UL-MIMO in Rel-17 | Huawei, Hisilicon |
R5-233111 | SR of Additional NR bands for UL-MIMO in Rel-17 | Huawei, Hisilicon |
R5-233112 | WP of FR2 FWA UE with maximum TRP of 23dBm for band n257 and n258 | Huawei, Hisilicon |
R5-233113 | SR of FR2 FWA UE with maximum TRP of 23dBm for band n257 and n258 | Huawei, Hisilicon |
R5-233114 | WP of RF requirements for NR frequency range 1 | Huawei, HiSilicon |
R5-233115 | SR of RF requirements for NR frequency range 1 | Huawei, HiSilicon |
R5-233196 | WP UE Conformance Test Aspects - Rel-17 NR small data transmissions in INACTIVE state | Qualcomm CDMA Technologies |
R5-233197 | SR UE Conformance Test Aspects - Rel-17 NR small data transmissions in INACTIVE state | Qualcomm CDMA Technologies |
R5-233198 | WP UE Conformance Test Aspects - Rel-17 Support of Uncrewed Aerial Systems | Qualcomm CDMA Technologies |
R5-233199 | SR UE Conformance Test Aspects - Rel-17 Support of Uncrewed Aerial Systems | Qualcomm CDMA Technologies |
R5-233237 | SR - UE Conformance - Introduction of UE TRP (Total Radiated Power) and TRS (Total Radiated Sensitivity) requirements and test methodologies for FR1 (NR SA and EN-DC) | Apple Inc |
R5-233238 | WP - UE Conformance - Introduction of UE TRP (Total Radiated Power) and TRS (Total Radiated Sensitivity) requirements and test methodologies for FR1 (NR SA and EN-DC) | Apple Inc |
R5-233239 | SR - UE Conformance Aspects - NR RRM enhancements | Apple Inc |
R5-233240 | WP - UE Conformance Aspects - NR RRM enhancements | Apple Inc |
R5-233276 | WP UE Conformance – UE power saving enhancements for NR | MediaTek Inc. |
R5-233277 | SR UE Conformance – UE power saving enhancements for NR | MediaTek Inc. |
R5-233496 | WP - UE Conformance - NR support for high speed train scenario in frequency range 2 | Samsung |
R5-233497 | SR - UE Conformance - NR support for high speed train scenario in frequency range 2 | Samsung |
R5-233498 | Revised WID - UE Conformance - UE RF requirements for Transparent Tx Diversity (TxD) for NR | Huawei, HiSilicon |
R5-233499 | Revised WID on UE Conformance - Rel-17 NR CA and DC; and NR and LTE DC Configurations | Huawei, HiSilicon |
R5-233761 | Revised WID - UE Conformance - High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band | China Unicom |
R5-233762 | WP - Rel-15 5GS SIG NE-DC | CMCC |
TDoc | Title | Source |
---|---|---|
R5-232251 | WP Rel-15 NR TX and RX Test Cases – Part 3: Range 1 and Range 2 Interworking operation with other radios (TS 38.521-3) | Qualcomm India Pvt Ltd |
R5-232310 | WP-UE Conformance-Inter-system mobility between untrusted Non-3GPP and 3GPP system | China Telecom |
R5-232394 | Rel-15 5GS WP TR 38.903 - NR Derivation of test tolerances for RRM and UE radio reception conformance tests | AT&T |
R5-233203 | Rel-15 5GS maintenance SIG WP (NR-SA and ENDC) | Qualcomm CDMA Technologies |
TDoc | Title | Source |
---|---|---|
R5-232821 | Draft TS 36.521-4 v0.2.0 | CMCC, MTK |
R5-232851 | Draft TS 38.521-5 version 0.2.0 | Qualcomm Europe Inc. Sweden |
R5-233066 | TS 38.523-1 Tracker status after RAN5-99 | Huawei, Hisilicon |
R5-233067 | TS 36.523-1 Tracker status after RAN5-99 | Huawei, Hisilicon |
R5-233179 | RAN5#99 summary of changes to RAN5 test cases with potential impact on GCF and PTCRB | Bureau Veritas ADT |
R5-233234 | Draft TS 38.551 v0.2.0 | Apple Electronics |
R5-233241 | Draft TS 38.561 v0.3.0 | Apple Inc |
TDoc | Title | Source |
---|---|---|
R5-232035 | Review deadlines for next quarter | WG Chairman |
R5-233481 | LS on frequencyInfo for NR SL RSRP measurements | TSG WG RAN5 |
TDoc | Title | Source |
---|---|---|
R5-232968 | Add test applicability for EPS UPIP TC | Huawei, Hisilicon |
R5-233393 | Add test applicability for EPS UPIP TC | Huawei, Hisilicon |